Micron Technology Inc is a
prestigious company university
established in 1978 in United States. It is represented
by 148 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (46 scientists), Natural Sciences (7 scientists), and Architecture and Design (4 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 1
condensed matter physics
semiconductors
thin film
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
* Total H Index Rankings
Ranking Based
On Selection: 2
Perovskite Solar cells
Semiconductor Devices
Semiconductor Physics
Plasma Physics
Thin films
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
10
0.909
* Total H Index Rankings
Ranking Based
On Selection: 3
Plasma physics
Semiconductor manufacturing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
7
0.700
* Total H Index Rankings
Ranking Based
On Selection: 4
Plasma Physics
CVD Deposition
ALD Deposition
Patterning and Hard Masks
Material Properties
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
6
0.667
* Total H Index Rankings
Ranking Based
On Selection: 5
optics
optoelectronics
emerging memory
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
* Total H Index Rankings
Ranking Based
On Selection: 6
Plasma physics
Micro fluidics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
* Total H Index Rankings
Ranking Based
On Selection: 7
physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Pengyuan Zheng
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
condensed matter physics
semiconductors
thin film
Hisham A Abbas
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
10
0.909
Perovskite Solar cells
Semiconductor Devices
Semiconductor Physics
Plasma Physics
Thin films
Saurabh Keshav
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
7
0.700
Farrell M Good
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
6
0.667
Plasma Physics
CVD Deposition
ALD Deposition
Patterning and Hard Masks
Material Properties
Yixin Yan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Tom J John
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
Fan Ming
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800