Tokyo Electron is a
prestigious company university
established in 1963 in Japan. It is represented
by 37 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (9 scientists), Natural Sciences (6 scientists), and Business & Management (1 scientists).
* Total H Index Rankings
Ranking Based
On Selection :26
Low Temperature plasmas
Surface Science
Metrology and diagnostics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
* Total H Index Rankings
Ranking Based
On Selection :27
semiconductor
nano-materials
solar energy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
* Total H Index Rankings
Ranking Based
On Selection :28
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
* Total H Index Rankings
Ranking Based
On Selection :29
Materials simulations
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
* Total H Index Rankings
Ranking Based
On Selection :30
Computational Physics
Plasma Physics
Kinetic Theory
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
* Total H Index Rankings
Ranking Based
On Selection :31
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection :32
Plasma physics
Combustion
Fluid dynamics
Semiconductor processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
* Total H Index Rankings
Ranking Based
On Selection :33
Semiconductor Manufacturing
Dry Etch
Next gen computing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
* Total H Index Rankings
Ranking Based
On Selection :34
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
* Total H Index Rankings
Ranking Based
On Selection :35
Phase change materials
Materials and dimensional metrology
Chip process
Defect detection
Sensor metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
* Total H Index Rankings
Ranking Based
On Selection :36
Seniconductor - Dry Etch
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
* Total H Index Rankings
Ranking Based
On Selection :37
heterogeneous integration
hybrid bonding
semiconductor
wafer packaging
electrical measurement
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
Shyam Sridhar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Low Temperature plasmas
Surface Science
Metrology and diagnostics
Yen Tien Lu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
semiconductor
nano-materials
solar energy
Angelique Raley
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Ankur Agarwal
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Sergey Averkin
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Computational Physics
Plasma Physics
Kinetic Theory
Cheryl Pereira
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Evrim Solmaz
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Plasma physics
Combustion
Fluid dynamics
Semiconductor processing
Christopher Catano
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Yu-Hao Tsai
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Ashawaraya Shalini
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Phase change materials
Materials and dimensional metrology
Chip process
Defect detection
Sensor metrology
Deepak Vedhachalam
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Kevin Ryan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
heterogeneous integration
hybrid bonding
semiconductor
wafer packaging
electrical measurement