National Metrology Institute of South Africa is a prestigious institution university established in 2006 in South Africa. It is represented by 6 scientists in the AD Scientific Index. The university’s scientists are particularly concentrated in Engineering & Technology (2 scientists), Natural Sciences (2 scientists), and Medical and Health Sciences (0 scientists).

Total 1 scientist
* Total H Index Rankings
Ranking Based On Selection: 1
Clive Justin Oliphant
Nanoscience
Silicon
Thin Films
Optoelectronic devices
Metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
8
0.667
* Total H Index Rankings
Rankings
Ranking Based On Selection: 1
Clive Justin Oliphant
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
8
0.667
Nanoscience
Silicon
Thin Films
Optoelectronic devices
Metrology