Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings. Click here for individual or institutional registration.
Sensors
MEMS
semiconductors
lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
4
0.444
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Wireless Communications
Digital Communications
Communication Theory
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
4
0.444
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Physics
Optics
EUV
Photolithography
Data Analysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Optics
Laser Physics
Atomic Physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
4
0.400
Semiconductor Patterning / Nano Science and Technology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
4
0.500
MEMS
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Fluid dynamics
Vacuum system
Semiconductor equipment
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Computer Graphics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Computational semiconductor lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
4
0.444
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Wide Bandgap Semiconductor
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
quantum physics
condensed matter theory
microwave and THz microelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
4
0.500
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Materials
Microstructure
Damage
Quasi-static and Dynamic Mechanical Properties
Texture
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Scientific computing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Optics
Surface Physics
Plasmonics
Lithography
Metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
electro-optics
scanning microscopy
fs-pulses
metrology
optical design
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Joseph Zekry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Jen-Yi Wuu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Ivo De Jong
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
4
0.444
Alejandro Arrizabalaga
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Umar Rizvi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
4
0.444
Wireless Communications
Digital Communications
Communication Theory
Romain Cauchois
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
Guido Volleberg
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Faisal Nadeem
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Physics
Optics
EUV
Photolithography
Data Analysis
Andrey Tychkov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
4
0.400
Taekwon Jee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Milos Popadic
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
4
0.500
Tiannan Guan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Dongchi Yu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Fluid dynamics
Vacuum system
Semiconductor equipment
Ser Jung Hoon
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
4
0.444
Robin Soetens
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Qingwen Wang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Lorenzo Tripodi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
4
0.500
quantum physics
condensed matter theory
microwave and THz microelectronics
Subhasish Sutradhar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
Erik Abegg
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Behnam Shakerifard
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Materials
Microstructure
Damage
Quasi-static and Dynamic Mechanical Properties
Texture
Vivek Kumar Jain
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
Reinaldo Astudillo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Todd R. Downey
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Optics
Surface Physics
Plasmonics
Lithography
Metrology
Peter Dorn
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
electro-optics
scanning microscopy
fs-pulses
metrology
optical design