Total 2,424,675 scientists, country 221, and institutions 24,468 are evaluated in the Productivity Rankings, an exclusive service provided by AD Scientific Index. This ranking measures and highlights the scientific productivity of researchers based on the i10 index (number of publications with at least 10 citations). This system identifies highly productive scientists across disciplines, institutions, and regions, contributing to the development of evidence-based academic policies and effective incentive mechanisms. The rankings include global, regional, and institutional analyses, along with specialized rankings such as Scientists' Last 6 Years' i10 Index and Universities' i10 Index Rankings 2025. With Premium Membership, you can:
- Gain full access to detailed comparisons and advanced analytics,
- Objectively evaluate your academic productivity,
- Make strategic, data-driven decisions to enhance performance.
* Total i10 IndexRankings
Ranking Based On Selection: 1
![Karen Collins](/user/assets/images/profile/no-profile-photo.png)
Exoplanets
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
233
227
0.974
* Total i10 IndexRankings
Ranking Based On Selection: 2
![Benne Holwerda](https://cdn.adscientificindex.com/pictures/a1/1298151.jpg)
Astronomy
Astrophysics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
232
195
0.841
* Total i10 IndexRankings
Ranking Based On Selection: 3
![Jacek Jasinski](https://cdn.adscientificindex.com/pictures/09/1302192.jpg)
energy materials
nanoscale materials
materials characterization
electron microscopy
solid state physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
197
133
0.675
* Total i10 IndexRankings
Ranking Based On Selection: 4
![Gamini Sumanasekera](/user/assets/images/profile/no-profile-photo.png)
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
57
0.514
* Total i10 IndexRankings
Ranking Based On Selection: 5
![Sergio B Mendes](https://cdn.adscientificindex.com/pictures/d8/1293750.jpg)
Optics
Photonics
Integrated Optics
Thin-Films
Biosensors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
48
7
0.146
* Total i10 IndexRankings
Ranking Based On Selection: 6
![Timothy E Dowling](https://cdn.adscientificindex.com/pictures/25/1295016.jpg)
Planetary Atmospheres
Atmospheric Dynamics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
28
0.609
* Total i10 IndexRankings
Ranking Based On Selection: 7
![Joanna Bridge](/user/assets/images/profile/no-profile-photo.png)
Astronomy
astrophysics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
19
0.792
* Total i10 IndexRankings
Ranking Based On Selection: 8
![Andriy Sherehiy](/user/assets/images/profile/no-profile-photo.png)
Microrobotics
Additive Manufacturing
Material Science
Experimental Condensed Matter Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
12
0.600
* Total i10 IndexRankings
Ranking Based On Selection: 9
![Lutz Haberzettl](/user/assets/images/profile/no-profile-photo.png)
Astronomy/Astrophysics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
* Total i10 IndexRankings
Ranking Based On Selection: 10
![Jennifer L Davison](https://cdn.adscientificindex.com/pictures/80/5696643.jpg)
Atmospheric Sciences
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
2
0.333
Enroll all your faculty members with discounted institutional membership to showcase your institution's academic strength to the world in the best way possible – join now and achieve results fast!
* Total i10 IndexRankings
Ranking Based On Selection: 11
![Shawn Knabel](/user/assets/images/profile/no-profile-photo.png)
Extragalactic astronomy
observational cosmology
gravitational lensing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection: 12
![Bimal Nepal](https://cdn.adscientificindex.com/pictures/40/5388659.jpg)
photonics
material science
optics
thin films
semiconductor characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Karen Collins
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
233
227
0.974
Benne Holwerda
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
232
195
0.841
Jacek Jasinski
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
197
133
0.675
energy materials
nanoscale materials
materials characterization
electron microscopy
solid state physics
Gamini Sumanasekera
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
57
0.514
Sergio B Mendes
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
48
7
0.146
Optics
Photonics
Integrated Optics
Thin-Films
Biosensors
Timothy E Dowling
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
28
0.609
Joanna Bridge
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
19
0.792
Andriy Sherehiy
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
12
0.600
Microrobotics
Additive Manufacturing
Material Science
Experimental Condensed Matter Physics
Lutz Haberzettl
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
Jennifer L Davison
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
2
0.333
Enroll all your faculty members with discounted institutional membership to showcase your institution's academic strength to the world in the best way possible – join now and achieve results fast!
Shawn Knabel
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Extragalactic astronomy
observational cosmology
gravitational lensing
Bimal Nepal
University of Louisville
Louisville, United States
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
photonics
material science
optics
thin films
semiconductor characterization