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Metrics
H-Index
i10 Index
Citation Counts
35
100
8,756
atomic layer processing
device intégration
new memories
Metrics
H-Index
i10 Index
Citation Counts
26
69
3,425
Metrics
H-Index
i10 Index
Citation Counts
23
58
2,448
Lithography
Metrics
H-Index
i10 Index
Citation Counts
22
45
1,483
Semiconductors
Metrics
H-Index
i10 Index
Citation Counts
22
42
2,044
Metrics
H-Index
i10 Index
Citation Counts
20
23
3,681
Physical Vapor Deposition
Reactive Ion Etching
Metrics
H-Index
i10 Index
Citation Counts
20
26
1,503
Metrics
H-Index
i10 Index
Citation Counts
18
22
1,662
Wide Band Gap
Semiconductor
CVD
Equipment
Metrics
H-Index
i10 Index
Citation Counts
14
15
455
Metrics
H-Index
i10 Index
Citation Counts
13
19
694
Spintronics
Spincaloritronics
Half-metallic Heusler alloy
Metrics
H-Index
i10 Index
Citation Counts
13
14
1,122
Metrics
H-Index
i10 Index
Citation Counts
9
7
251
Optical inspection and metrology
Metrics
H-Index
i10 Index
Citation Counts
8
8
1,121
Wet clean/etching
surface preparation
Metrics
H-Index
i10 Index
Citation Counts
8
8
334
Low Temperature plasmas
Surface Science
Metrology and diagnostics
Metrics
H-Index
i10 Index
Citation Counts
7
7
202
Metrics
H-Index
i10 Index
Citation Counts
7
6
386
Metrics
H-Index
i10 Index
Citation Counts
5
1
52
Semiconductor Manufacturing
Dry Etch
Next gen computing
Metrics
H-Index
i10 Index
Citation Counts
4
1
40
Metrics
H-Index
i10 Index
Citation Counts
4
3
162
Seniconductor - Dry Etch
Metrics
H-Index
i10 Index
Citation Counts
3
2
67
heterogeneous integration
hybrid bonding
semiconductor
wafer packaging
electrical measurement
Metrics
H-Index
i10 Index
Citation Counts
3
2
48
Low Temperature plasmas
Surface Science
Metrology and diagnostics
heterogeneous integration
hybrid bonding
semiconductor
wafer packaging
electrical measurement