Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings. Click here for individual or institutional registration.
Smart Grids
Demand Response
Active Distribution Networks
Renewable Energy
Semiconductor Processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
Optics
Magneto-Optics
Ultrafast Magnetism
Ultrafast Spintronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
14
0.737
Quantum Optics
Condensed Matter Physics
Quantum Field Theory
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
14
0.667
Plasma physics
Laser physics
Fluid dynamics
EUV generation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
14
1.000
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Sr. Mechatronic Design Engineer
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
EUV Lithography
laser produced plasma
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Power electronics
Controls
Hardware-In-The-Loop (HIL)
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
photolithography
simulation
photoresist
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
13
0.448
Machine learning
Pattern recognition
Data mining
Lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Perovskite physics
Nano electronics
Optoelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
photonics
nanotechnology
optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
12
0.400
Optical Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
Microlithography for integrated circuit production
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
12
0.308
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Applied Optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
Optics
nanophotonics
solid-state lasers
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Structural control
vibration control
Mechatronics.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
12
0.923
Computational imaging
Label-free microscopy
Optics
Lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
11
0.440
atomic spectroscopy
optical frequency standards
lithography
plasma physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
11
0.550
lithography
machine learning
condensed matter physics
superconductivity
high pressure
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
11
0.611
Niyam Haque
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
Smart Grids
Demand Response
Active Distribution Networks
Renewable Energy
Semiconductor Processing
Thomas Huisman
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Optics
Magneto-Optics
Ultrafast Magnetism
Ultrafast Spintronics
Seong Chan Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
14
0.737
Philipp Strack
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
14
0.667
Quantum Optics
Condensed Matter Physics
Quantum Field Theory
Dmitry Kurilovich
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
14
1.000
Plasma physics
Laser physics
Fluid dynamics
EUV generation
Michael Engel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Mohsen Zafarani
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
Sr. Mechatronic Design Engineer
Alex Schafgans
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Hesan Vahedi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
Power electronics
Controls
Hardware-In-The-Loop (HIL)
Steven G. Hansen
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
13
0.448
Alexander Ypma
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Machine learning
Pattern recognition
Data mining
Lithography
Juliane Reinhardt
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Ting-You Li
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
Perovskite physics
Nano electronics
Optoelectronics
Se-Heon Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
12
0.400
photonics
nanotechnology
optics
Ye Tian
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
Timothy A. Brunner
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
12
0.308
Ilaria Cardinaletti
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Martin Jurna
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
Onur Kuzucu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Bilal Mokrani
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
12
0.923
Structural control
vibration control
Mechatronics.
Li-Hao Yeh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
Timur Tudorovskiy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
Stephen D. Hsu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
11
0.440
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
Robert J. Rafac
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
11
0.550
atomic spectroscopy
optical frequency standards
lithography
plasma physics
Shibing Wang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
11
0.611
lithography
machine learning
condensed matter physics
superconductivity
high pressure