Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Additionally, click to view the special rankings based on Productivity Rankings: last 6 years' i10 index", Universities Rankings 2024 (Sort by : Total i10 Index), Universities Rankings 2024 (Sort by : Last 6 Years i10 Index) "Art and Humanities Rankings" and "Social Sciences and Humanities Rankings".
* Total i10 IndexRankings
Ranking Based On Selection :1
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
142
73
0.514
* Total i10 IndexRankings
Ranking Based On Selection :2
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
43
0.387
* Total i10 IndexRankings
Ranking Based On Selection :3
Emerging memories expert
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
109
57
0.523
* Total i10 IndexRankings
Ranking Based On Selection :4
Modeling and Simulation of Semiconductor devices
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
70
19
0.271
* Total i10 IndexRankings
Ranking Based On Selection :5
Semiconductor memory
DRAM
memory interface
I/O
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
62
8
0.129
* Total i10 IndexRankings
Ranking Based On Selection :6
Emerging memory devices
artificial neural networks
hardware security
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
50
44
0.880
* Total i10 IndexRankings
Ranking Based On Selection :7
Electron microscopy
Memories
Ferroelectrics
Li-ion Batteries
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
44
0.957
* Total i10 IndexRankings
Ranking Based On Selection :8
semiconductor device
microstructure characterization
failure analysis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
44
27
0.614
* Total i10 IndexRankings
Ranking Based On Selection :9
semiconductor
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
43
15
0.349
* Total i10 IndexRankings
Ranking Based On Selection :10
Dielectric Thin Film
Flash Memory
3D NAND
ALD
Charge Trap Flash
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
41
16
0.390
* Total i10 IndexRankings
Ranking Based On Selection :11
NAND
III-V MOSFETs
CMOS
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
37
11
0.297
* Total i10 IndexRankings
Ranking Based On Selection :12
Channel coding
LDPC code design
LDPC decoder design
signal processing
information theory
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
35
22
0.629
* Total i10 IndexRankings
Ranking Based On Selection :13
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
19
0.576
* Total i10 IndexRankings
Ranking Based On Selection :14
Semiconductor Device/Process physics modeling and simulation
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
32
27
0.844
* Total i10 IndexRankings
Ranking Based On Selection :15
System Design
Information Theory
Communication Theory
Error Correction Coding
Digital Signal Processing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
27
14
0.519
* Total i10 IndexRankings
Ranking Based On Selection :16
Micro Electronic
Reliability
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
25
17
0.680
* Total i10 IndexRankings
Ranking Based On Selection :17
Dry Etch
FEOL
MOL
Material science
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
15
0.714
* Total i10 IndexRankings
Ranking Based On Selection :18
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
8
0.381
* Total i10 IndexRankings
Ranking Based On Selection :19
NAND
GaN
radiation
reliability
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
* Total i10 IndexRankings
Ranking Based On Selection :20
Memory technology
magnetic structures
correlated systems and novel electronic magneto-devices
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
14
0.737
* Total i10 IndexRankings
Ranking Based On Selection :21
Advanced Packaging RnD
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
9
0.500
* Total i10 IndexRankings
Ranking Based On Selection :22
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
8
0.444
* Total i10 IndexRankings
Ranking Based On Selection :23
Semiconductor memories
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
8
0.471
* Total i10 IndexRankings
Ranking Based On Selection :24
Information Theory
Coding Theory
Data Storage
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
6
0.353
* Total i10 IndexRankings
Ranking Based On Selection :25
Electrodeposition
Electrocatalysis
TSV
Advanced Packaging
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
6
0.353
Fabio Pellizzer
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
142
73
0.514
Adam Saxler
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
43
0.387
Agostino Pirovano
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
109
57
0.523
Andrea Ghetti
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
70
19
0.271
Feng Lin
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
62
8
0.129
Hao Jiang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
50
44
0.880
Emerging memory devices
artificial neural networks
hardware security
Linze Li
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
44
0.957
Ying Li
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
44
27
0.614
semiconductor device
microstructure characterization
failure analysis
Chinhui Chong
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
43
15
0.349
Jun-Kyu Yang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
41
16
0.390
Dielectric Thin Film
Flash Memory
3D NAND
ALD
Charge Trap Flash
Richard Hill
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
37
11
0.297
Sundararajan Sankaranarayanan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
35
22
0.629
Channel coding
LDPC code design
LDPC decoder design
signal processing
information theory
Manzar Siddik
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
19
0.576
Kamal Karda
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
32
27
0.844
Mustafa N Kaynak
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
27
14
0.519
System Design
Information Theory
Communication Theory
Error Correction Coding
Digital Signal Processing
Alexandre Subirats
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
25
17
0.680
Shravana Katakam
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
15
0.714
Toshihiko Miyashita
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
8
0.381
Chen Jin
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
Jie Li
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
14
0.737
Memory technology
magnetic structures
correlated systems and novel electronic magneto-devices
Wei Zhou
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
9
0.500
Dalson Ye Seng Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
8
0.444
Giovanni Maria Paolucci
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
8
0.471
Eyal En Gad
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
6
0.353
Matthew Thorum
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
6
0.353