The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "Scientists Last 6 years H-index" and Subject Rankings.
* Last 6 Years H Index Rankings
Ranking Based
On Selection :1
Medical Image Analysis
NeuroImaging
Body Imaging
Imaging Informatics / Big Data
Machine Learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
70
62
0.886
* Last 6 Years H Index Rankings
Ranking Based
On Selection :2
radiation effects
defects
microelectronics
low frequency noise
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
93
45
0.484
* Last 6 Years H Index Rankings
Ranking Based
On Selection :3
nanophotonics
plasmonics
metamaterials
semiconductor materials
power electronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
54
45
0.833
* Last 6 Years H Index Rankings
Ranking Based
On Selection :4
Semiconductor Devices
Microelectronics
Radiation Effects in Electronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
86
43
0.500
* Last 6 Years H Index Rankings
Ranking Based
On Selection :5
Robotics
Human-Robot Interaction
Rehabiltation Robotics
Human-Computer Interaction
Affective Computing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
57
41
0.719
* Last 6 Years H Index Rankings
Ranking Based
On Selection :6
Medical Image Processing
Image Guided Surgery
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
40
35
0.875
* Last 6 Years H Index Rankings
Ranking Based
On Selection :7
formal methods
hybrid systems
formal verification
safe AI
trustworthy AI
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
33
0.943
* Last 6 Years H Index Rankings
Ranking Based
On Selection :8
Radiation Effects
Microelectronics
Photonics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
60
32
0.533
* Last 6 Years H Index Rankings
Ranking Based
On Selection :9
signal transduction
neuroscience
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
73
32
0.438
* Last 6 Years H Index Rankings
Ranking Based
On Selection :10
Silicon photonics
porous silicon
nanophotonics
biosensing
hybrid materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
45
28
0.622
* Last 6 Years H Index Rankings
Ranking Based
On Selection :11
Image guided surgery
robotics
kidney cancer
prostate cancer
stone disease
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
25
0.568
* Last 6 Years H Index Rankings
Ranking Based
On Selection :12
radiation effects on electronics
power electronics
Wide bandgap power devices
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
23
0.535
* Last 6 Years H Index Rankings
Ranking Based
On Selection :13
Embedded Systems
Wireless Networks
Software-defined Radios
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
23
0.719
* Last 6 Years H Index Rankings
Ranking Based
On Selection :14
Computer Architecture
VLSI Design
Security
Fault Tolerance
Reliability
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
18
0.720
* Last 6 Years H Index Rankings
Ranking Based
On Selection :15
Medical robotics
continuum robots
haptics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
* Last 6 Years H Index Rankings
Ranking Based
On Selection :16
Radiation Effects
CMOS
Single-Event Effects
Compact Modeling
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
* Last 6 Years H Index Rankings
Ranking Based
On Selection :17
Metasurfaces
Plasmonics
Exosomes
Nanophotonics
Optofluidics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
* Last 6 Years H Index Rankings
Ranking Based
On Selection :18
analog and mixed-signal circuit design
radiation effects in microelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
15
0.517
* Last 6 Years H Index Rankings
Ranking Based
On Selection :19
Rhinology
Skull Base Surgery
Robotics
Sinus surgery
Image guidance
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
15
0.652
* Last 6 Years H Index Rankings
Ranking Based
On Selection :20
signal processing
machine learning
medical imaging
robotics
speech processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
13
0.481
* Last 6 Years H Index Rankings
Ranking Based
On Selection :21
Intelligent Human Machine Systems
Machine Learning
Artificial Intelligence
Affective Computing
Human-Computer Interactions
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
* Last 6 Years H Index Rankings
Ranking Based
On Selection :22
Radiation Effects in Microelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
* Last 6 Years H Index Rankings
Ranking Based
On Selection :23
Metamaterials
Metasurface
Nanophotonics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
* Last 6 Years H Index Rankings
Ranking Based
On Selection :24
Reliability
Microelectronics
automated testing
data science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
* Last 6 Years H Index Rankings
Ranking Based
On Selection :25
radiation effects
particle accelerators
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
Bennett Allan Landman
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
70
62
0.886
Medical Image Analysis
NeuroImaging
Body Imaging
Imaging Informatics / Big Data
Machine Learning
Daniel M Fleetwood
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
93
45
0.484
radiation effects
defects
microelectronics
low frequency noise
Joshua D Caldwell
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
54
45
0.833
nanophotonics
plasmonics
metamaterials
semiconductor materials
power electronics
Ron Schrimpf
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
86
43
0.500
Semiconductor Devices
Microelectronics
Radiation Effects in Electronics
Nilanjan Sarkar
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
57
41
0.719
Robotics
Human-Robot Interaction
Rehabiltation Robotics
Human-Computer Interaction
Affective Computing
Jack H Noble
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
40
35
0.875
Medical Image Processing
Image Guided Surgery
Taylor T Johnson
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
33
0.943
formal methods
hybrid systems
formal verification
safe AI
trustworthy AI
Robert A Reed
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
60
32
0.533
Radiation Effects
Microelectronics
Photonics
Roger Colbran
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
73
32
0.438
signal transduction
neuroscience
Sharon M Weiss
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
45
28
0.622
Silicon photonics
porous silicon
nanophotonics
biosensing
hybrid materials
S Duke Herrell
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
25
0.568
Image guided surgery
robotics
kidney cancer
prostate cancer
stone disease
Arthur Witulski
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
23
0.535
radiation effects on electronics
power electronics
Wide bandgap power devices
Peter Volgyesi
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
23
0.719
Embedded Systems
Wireless Networks
Software-defined Radios
William H Robinson
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
18
0.720
Computer Architecture
VLSI Design
Security
Fault Tolerance
Reliability
Andrea Bajo
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
Medical robotics
continuum robots
haptics
Jeffrey S Kauppila
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
Radiation Effects
CMOS
Single-Event Effects
Compact Modeling
Justus Ndukaife
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
Metasurfaces
Plasmonics
Exosomes
Nanophotonics
Optofluidics
W Timothy Holman
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
15
0.517
analog and mixed-signal circuit design
radiation effects in microelectronics
Paul T Russell
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
15
0.652
Rhinology
Skull Base Surgery
Robotics
Sinus surgery
Image guidance
Dm Wilkes
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
13
0.481
signal processing
machine learning
medical imaging
robotics
speech processing
Lian Zhang
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
Intelligent Human Machine Systems
Machine Learning
Artificial Intelligence
Affective Computing
Human-Computer Interactions
Timothy D Haeffner
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
Radiation Effects in Microelectronics
Hanyu Zheng
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
Metamaterials
Metasurface
Nanophotonics
Pan Wang
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
Reliability
Microelectronics
automated testing
data science
Mike Mccurdy
Vanderbilt University
Nashville, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
radiation effects
particle accelerators