i10 Productivity
Rankings
Intel Corporation/ ScientistsEngineering & Technology / Metallurgical & Materials Engineering i10 Productivity Rankings 2025
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Additionally, click to view the special rankings based on Productivity Rankings: Scientists Last 6 years' i10 Index", Universities Total i10 Index Rankings 2025, Universities Last 6 Years i10 Index Rankings 2025 "Art and Humanities i10 Productivity Rankings" and "Social Sciences and Humanities i10 Productivity Rankings".
* Total i10 IndexRankings
Ranking Based On Selection :1
Materials Science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
133
74
0.556
* Total i10 IndexRankings
Ranking Based On Selection :2
materials
semiconductor
lithography
masks
EUV
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
52
7
0.135
* Total i10 IndexRankings
Ranking Based On Selection :3
Quantum Computing
Graphene
2D materials
Beyond CMOS
Materials Science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
40
30
0.750
* Total i10 IndexRankings
Ranking Based On Selection :4
Thin Films
Vacum Technology
Materials Characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
19
0.613
* Total i10 IndexRankings
Ranking Based On Selection :5
Spintronics
2D materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
28
26
0.929
* Total i10 IndexRankings
Ranking Based On Selection :6
Materials Engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
28
24
0.857
* Total i10 IndexRankings
Ranking Based On Selection :7
Semiconductor
Thin Film
Interconnects
Sensors
New Materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
27
15
0.556
* Total i10 IndexRankings
Ranking Based On Selection :8
Laser Materials Processing
Surface modification and Engineering
Semiconductor manufacturing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
26
13
0.500
* Total i10 IndexRankings
Ranking Based On Selection :9
Materials Science
Semiconductors
2D materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
21
1.000
* Total i10 IndexRankings
Ranking Based On Selection :10
lead-free solder
electronic packaging
reliability
materials science
microscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
11
0.524
* Total i10 IndexRankings
Ranking Based On Selection :11
Semiconductor Packaging
Dielectric Materials
Photoresist
Porous Materials
Crystal Engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
20
1.000
* Total i10 IndexRankings
Ranking Based On Selection :12
Materials Science & Engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
12
0.632
* Total i10 IndexRankings
Ranking Based On Selection :13
Semiconductor manufacturing processes
materials science and reliability
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
11
0.579
* Total i10 IndexRankings
Ranking Based On Selection :14
Thin Film Metallurgy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
11
0.611
* Total i10 IndexRankings
Ranking Based On Selection :15
Materials Characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
6
0.333
* Total i10 IndexRankings
Ranking Based On Selection :16
2D Materials
Graphene
Graphene Oxide
Graphene Nanoribbons
Chemical Vapor Deposition
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
17
1.000
* Total i10 IndexRankings
Ranking Based On Selection :17
Materials Science and Engineering
Thin Films
Electrochemistry
Corrosion
Carbon Nanotubes
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
17
1.000
* Total i10 IndexRankings
Ranking Based On Selection :18
Semiconductor device physics
2D-materials
Carbon Nanotubes
Gate Oxide
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
* Total i10 IndexRankings
Ranking Based On Selection :19
Plasma surface interactions
materials science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
* Total i10 IndexRankings
Ranking Based On Selection :20
Semiconductor manufacturing
packaging
materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
* Total i10 IndexRankings
Ranking Based On Selection :21
Semiconductor metrology
Nanoscale materials characterization
Scanning Probe Microscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
7
0.438
* Total i10 IndexRankings
Ranking Based On Selection :22
Metal Organic Composites
Polymers
Porous Materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
* Total i10 IndexRankings
Ranking Based On Selection :23
Computational Materials Science
Semiconductors
High Performance Computing
Scientific Software Design
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
* Total i10 IndexRankings
Ranking Based On Selection :24
Semiconductor Devices
Failure Analysis
Wide Bandgap Materials
Power Electronics
Dielectric Interface Characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
* Total i10 IndexRankings
Ranking Based On Selection :25
Nano-electronics
Memristor
2D materials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
Sean King
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
133
74
0.556
Ted Liang
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
52
7
0.135
materials
semiconductor
lithography
masks
EUV
Roman Caudillo
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
40
30
0.750
Quantum Computing
Graphene
2D materials
Beyond CMOS
Materials Science
Shafiul Chowdhury
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
19
0.613
Thin Films
Vacum Technology
Materials Characterization
Chia-Ching Lin
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
28
26
0.929
Spintronics
2D materials
Sandeep Manandhar
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
28
24
0.857
Shaestagir Chowdhury
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
27
15
0.556
Semiconductor
Thin Film
Interconnects
Sensors
New Materials
Sameer R Paital
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
26
13
0.500
Laser Materials Processing
Surface modification and Engineering
Semiconductor manufacturing
Shruti Subramanian
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
21
1.000
Materials Science
Semiconductors
2D materials
Bite Zhou
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
11
0.524
lead-free solder
electronic packaging
reliability
materials science
microscopy
Bohan Shan
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
20
1.000
Semiconductor Packaging
Dielectric Materials
Photoresist
Porous Materials
Crystal Engineering
Anbusathaiah Varatharajan
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
12
0.632
Materials Science & Engineering
Han Li
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
11
0.579
Semiconductor manufacturing processes
materials science and reliability
Dan Bergstrom
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
11
0.611
Youren Xu
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
6
0.333
Materials Characterization
Vivek Saraswat
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
17
1.000
2D Materials
Graphene
Graphene Oxide
Graphene Nanoribbons
Chemical Vapor Deposition
Farhad Daneshvar
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
17
1.000
Materials Science and Engineering
Thin Films
Electrochemistry
Corrosion
Carbon Nanotubes
Ashish Verma Penumatcha
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
Semiconductor device physics
2D-materials
Carbon Nanotubes
Gate Oxide
Felipe Bedoya
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
14
0.875
Plasma surface interactions
materials science
Taner Aytun
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
Semiconductor manufacturing
packaging
materials
Jay Mody
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
7
0.438
Semiconductor metrology
Nanoscale materials characterization
Scanning Probe Microscopy
Yang Jiao
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
Metal Organic Composites
Polymers
Porous Materials
Krishnendu Ghosh
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
Computational Materials Science
Semiconductors
High Performance Computing
Scientific Software Design
Ramya Yeluri
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
10
0.667
Semiconductor Devices
Failure Analysis
Wide Bandgap Materials
Power Electronics
Dielectric Interface Characterization
Durjoy Dev
Intel Corporation
Kaliforniya, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
Nano-electronics
Memristor
2D materials