The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index"and Subject Rankings.
single frequency laser
gravitational wave detection
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
138
107
0.775
Ferroelectrics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
56
39
0.696
Nanotechnology
material science
lasers
material processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
24
0.558
Spectroscopy of molecules & nanoscale systems
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
37
24
0.649
Additive Manufacturing
Laser Material processing
Technology Incubation.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
34
0.944
Computational Materials Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
21
0.600
Biophotonics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
18
0.514
nonlinear optics
nanoparticles
fiber laser
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
28
0.848
Mechanical Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
24
0.750
RF and Microwave Solid-State Amplifier
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
Laser processing
microstructural analysis
joining
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
22
0.733
Interest: Magnetic
electrical and thermal properties of magnetic materials and superconductors.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
17
0.567
interface study of metal and oxide thinfilms and multilayer
Metal alloy corrosion
Solid Electrolyte Interphase (SEI) formation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
22
0.786
Synchrotron
X-ray diffraction
Thin film growth
X-ray reflectivity
Residual stress analysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
20
0.800
Electron Microscopy
Nanoscience
Lithography
Metal oxide
X-ray reflectivity
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
18
0.750
Materials joining
Optical Microscopy
Mechanical testing
laser additive manufacturing
laser peening
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
22
0.957
Chemical sensors using polymer FET
Pulse laser nano-structure fabrication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
14
0.609
X-ray fluorescence
TXRF X-ray reflectivity
X-ray standing wave
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
12
0.522
Laser Plasma interaction
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
13
0.591
Material science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
Laser Produced Plasma
Plasma Diagnostics
Magnetic Confinement of Plasma
Spectroscopy
Radiation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
Material Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
15
0.714
Semiconductor Physics & Devices
Quantum Materials
Epitaxy
III-V/Nitrides
Spectroscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
photoemission
strongly correlated systems
heusler alloys
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Jogy George
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
138
107
0.775
Gurvinderjit Singh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
56
39
0.696
Lm Kukreja
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
24
0.558
Nanotechnology
material science
lasers
material processing
Kaustuv Das
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
37
24
0.649
CP Paul
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
34
0.944
Additive Manufacturing
Laser Material processing
Technology Incubation.
Aparna Chakrabarti
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
21
0.600
Computational Materials Science
Shovan K Majumder
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
18
0.514
Kushvinder Singh Bindra
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
28
0.848
Abhay Kumar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
24
0.750
Mechanical Engineering
Akhilesh Jain
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
Rakesh Kaul
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
22
0.733
Maulindu Kumar Chattopadhyay
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
17
0.567
Interest: Magnetic
electrical and thermal properties of magnetic materials and superconductors.
Parasmani Rajput
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
22
0.786
interface study of metal and oxide thinfilms and multilayer
Metal alloy corrosion
Solid Electrolyte Interphase (SEI) formation
Sanjay Kumar Rai
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
20
0.800
Synchrotron
X-ray diffraction
Thin film growth
X-ray reflectivity
Residual stress analysis
Pragya Tiwari
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
18
0.750
Electron Microscopy
Nanoscience
Lithography
Metal oxide
X-ray reflectivity
P Ganesh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
Materials joining
Optical Microscopy
Mechanical testing
laser additive manufacturing
laser peening
Archna Sagdeo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
22
0.957
Ravi Shanker Verma
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
14
0.609
Chemical sensors using polymer FET
Pulse laser nano-structure fabrication
MK Tiwari
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
12
0.522
Himanshu Singhal
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
13
0.591
Srinibas Satapathy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
Virendra Nath Rai
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
Laser Produced Plasma
Plasma Diagnostics
Magnetic Confinement of Plasma
Spectroscopy
Radiation
Rs Ajimsha
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
15
0.714
Tarun Kumar Sharma
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619
Semiconductor Physics & Devices
Quantum Materials
Epitaxy
III-V/Nitrides
Spectroscopy
Soma Banik
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
13
0.619