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Ravi Todi
GlobalFoundries - New York / United States
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AD Scientific Index ID: 5050634
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Ravi Todi's MOST POPULAR ARTICLES
1-)
Comparison of the agglomeration behavior of thin metallic films on SiO2 PR Gadkari, AP Warren, RM Todi, RV Petrova, KR Coffey Journal of Vacuum Science & Technology A 23 (4), 1152-1161, 2005 1812005
2-)
14-nm FinFET technology for analog and RF applications J Singh, J Ciavatti, K Sundaram, JS Wong, A Bandyopadhyay, X Zhang, ... IEEE Transactions on electron devices 65 (1), 31-37, 2017 1122017
3-)
Luminescence-center-mediated excitation as the dominant Er sensitization mechanism in Er-doped silicon-rich Si O 2 films O Savchyn, FR Ruhge, PG Kik, RM Todi, KR Coffey, H Nukala, H Heinrich Physical Review B 76 (19), 195419, 2007 872007
4-)
Investigations on hardness of rf sputter deposited SiCN thin filmsKB Sundaram, Z Alizadeh, RM Todi, VH DesaiMaterials Science and Engineering: A 368 (1-2), 103-108, 2004652004
5-)
Scaling deep trench based eDRAM on SOI to 32nm and BeyondG Wang, D Anand, N Butt, A Cestero, M Chudzik, J Ervin, S Fang, ...2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009642009
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