Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings. Click here for individual or institutional registration.
Device reliability
Electrical measurement
Semiconductor device
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
11
0.579
RTL design
processing in memory
memory controller
Versal ACAP
DRAM integration
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
11
1.000
Semiconductor Physics
Nonvolatile memroy
Quantum Dots
DLTS
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
10
0.625
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
Machine Learning
Artificial Intelligence
Brain-Computer Interface
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Machine Learning
Data Mining
Representation Learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Organometallic catalyst
CO2 utilization
Polymerization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
high speed IO
equalizer
HBM
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Metrology in Semiconductor
Image Processing
Engineering Instrumentation and Automation
compact accelerator
x-ray generator
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
Image/Video Processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
10
0.625
Neuroscience
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Autonomous Vehicles
Positioing & Localization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
Lithium-ion battery
Welding process
Laser welding
Welding automation
Metal Additive Manufacturing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
9
0.500
Process Systems Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
9
0.818
NAND Flash
Hardware security
Physical Unclonable Functions
Active Metering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Circuit Design
SERDES
PHY
Circuit Verification
DRAM
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Lithium ion batteries
electrochemisty
cathode
degradation mechanism
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
ISP
3D Imaging
Computer Vision
Deep Learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
8
0.667
3D NAND flash
Skin attachable electronics
MEMS
Human psychophysiological sensors
ferroelectric NAND
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Material Science
Stretchable/flexible electronic devices
Nano-macro scale Si structuring by metal-assisted chemical etching
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
8
0.615
Deep Learning
Computer Vision
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
semiconductor
NAND
SSD
GaN
SiC
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
8
0.421
Young Gon Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
11
0.579
Vladimir Kornijcuk
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
11
1.000
RTL design
processing in memory
memory controller
Versal ACAP
DRAM integration
Dong Uk Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
10
0.625
Semiconductor Physics
Nonvolatile memroy
Quantum Dots
DLTS
Suk Joon Hong
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
No-Sang Kwak
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Machine Learning
Artificial Intelligence
Brain-Computer Interface
Wonjun Ko
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Machine Learning
Data Mining
Representation Learning
Sujith S
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
Jinhyung Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Sung Hwan Heo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
Metrology in Semiconductor
Image Processing
Engineering Instrumentation and Automation
compact accelerator
x-ray generator
Richard Jaeho Hur
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
10
0.625
Minjae Jo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Gijeong Seo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Lithium-ion battery
Welding process
Laser welding
Welding automation
Metal Additive Manufacturing
Sungjin Whang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
9
0.500
Jaeheum Jung
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
9
0.818
Siarhei Zalivaka
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
NAND Flash
Hardware security
Physical Unclonable Functions
Active Metering
Tae Meon Bae
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Jeong-Kyoum Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Yonghyun Cho
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Lithium ion batteries
electrochemisty
cathode
degradation mechanism
Byung Kwan Park
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
8
0.667
ISP
3D Imaging
Computer Vision
Deep Learning
Sunghyun Yoon
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
3D NAND flash
Skin attachable electronics
MEMS
Human psychophysiological sensors
ferroelectric NAND
Sung-Soo Yoon
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
8
0.800
Material Science
Stretchable/flexible electronic devices
Nano-macro scale Si structuring by metal-assisted chemical etching
Sangjin Byeon
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
8
0.615
Hyunjun Eun
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
Deep Learning
Computer Vision
Keun Woo Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
8
0.421