Diamond Light Source Ltd is a
prestigious company university
established in 2001 in United Kingdom. It is represented
by 144 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Natural Sciences (37 scientists), Engineering & Technology (18 scientists), and Medical and Health Sciences (4 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 76
X-ray tomography
lithium-ion batteries
image-based modelling
electrochemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
* Total H Index Rankings
Ranking Based
On Selection: 77
Synchrotron Science
Forensic Chemistry
Chemical Imaging
Science Communication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
* Total H Index Rankings
Ranking Based
On Selection: 78
structural biology
biophysics
X-ray crystallography
XFELs
Time-resolved studies
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
* Total H Index Rankings
Ranking Based
On Selection: 79
IR Spectroscopy
IR Microscopy
nano-IR
Water
High Pressure
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
* Total H Index Rankings
Ranking Based
On Selection: 80
energy materials
powder diffraction
xray scattering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection: 81
Total Scattering
Pair Distribution Function
Aqueous Systems
Functional Materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection: 82
Hydrothermal Carbonisation
X-ray Scattering
X-ray Spectroscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection: 83
Scanning Probe Microscopy
Atomic Force Microscopy - IR
Atomic Manipulation
Chemical Characterisation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
* Total H Index Rankings
Ranking Based
On Selection: 84
resonant X-ray reflectivity
X-ray magnetic scattering
X-ray optics
Magnetic materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
* Total H Index Rankings
Ranking Based
On Selection: 85
particle accelerators
microwave engineering
metrology
nonlinear amplifier measurements
network analysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
2
0.667
* Total H Index Rankings
Ranking Based
On Selection: 86
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
James Le Houx
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
X-ray tomography
lithium-ion batteries
image-based modelling
electrochemistry
Rhiannon Boseley
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
Synchrotron Science
Forensic Chemistry
Chemical Imaging
Science Communication
Kyprianos Hadjidemetriou
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
structural biology
biophysics
X-ray crystallography
XFELs
Time-resolved studies
Hendrik Vondracek
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Christopher Foo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Daniel Irving
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Total Scattering
Pair Distribution Function
Aqueous Systems
Functional Materials
Luke Higgins
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Ioannis Lekkas
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Scanning Probe Microscopy
Atomic Force Microscopy - IR
Atomic Manipulation
Chemical Characterisation
Kiranjot|Kiranjot Dhaliwal
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
resonant X-ray reflectivity
X-ray magnetic scattering
X-ray optics
Magnetic materials
Laurence Stant
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
2
0.667
particle accelerators
microwave engineering
metrology
nonlinear amplifier measurements
network analysis
Walter Tizzano
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000