i10 Productivity
Rankings
Aerospace Corporation Scientists i10 Productivity Rankings (Sort by last 6 years i10 Index) 2025
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Additionally, click to view the special rankings based on Productivity Rankings: Scientists Last 6 years' i10 Index", Universities Total i10 Index Rankings 2025, Universities Last 6 Years i10 Index Rankings 2025 "Art and Humanities i10 Productivity Rankings" and "Social Sciences and Humanities i10 Productivity Rankings".
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :1
atmospheric dynamics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
137
45
0.328
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :2
Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
81
27
0.333
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :3
Space Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
28
27
0.964
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :4
graphene
chemical vapor deposition
chemical sensors
polyaniline
nanofibers
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
55
22
0.400
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :5
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
22
0.579
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :6
Fluid mechanics
heat transfer
boiling
cryogenics
aerospace
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
22
22
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :7
Materials
Microscopy
Microanalysis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
61
21
0.344
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :8
Single Event Effects
Radiation Effects
Semiconductor Device and Materials Characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
39
21
0.538
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :9
Space Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
22
19
0.864
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :10
nondestructive evaluation
computed tomography
numerical methods
synthetic aperture radar
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
29
18
0.621
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :11
Optics
Lasers
Fibers
Nonlinear Optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
45
17
0.378
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :12
Additive Manufacturing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
17
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :13
Condensed Matter
Magnetism
Superconductivity
Surface Physics
Spin Transport
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
16
0.842
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :14
chemical propulsion
combustion
molecular spectroscopy
optical diagnostics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :15
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
106
14
0.132
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :16
Magnetospheric Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
42
14
0.333
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :17
Nanotechnology
Microelectronics
Optics
Materials Science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
13
0.542
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :18
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
12
0.387
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :19
Contamination Control Science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
12
0.750
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :20
Photonics
Microelectronics
Radiation Effects
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :21
Robust Control
Model Reduction
Spacecraft Control Dynamics and Attitude Determination
Airplane flight control
Observatory Sp
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
49
11
0.224
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :22
Remote Sensing
CubeSats
Weather
Nighttime Lights
Sensor Design
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
11
0.458
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :23
carbon nanotubes
nanocomposites
space materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
23
11
0.478
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :24
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :25
semiconductors
solid state physics
materials science
nanoelectronics
microelectromechanical devices
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
27
10
0.370
Richard Walterscheid
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
137
45
0.328
JC Camparo
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
81
27
0.333
Alexander Boyd
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
28
27
0.964
Bruce Weiller
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
55
22
0.400
graphene
chemical vapor deposition
chemical sensors
polyaniline
nanofibers
Robert H Nelson
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
22
0.579
Samuel Darr
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
22
22
1.000
Fluid mechanics
heat transfer
boiling
cryogenics
aerospace
Brendan Foran
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
61
21
0.344
Materials
Microscopy
Microanalysis
Steve Lalumondiere
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
39
21
0.538
Single Event Effects
Radiation Effects
Semiconductor Device and Materials Characterization
Christine Gabrielse
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
22
19
0.864
Joseph T Case|Toby Case
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
29
18
0.621
nondestructive evaluation
computed tomography
numerical methods
synthetic aperture radar
Paul Steinvurzel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
45
17
0.378
Tait Mclouth
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
17
1.000
Additive Manufacturing
Carl Thomas Boone
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
16
0.842
Condensed Matter
Magnetism
Superconductivity
Surface Physics
Spin Transport
Fabio A Bendana
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
chemical propulsion
combustion
molecular spectroscopy
optical diagnostics
Joel Schulman
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
106
14
0.132
Margaret W Chen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
42
14
0.333
Magnetospheric Physics
Adam Bushmaker
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
13
0.542
Nanotechnology
Microelectronics
Optics
Materials Science
Rob Sherwood
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
12
0.387
Jesse David Fowler
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
12
0.750
Contamination Control Science
George Tzintzarov
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Photonics
Microelectronics
Radiation Effects
Richard Y Chiang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
49
11
0.224
Robust Control
Model Reduction
Spacecraft Control Dynamics and Attitude Determination
Airplane flight control
Observatory Sp
Dee W Pack
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
11
0.458
Remote Sensing
CubeSats
Weather
Nighttime Lights
Sensor Design
Alan R Hopkins
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
23
11
0.478
carbon nanotubes
nanocomposites
space materials
Zachary R Lingley
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
11
0.733
Jon V Osborn
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
27
10
0.370
semiconductors
solid state physics
materials science
nanoelectronics
microelectromechanical devices