Universität Siegen is a
prestigious public university
established in 1972 in Germany. It is represented
by 341 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (75 scientists), Social Sciences and Humanities (58 scientists), and Natural Sciences (41 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 1
Luminescence Materials
LED Phosphors
Nanostructured Materials
thin Films
Bio-Imaging
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
19
0.576
* Total H Index Rankings
Ranking Based
On Selection: 2
material science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
27
0.871
* Total H Index Rankings
Ranking Based
On Selection: 3
Materials Science
Materials Characterization
Nanotechnology
Nanoanalytics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
24
0.774
* Total H Index Rankings
Ranking Based
On Selection: 4
Magnetron Sputtering
Thin-films
In-operando xrd
In-situ TEM
Energy Materials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
21
0.913
* Total H Index Rankings
Ranking Based
On Selection: 5
Materials Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
14
0.824
* Total H Index Rankings
Ranking Based
On Selection: 6
materials science
thin films
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
* Total H Index Rankings
Ranking Based
On Selection: 7
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
9
0.818
* Total H Index Rankings
Ranking Based
On Selection: 8
Material science
Nanomaterials
Electrochemistry
Energy conversion
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Claudia Wickleder
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
19
0.576
Luminescence Materials
LED Phosphors
Nanostructured Materials
thin Films
Bio-Imaging
Bronislava Gorr
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
27
0.871
Benjamin Butz
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
24
0.774
Materials Science
Materials Characterization
Nanotechnology
Nanoanalytics
Sina hejazi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
21
0.913
Magnetron Sputtering
Thin-films
In-operando xrd
In-situ TEM
Energy Materials
Lei Zhang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
14
0.824
Michael Vogel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
materials science
thin films
Axel von Hehl
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
9
0.818
Nastaran Farahbakhsh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Material science
Nanomaterials
Electrochemistry
Energy conversion