University of Delaware is a
prestigious public university
established in 1743 in United States. It is represented
by 1,775 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (471 scientists), Social Sciences and Humanities (300 scientists), and Natural Sciences (265 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 1
signal processing
digital communications
radar signal processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
90
52
0.578
* Total H Index Rankings
Ranking Based
On Selection: 2
Electronic Structure Theory
Semiconductor Physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
81
55
0.679
* Total H Index Rankings
Ranking Based
On Selection: 3
electric vehicles
offshore wind power
vehicle-to-grid power (V2G)
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
68
40
0.588
* Total H Index Rankings
Ranking Based
On Selection: 4
wireless communications and networks
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
54
18
0.333
* Total H Index Rankings
Ranking Based
On Selection: 5
photonics
optics
electromagnetics
millimeter waves
radar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
53
27
0.509
* Total H Index Rankings
Ranking Based
On Selection: 6
optoelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
49
13
0.265
* Total H Index Rankings
Ranking Based
On Selection: 7
compilers and programming tools for parallel computing
cyberinfrastructure
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
47
14
0.298
* Total H Index Rankings
Ranking Based
On Selection: 8
Semiconductors
Optoelectronics
Infrared Detectors
Photovoltaics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
46
22
0.478
* Total H Index Rankings
Ranking Based
On Selection: 9
robotics
3D vision
state estimation
visual inertial systems
SLAM
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
35
0.897
* Total H Index Rankings
Ranking Based
On Selection: 10
Semiconductor devices
Optoelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
14
0.412
* Total H Index Rankings
Ranking Based
On Selection: 11
Optimization
Decentralized AI
Blockchain
Digital Twins
Smart Cities
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
20
0.769
* Total H Index Rankings
Ranking Based
On Selection: 12
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
10
0.385
* Total H Index Rankings
Ranking Based
On Selection: 13
Mixed-Signal IC Design
CMOS Photonic ICs
RF/mmWave Photonics
Neuromorphic Circuits
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
16
0.640
* Total H Index Rankings
Ranking Based
On Selection: 14
cybersecurity
networking
IOC
orchestration
high-availability
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
20
0.833
* Total H Index Rankings
Ranking Based
On Selection: 15
Rehabilitation robotics
Neuromechanics
Human-Robot Interaction
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
16
0.696
* Total H Index Rankings
Ranking Based
On Selection: 16
Cybersecurity
Machine Learning
Data Science
Wireless Networking
Performance Analysis-Fault Tolerance
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
11
0.478
* Total H Index Rankings
Ranking Based
On Selection: 17
Embedded Systems
Fault tolerance
Hardware Security
Computer Architecture
Emerging Memory Technologies
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
15
0.682
* Total H Index Rankings
Ranking Based
On Selection: 18
Signal Processing
Image Processing
Control
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
7
0.333
* Total H Index Rankings
Ranking Based
On Selection: 19
Nanoelectronics
Microelectronics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
15
0.833
* Total H Index Rankings
Ranking Based
On Selection: 20
Semiconductor
thin film
device fabrication
characterization
epitaxy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
* Total H Index Rankings
Ranking Based
On Selection: 21
Electrification
Microwave Heating
Joule Heating
LOHC
Heterogeneous Catalysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
* Total H Index Rankings
Ranking Based
On Selection: 22
Compressive Sensing
Computed Tomography
Inverse Problems
Signal Processing
X-ray Imaging
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
* Total H Index Rankings
Ranking Based
On Selection: 23
Group IV epitaxy
electrical engineering
semiconductor physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
* Total H Index Rankings
Ranking Based
On Selection: 24
Wireless communications and signal processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
3
0.333
* Total H Index Rankings
Ranking Based
On Selection: 25
Integrated Photonics
Silicon Photonics
Thin-film Lithium Niobate
Electromagnetic
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
7
0.875
Xiang Gen Xia
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
90
52
0.578
signal processing
digital communications
radar signal processing
Anderson Janotti
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
81
55
0.679
Electronic Structure Theory
Semiconductor Physics
Willett Kempton
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
68
40
0.588
electric vehicles
offshore wind power
vehicle-to-grid power (V2G)
Leonard Cimini
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
54
18
0.333
wireless communications and networks
Dennis W Prather
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
53
27
0.509
photonics
optics
electromagnetics
millimeter waves
radar
Keith Goossen
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
49
13
0.265
Rudolf Eigenmann
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
47
14
0.298
compilers and programming tools for parallel computing
cyberinfrastructure
Jamie Phillips
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
46
22
0.478
Semiconductors
Optoelectronics
Infrared Detectors
Photovoltaics
Guoquan (Paul) Huang
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
35
0.897
robotics
3D vision
state estimation
visual inertial systems
SLAM
James Kolodzey
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
14
0.412
Semiconductor devices
Optoelectronics
Mark Nejad
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
20
0.769
Optimization
Decentralized AI
Blockchain
Digital Twins
Smart Cities
Fouad Kiamilev
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
10
0.385
Vishal Saxena
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
16
0.640
Mixed-Signal IC Design
CMOS Photonic ICs
RF/mmWave Photonics
Neuromorphic Circuits
Chase Cotton
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
20
0.833
cybersecurity
networking
IOC
orchestration
high-availability
Fabrizio Sergi
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
16
0.696
Rehabilitation robotics
Neuromechanics
Human-Robot Interaction
Amitabh Mishra
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
11
0.478
Cybersecurity
Machine Learning
Data Science
Wireless Networking
Performance Analysis-Fault Tolerance
Chengmo Yang
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
15
0.682
Embedded Systems
Fault tolerance
Hardware Security
Computer Architecture
Emerging Memory Technologies
Zhongmin Wang
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
7
0.333
Signal Processing
Image Processing
Control
Yuping Zeng
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
15
0.833
Nanoelectronics
Microelectronics
Nupur Bhargava
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Semiconductor
thin film
device fabrication
characterization
epitaxy
Yeonsu Kwak
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Electrification
Microwave Heating
Joule Heating
LOHC
Heterogeneous Catalysis
Angela Cuadros
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
Compressive Sensing
Computed Tomography
Inverse Problems
Signal Processing
X-ray Imaging
Ryan Hickey
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Group IV epitaxy
electrical engineering
semiconductor physics
Bo Gui
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
3
0.333
Wireless communications and signal processing
Abu Naim Rakib Ahmed
University of Delaware
Newark, United States
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
7
0.875
Integrated Photonics
Silicon Photonics
Thin-film Lithium Niobate
Electromagnetic