Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
Advanced Technologies of Optical Metrology and Manufacturing (AOTM2)
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
12
0.750
metrology
microelectromechanical systems
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
11
0.688
Analytical Chemistry
Chemical metrology
Chromatography
Food Chemistry
Mass Spectrometry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
Spintronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
nano electronics
nano mechanics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Frequency combs
ultrafast lasers
optical metrology
dimensional metrology
Interferometry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Optical metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
physical chemistry
X-ray spectroscopy
neutron activation analysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Electron microscopy
Material Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Operando XRD
Intercalation of 2D layered materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
pressure
gravity
metrology
CNT
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
8
0.533
Humidity Standard
Air Temperature Metrology
Humidity Sensors
Calibration
Measurement at Extremes
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Analytical chemistry
Metabolomics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Quantum Information
Quantum Optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
microwave
metrology
waveform
measurement uncertainty
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Analytical Chemistry
Electrochemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Magnetic resonance
Brillouin light scattering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
Quantum Electrical Metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Nanomaterials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Nano science
AFM
2D materials
Energy harvesting
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Loudspeaker array
3D sound
sound focusing
microphone array
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
antenna and field strength metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
9
0.692
Environmental-assisted Fracture
Material Characterization
Mechanical Testing
Hydrogen Embrittlement
Failure Analyses
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
Il Doh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
Young-Sik Ghim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
12
0.750
Advanced Technologies of Optical Metrology and Manufacturing (AOTM2)
Kwang-Cheol Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
11
0.688
Mohamed A Gab-Allah
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
Analytical Chemistry
Chemical metrology
Chromatography
Food Chemistry
Mass Spectrometry
Seungmo Yang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Hakseong Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
nano electronics
nano mechanics
Yoon-Soo Jang|장 윤수
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Frequency combs
ultrafast lasers
optical metrology
dimensional metrology
Interferometry
Jungjae Park
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
Hana Cho
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
14
0.933
physical chemistry
X-ray spectroscopy
neutron activation analysis
Ji-Hwan Kwon
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Seungwoo Song
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Operando XRD
Intercalation of 2D layered materials
In-Mook Choi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
8
0.533
Sang-Wook, Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Humidity Standard
Air Temperature Metrology
Humidity Sensors
Calibration
Measurement at Extremes
Dong Kyu Lim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Analytical chemistry
Metabolomics
Sang Min Lee
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
Chihyun Cho
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Kyungmin Jo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
9
0.643
Analytical Chemistry
Electrochemistry
Changsoo Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
Dong-Hun Chae
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Haksung Jung
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Chaeho Shin
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Nano science
AFM
2D materials
Energy harvesting
Jiho Chang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
10
0.769
No-Weon Kang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
9
0.692
antenna and field strength metrology
Thanh Tuan Nguyen
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
Environmental-assisted Fracture
Material Characterization
Mechanical Testing
Hydrogen Embrittlement
Failure Analyses
Junho Suh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000