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III-nitride epitaxy
XRD
optical characterization
numerical modeling
Metrics
H-Index
i10 Index
Citation Counts
22
45
1,596
Nanotechnology
Scanning probe microscopy
plasmonic materials
Metrics
H-Index
i10 Index
Citation Counts
22
44
1,749
BioNanotechnology
Raman spectroscopy
Scanning probe microscopy
cell imaging
proteins
Metrics
H-Index
i10 Index
Citation Counts
21
39
1,774
nanotechnology
micro- and nanofabrication
e-beam lithography
materials science
Metrics
H-Index
i10 Index
Citation Counts
19
29
1,026
Physical Chemistry
Organic Electronics
Nanotechnology
Metrics
H-Index
i10 Index
Citation Counts
16
20
857
Metrics
H-Index
i10 Index
Citation Counts
14
17
630
Tadas Malinauskas
Vilnius University
Vilnius, Lithuania
Metrics
H-Index
i10-Index
Citation Counts
22
45
1,596
III-nitride epitaxy
XRD
optical characterization
numerical modeling
Asta Guobiene
Metrics
H-Index
i10-Index
Citation Counts
22
44
1,749
Nanotechnology
Scanning probe microscopy
plasmonic materials
Valentinas Snitka
Metrics
H-Index
i10-Index
Citation Counts
21
39
1,774
BioNanotechnology
Raman spectroscopy
Scanning probe microscopy
cell imaging
proteins
Viktoras Grigaliūnas
Metrics
H-Index
i10-Index
Citation Counts
19
29
1,026
nanotechnology
micro- and nanofabrication
e-beam lithography
materials science
Tomas Serevičius
Vilnius University
Vilnius, Lithuania
Metrics
H-Index
i10-Index
Citation Counts
16
20
857
Physical Chemistry
Organic Electronics
Nanotechnology
Steponas Raisys
Vilnius University
Vilnius, Lithuania
Metrics
H-Index
i10-Index
Citation Counts
14
17
630