Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings. Click here for individual or institutional registration.
Materials Chemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
memory
non-volatile memory
databases
energy and performance optimization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Distributed Machine Learning Optimization
Wireless Resource Management
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Physics
Materials Science
Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
side-channel attacks
system security
information security
applied cryptography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Semiconductor manufacturing
packaging
materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Microwave engineering
signal integrity
package and interconnect
antenna
optical
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Efficient AI for on-device deployment
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Heat Transfer
Fluid Mechanics
Electronics Cooling
Semiconductor Test
Thermal Management
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Image processing
computer vision
pattern recognition
and machine learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Nanoscience and nanotechnology
material science
electron microscopy
In Situ S/TEM for battery materials and liquid cell
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Computer Graphics
Computer Vision
Robotics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Semiconductor Devices
Compact Modeling
Epitaxial Growth
Quantum Transport
Topological Semimetal
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Microelectronic packaging
Reliability
Failure analysis
Fault isolation
Failure mechanisms
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Semiconductor
Nanowires
Deep ultraviolet LED
Solar Cell
Nanotechnology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Integrated Circuits and Sensors for Consumer & Biomedical Applications
High Speed Chip to Chip Communication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Polymer Chemistry
Lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Polymer Chemistry
Materials Science
Semiconductor processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
High Performance Computing
Computer Arithmetic
Performance Evaluation and Benchmarking
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
geophysics
hpc
AI
SOC and System design
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
PLL
Serdes
RF ...
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
Solid State Storage
Non-Volatile Memory
Storage Performance
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
Ankit Gujral
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Meghashree Dattatri Kedalagudde
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Karthik Kumar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
memory
non-volatile memory
databases
energy and performance optimization
Ravikumar Balakrishnan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Distributed Machine Learning Optimization
Wireless Resource Management
Justin Weber
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Thomas Unterluggauer
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
side-channel attacks
system security
information security
applied cryptography
Taner Aytun
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Semiconductor manufacturing
packaging
materials
Zhen Zhou
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Microwave engineering
signal integrity
package and interconnect
antenna
optical
Debabrata Mohapatra
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Efficient AI for on-device deployment
Akhilesh Rallabandi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Heat Transfer
Fluid Mechanics
Electronics Cooling
Semiconductor Test
Thermal Management
Julio Cesar Benitez Medina
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Mariano Tepper
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Image processing
computer vision
pattern recognition
and machine learning
Nabraj Bhattarai
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Nanoscience and nanotechnology
material science
electron microscopy
In Situ S/TEM for battery materials and liquid cell
Mike Roberts
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Computer Graphics
Computer Vision
Robotics
Omor Shoron
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Semiconductor Devices
Compact Modeling
Epitaxial Growth
Quantum Transport
Topological Semimetal
Deepak Goyal
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Microelectronic packaging
Reliability
Failure analysis
Fault isolation
Failure mechanisms
Atm Golam Sarwar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Semiconductor
Nanowires
Deep ultraviolet LED
Solar Cell
Nanotechnology
Kaveh Hosseini
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Integrated Circuits and Sensors for Consumer & Biomedical Applications
High Speed Chip to Chip Communication
Samuel C Price
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Sandani Samarajeewa
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Polymer Chemistry
Materials Science
Semiconductor processing
Pawel Gepner
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
High Performance Computing
Computer Arithmetic
Performance Evaluation and Benchmarking
Philippe Thierry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
geophysics
hpc
AI
SOC and System design
Chun-Ming Hsu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
Bryan Veal
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
Paolo Madoglio
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667