The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "Scientists Last 6 years H-index"and Subject Rankings.
* Total H Index Rankings
Ranking Based
On Selection :1
nano-technology
device and materials physics
spintronics
magnetism
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
22
0.500
* Total H Index Rankings
Ranking Based
On Selection :2
magnetic materials
complex oxides
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
32
0.744
* Total H Index Rankings
Ranking Based
On Selection :3
Nonvolatile memory
magnetic materials
spintronics
ferroelectrics
magnetic recording
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
18
0.439
* Total H Index Rankings
Ranking Based
On Selection :4
Physical Metallurgy
Semiconductor
Atom Probe Tomography
Electron Microscopy
Thin Film
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
30
0.882
* Total H Index Rankings
Ranking Based
On Selection :5
Magnetism
Spintronics
Ferroelectric materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
* Total H Index Rankings
Ranking Based
On Selection :6
NVMs
ALD
Perovskites
colloidal quantum dots
2D materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
19
1.000
* Total H Index Rankings
Ranking Based
On Selection :7
Materials Physics
Thin Film Deposition
Materials Characterization
Device Materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
12
0.667
* Total H Index Rankings
Ranking Based
On Selection :8
Magnetic Recording
Magnetic Materials
Physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
7
0.412
* Total H Index Rankings
Ranking Based
On Selection :9
Magnetism
Magnetic Recording
Magnetic Nanowires
magnetic thin films
soft magnetic materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
9
0.692
* Total H Index Rankings
Ranking Based
On Selection :10
Semiconductor Packaging
Materials Science
Device Reliability
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
* Total H Index Rankings
Ranking Based
On Selection :11
Materials Science
Physical Metallurgy
Electron Microscopy
SRF
Synchrotron XRD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
* Total H Index Rankings
Ranking Based
On Selection :12
Materials Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Oleg Mryasov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
22
0.500
nano-technology
device and materials physics
spintronics
magnetism
Rajesh Vilas Chopdekar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
32
0.744
magnetic materials
complex oxides
Shaoping Li
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
18
0.439
Nonvolatile memory
magnetic materials
spintronics
ferroelectrics
magnetic recording
Wei Guo (郭炜）
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
30
0.882
Physical Metallurgy
Semiconductor
Atom Probe Tomography
Electron Microscopy
Thin Film
Alan Kalitsov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
Magnetism
Spintronics
Ferroelectric materials
Valerio Adinolfi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
19
1.000
NVMs
ALD
Perovskites
colloidal quantum dots
2D materials
John C. Read
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
12
0.667
Materials Physics
Thin Film Deposition
Materials Characterization
Device Materials
Changhe Shang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
7
0.412
Magnetic Recording
Magnetic Materials
Physics
Muhammad Asif Bashir
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
9
0.692
Magnetism
Magnetic Recording
Magnetic Nanowires
magnetic thin films
soft magnetic materials
Ashutosh Jain
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
6
0.600
Semiconductor Packaging
Materials Science
Device Reliability
Mingmin Wang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Materials Science
Physical Metallurgy
Electron Microscopy
SRF
Synchrotron XRD
Tomin Liu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000