Western Digital Corporation is a
prestigious company university
established in 1970 in United States. It is represented
by 109 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (32 scientists), Natural Sciences (6 scientists), and Social Sciences (1 scientists).
* Last 6 Years H Index Rankings
Ranking Based
On Selection :1
magnetic materials
complex oxides
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
32
0.744
* Last 6 Years H Index Rankings
Ranking Based
On Selection :2
Physical Metallurgy
Semiconductor
Atom Probe Tomography
Electron Microscopy
Thin Film
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
30
0.882
* Last 6 Years H Index Rankings
Ranking Based
On Selection :3
nano-technology
device and materials physics
spintronics
magnetism
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
22
0.500
* Last 6 Years H Index Rankings
Ranking Based
On Selection :4
NVMs
ALD
Perovskites
colloidal quantum dots
2D materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
20
1.000
* Last 6 Years H Index Rankings
Ranking Based
On Selection :5
Nonvolatile memory
magnetic materials
spintronics
ferroelectrics
magnetic recording
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
40
18
0.450
* Last 6 Years H Index Rankings
Ranking Based
On Selection :6
Magnetism
Spintronics
Ferroelectric materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
18
0.750
* Last 6 Years H Index Rankings
Ranking Based
On Selection :7
Materials Physics
Thin Film Deposition
Materials Characterization
Device Materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
13
0.722
* Last 6 Years H Index Rankings
Ranking Based
On Selection :8
Magnetism
Magnetic Recording
Magnetic Nanowires
magnetic thin films
soft magnetic materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
9
0.692
* Last 6 Years H Index Rankings
Ranking Based
On Selection :9
Magnetic Recording
Magnetic Materials
Physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
7
0.412
* Last 6 Years H Index Rankings
Ranking Based
On Selection :10
Semiconductor Packaging
Materials Science
Device Reliability
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
* Last 6 Years H Index Rankings
Ranking Based
On Selection :11
Materials Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
* Last 6 Years H Index Rankings
Ranking Based
On Selection :12
Materials Science
Physical Metallurgy
Electron Microscopy
SRF
Synchrotron XRD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Rajesh Vilas Chopdekar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
32
0.744
magnetic materials
complex oxides
Wei Guo (郭炜）
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
30
0.882
Physical Metallurgy
Semiconductor
Atom Probe Tomography
Electron Microscopy
Thin Film
Oleg Mryasov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
22
0.500
nano-technology
device and materials physics
spintronics
magnetism
Valerio Adinolfi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
20
1.000
NVMs
ALD
Perovskites
colloidal quantum dots
2D materials
Shaoping Li
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
40
18
0.450
Nonvolatile memory
magnetic materials
spintronics
ferroelectrics
magnetic recording
Alan Kalitsov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
18
0.750
Magnetism
Spintronics
Ferroelectric materials
John C. Read
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
13
0.722
Materials Physics
Thin Film Deposition
Materials Characterization
Device Materials
Muhammad Asif Bashir
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
9
0.692
Magnetism
Magnetic Recording
Magnetic Nanowires
magnetic thin films
soft magnetic materials
Changhe Shang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
7
0.412
Magnetic Recording
Magnetic Materials
Physics
Ashutosh Jain
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
Semiconductor Packaging
Materials Science
Device Reliability
Tomin Liu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Mingmin Wang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Materials Science
Physical Metallurgy
Electron Microscopy
SRF
Synchrotron XRD