Diamond Light Source Ltd is a prestigious company university established in 2001 in United Kingdom. It is represented by 144 scientists in the AD Scientific Index. The university’s scientists are particularly concentrated in Natural Sciences (37 scientists), Engineering & Technology (18 scientists), and Medical and Health Sciences (4 scientists).

* Total H Index Rankings
Ranking Based On Selection: 1
Mohsen Danaie
Materials science
Phase transformation
Materials for energy storage
Electron microscopy
Spectroscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
20
0.741
* Total H Index Rankings
Ranking Based On Selection: 2
Sarah J. Day
Materials Science
Laboratory Astrophysics
Energy Materials
Clathrate Hydrates Clathrates
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
22
0.917
* Total H Index Rankings
Ranking Based On Selection: 3
David G. Hopkinson
Electron Microscopy
2D Materials
Magnetism
4D-STEM
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
* Total H Index Rankings
Ranking Based On Selection: 4
Arindam Majhi
Material science
Nano-scaled layered structure material
thin film and multilayer x-ray optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
* Total H Index Rankings
Rankings
Ranking Based On Selection: 1
Mohsen Danaie
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
20
0.741
Materials science
Phase transformation
Materials for energy storage
Electron microscopy
Spectroscopy
* Total H Index Rankings
Rankings
Ranking Based On Selection: 2
Sarah J. Day
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
22
0.917
Materials Science
Laboratory Astrophysics
Energy Materials
Clathrate Hydrates Clathrates
* Total H Index Rankings
Rankings
Ranking Based On Selection: 3
David G. Hopkinson
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
* Total H Index Rankings
Rankings
Ranking Based On Selection: 4
Arindam Majhi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Material science
Nano-scaled layered structure material
thin film and multilayer x-ray optics