The Citation Rankings (Highly Cited Researchers) highlight the most cited and influential researchers across a vast range of scientific fields, covering 197 main and sub-disciplines, including the Art and Humanities Citation Rankings and Social Sciences and Humanities Citation Rankings. This service, offered exclusively by AD Scientific Index, aims to provide a balanced perspective by excluding data from CERN and other statistical sources that disproportionately favor certain researchers, particularly in the social sciences and humanities. This unique approach addresses the advantages researchers with multi-author publications and CERN involvement hold over others. Furthermore, citation rankings help uncover rule violations and unethical practices within the research community. For more detailed citation analyses, explore the Scientists Last 6 Years Citation Index, Universities Total Citations Rankings 2025, and Universities Last 6 Years Citations Rankings 2025.
* Total Citation Counts Rankings
Ranking Based On Selection :1
Reliability Physics
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
7,251
2,331
0.321
* Total Citation Counts Rankings
Ranking Based On Selection :2
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,376
3,843
0.603
* Total Citation Counts Rankings
Ranking Based On Selection :3
cryptography
algorithms
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,255
1,415
0.435
* Total Citation Counts Rankings
Ranking Based On Selection :4
Radar
ADAS
Biomedical
Autonomous driving
V2X
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,272
1,161
0.511
* Total Citation Counts Rankings
Ranking Based On Selection :5
CMOS
Integrated Circuits
Power Management
Mixed Signal Design
ADC
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,015
357
0.177
* Total Citation Counts Rankings
Ranking Based On Selection :6
AURIX MCU for xEV
On-board charger
HV/LV DCDC
Main inverter
BMS
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,742
1,490
0.855
* Total Citation Counts Rankings
Ranking Based On Selection :7
VLSI
cryptographic hardware
security
mixed-signal
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,701
457
0.269
* Total Citation Counts Rankings
Ranking Based On Selection :8
Semiconductors
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,590
499
0.314
* Total Citation Counts Rankings
Ranking Based On Selection :9
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,494
657
0.440
* Total Citation Counts Rankings
Ranking Based On Selection :10
Side-Channel Attacks
Lattice-Based Cryptography
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,402
1,169
0.834
* Total Citation Counts Rankings
Ranking Based On Selection :11
RF
Integrated Circuits
Millimeter-Wave
Analog
CMOS
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,233
877
0.711
* Total Citation Counts Rankings
Ranking Based On Selection :12
Expert Engineer reliability
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,186
496
0.418
* Total Citation Counts Rankings
Ranking Based On Selection :13
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,139
394
0.346
* Total Citation Counts Rankings
Ranking Based On Selection :14
Nanowires
packaging
IGBT
gate driver
SiC
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,131
664
0.587
* Total Citation Counts Rankings
Ranking Based On Selection :15
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,106
347
0.314
* Total Citation Counts Rankings
Ranking Based On Selection :16
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,081
315
0.291
* Total Citation Counts Rankings
Ranking Based On Selection :17
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,049
702
0.669
* Total Citation Counts Rankings
Ranking Based On Selection :18
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,034
873
0.844
* Total Citation Counts Rankings
Ranking Based On Selection :19
NVM
RRAM
MRAM
CT-NAND
Flash
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,023
744
0.727
* Total Citation Counts Rankings
Ranking Based On Selection :20
ESD
reliability
measurements
instrumentation
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,000
320
0.320
* Total Citation Counts Rankings
Ranking Based On Selection :21
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
895
367
0.410
* Total Citation Counts Rankings
Ranking Based On Selection :22
Ferroelectrics
Pyroelectrics
Energy Storage
Electrocalorics
Energy Harvesting
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
883
874
0.990
* Total Citation Counts Rankings
Ranking Based On Selection :23
Secure and Efficient Implementations
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
847
357
0.421
* Total Citation Counts Rankings
Ranking Based On Selection :24
Advanced Electron Microscopy
Failure Analysis
Structure Property Correlation
Thin Films of Functional Oxides
Semiconductor D
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
841
316
0.376
* Total Citation Counts Rankings
Ranking Based On Selection :25
Reliability
BTI
SiC
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
804
761
0.947
Hans Reisinger
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
7,251
2,331
0.321
Oliver Häberlen
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,376
3,843
0.603
Martin Schläffer
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,255
1,415
0.435
Byung Kwon Park
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,272
1,161
0.511
Christoph Sandner
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,015
357
0.177
CMOS
Integrated Circuits
Power Management
Mixed Signal Design
ADC
Renke(Richard) Han
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,742
1,490
0.855
AURIX MCU for xEV
On-board charger
HV/LV DCDC
Main inverter
BMS
Raimondo Luzzi
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,701
457
0.269
Dominic J Thurmer
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,590
499
0.314
Daniela L Mafra
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,494
657
0.440
Peter Pessl
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,402
1,169
0.834
Matteo Bassi
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,233
877
0.711
Marco Silvestri
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,186
496
0.418
Haifeng Sun
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,139
394
0.346
Julian Treu
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,131
664
0.587
Stefano Marsili
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,106
347
0.314
Nicholas Dellas
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,081
315
0.291
Ismail Nasr
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,049
702
0.669
Norbert Druml
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,034
873
0.844
Alessandro Grossi
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,023
744
0.727
Mirko Scholz
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,000
320
0.320
Francesco Barbon
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
895
367
0.410
Clemens Mart
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
883
874
0.990
Ferroelectrics
Pyroelectrics
Energy Storage
Electrocalorics
Energy Harvesting
Erich Wenger
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
847
357
0.421
Sriram Venkatesan
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
841
316
0.376
Advanced Electron Microscopy
Failure Analysis
Structure Property Correlation
Thin Films of Functional Oxides
Semiconductor D
Katja Puschkarsky; Katja Waschneck
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
804
761
0.947