The AD Scientific Index (Alper-Doger Scientific Index) provides the most comprehensive analysis across 13 main fields and 197 sub-branches at global, national, and regional levels. These analyses are based on indicators such as the H-index, i10-index, and citation count, including their values from the last 6 years. As of Jan 30, 2025, the rankings are determined according to the Total H Index. BETA VERSION: The subject field rankings for the world, regions, countries, and universities are currently in their Beta phase. This is due to the exclusion of (873.690) scientists categorized under ‘Others’, whose profiles have yet to be determined, edited, or classified. As updates are made to these fields, the rankings will be adjusted accordingly. Note: Please keep this in mind while reviewing the rankings. For further details, explore our [University Subject Rankings].
* Total H IndexRankings
Ranking Based On Selection: 101
Quantum Computing
Quantum Chemistry
Quantum Simulation
Computational Materials Science
Metrics
H-Index
i10 Index
Citation Counts
6
6
147
* Total H IndexRankings
Ranking Based On Selection: 102
Thermoelectricity
EMI Filtering
COMSOL
MXenes
Metrics
H-Index
i10 Index
Citation Counts
6
5
126
* Total H IndexRankings
Ranking Based On Selection: 103
materials science
environmental science
Metrics
H-Index
i10 Index
Citation Counts
6
6
283
* Total H IndexRankings
Ranking Based On Selection: 104
material science
biopolymer
skin adhesives
eutectogel
wearable technology
Metrics
H-Index
i10 Index
Citation Counts
6
3
75
* Total H IndexRankings
Ranking Based On Selection: 105
materials science
additive manufacturing
aerodynamics
Metrics
H-Index
i10 Index
Citation Counts
5
2
49
* Total H IndexRankings
Ranking Based On Selection: 106
Solid State Chemistry
Chemical Crystallography
Material Science
Metrics
H-Index
i10 Index
Citation Counts
5
3
84
* Total H IndexRankings
Ranking Based On Selection: 107
Nanotechnology
Materials Science
Semiconductors
thin films and device growth/characterization
Metrics
H-Index
i10 Index
Citation Counts
4
3
57
* Total H IndexRankings
Ranking Based On Selection: 108
Material Science and Enginering
Metrics
H-Index
i10 Index
Citation Counts
2
0
9
* Total H IndexRankings
Ranking Based On Selection: 109
Applied Physics
Material Science
Metrics
H-Index
i10 Index
Citation Counts
1
1
18
* Total H IndexRankings
Ranking Based On Selection: 110
Material
DFT
Optoelectronics
Semiconductor
Atomic Scale Modeling
Metrics
H-Index
i10 Index
Citation Counts
1
1
17
* Total H IndexRankings
Ranking Based On Selection: 111
SRAM
Bioinstrumentation
LNA
FPGA
Metrics
H-Index
i10 Index
Citation Counts
1
1
15
Yu-Cheng Chen
City University of Hong Kong
Kowloon, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
6
6
147
Quantum Computing
Quantum Chemistry
Quantum Simulation
Computational Materials Science
Vaskuri Cstheja
City University of Hong Kong
Kowloon, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
6
5
126
Thermoelectricity
EMI Filtering
COMSOL
MXenes
Peng Liu
City University of Hong Kong
Kowloon, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
6
6
283
materials science
environmental science
Asmita Veronica
Metrics
H-Index
i10-Index
Citation Counts
6
3
75
material science
biopolymer
skin adhesives
eutectogel
wearable technology
Yuteng Gui
Metrics
H-Index
i10-Index
Citation Counts
5
2
49
materials science
additive manufacturing
aerodynamics
Lawrence Wy Wong
Metrics
H-Index
i10-Index
Citation Counts
5
3
84
Solid State Chemistry
Chemical Crystallography
Material Science
Chioma Vivian Ezeh
City University of Hong Kong
Kowloon, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
4
3
57
Nanotechnology
Materials Science
Semiconductors
thin films and device growth/characterization
Mengwan Li
City University of Hong Kong
Kowloon, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
2
0
9
Material Science and Enginering
Wong Sum Ming
Metrics
H-Index
i10-Index
Citation Counts
1
1
18
Applied Physics
Material Science
Yongnan Li|Yongnan Li
University of Hong Kong
Pokfulam, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
1
1
17
Material
DFT
Optoelectronics
Semiconductor
Atomic Scale Modeling
Emad Mojaveri Moslem
City University of Hong Kong
Kowloon, Hong Kong
Metrics
H-Index
i10-Index
Citation Counts
1
1
15
SRAM
Bioinstrumentation
LNA
FPGA