AD Scientific Index (Alper-Doger Scientific Index) offers the broadest spectrum of branches, providing analysis in 13 main fields and 197 sub-branches at global, national, and regional levels. These analyses can be based on indicators such as the H-index, i10-index, and citation count, as well as their values from the last 6 years. As of Dec 18, 2024, rankings are according to the Total H Index. BETA VERSION: The subject field rankings for the world, regions, countries, and universities are currently in beta. This is due to the exclusion of (873.898) scientists categorized under 'others,' whose profiles cannot yet be determined, edited, or classified. As these fields are updated, the rankings will adjust accordingly. Please keep this in mind. See Also: [University Subject Rankings]
* Total H IndexRankings
Ranking Based On Selection: 1
Nano-fabrication
material science
device physics
Metrics
H-Index
i10 Index
Citation Counts
86
262
26,792
* Total H IndexRankings
Ranking Based On Selection: 2
Materials Science
Metrics
H-Index
i10 Index
Citation Counts
80
261
29,052
* Total H IndexRankings
Ranking Based On Selection: 3
materials science
electronic materials
ion beam analysis
Metrics
H-Index
i10 Index
Citation Counts
68
174
16,889
* Total H IndexRankings
Ranking Based On Selection: 4
Semiconductor Technology
Photovoltaics
LEDs
Analog Compute Materials & Devices
Lithium Ion Battery
Metrics
H-Index
i10 Index
Citation Counts
65
370
21,057
* Total H IndexRankings
Ranking Based On Selection: 5
Hybrid Polymeric Materials
Metrics
H-Index
i10 Index
Citation Counts
57
157
11,816
* Total H IndexRankings
Ranking Based On Selection: 6
Materials Science
TEM Characterization
Process Development
Metrics
H-Index
i10 Index
Citation Counts
53
125
10,166
* Total H IndexRankings
Ranking Based On Selection: 7
AI hardware
phase change materials
Metrics
H-Index
i10 Index
Citation Counts
48
156
8,044
* Total H IndexRankings
Ranking Based On Selection: 8
soft error rates
semiconductor technology
materials science and engineering
Metrics
H-Index
i10 Index
Citation Counts
47
167
8,709
* Total H IndexRankings
Ranking Based On Selection: 9
synchrotron x-ray diffraction of microelectronics materials
Metrics
H-Index
i10 Index
Citation Counts
45
118
6,532
* Total H IndexRankings
Ranking Based On Selection: 10
Materials Characterization
Secondary Ion Mass Spectrometry
Metrics
H-Index
i10 Index
Citation Counts
45
89
8,101
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* Total H IndexRankings
Ranking Based On Selection: 11
materials science
surface science
low energy electron microscopy
carbon nanotubes
Metrics
H-Index
i10 Index
Citation Counts
44
94
9,860
* Total H IndexRankings
Ranking Based On Selection: 12
Accelerated materials discovery
next-generation computing
materials and devices for AI
solar energy
materials science
Metrics
H-Index
i10 Index
Citation Counts
39
57
17,477
* Total H IndexRankings
Ranking Based On Selection: 13
materials science
nanotechnology
artificial intelligence
semiconductors
space sciences
Metrics
H-Index
i10 Index
Citation Counts
37
96
5,968
* Total H IndexRankings
Ranking Based On Selection: 14
Quantum computing (semiconductor & superconductor platforms)
Systems Research
Materials & Device Physics
Epitaxy
SiGe(C)
Metrics
H-Index
i10 Index
Citation Counts
34
77
3,646
* Total H IndexRankings
Ranking Based On Selection: 15
Materials Science
Metrics
H-Index
i10 Index
Citation Counts
33
96
4,210
* Total H IndexRankings
Ranking Based On Selection: 16
Materials Science
Nanotechnology
AI
Quantum
Metrics
H-Index
i10 Index
Citation Counts
30
58
3,226
* Total H IndexRankings
Ranking Based On Selection: 17
electrochemistry
materials science
electrodeposition
Metrics
H-Index
i10 Index
Citation Counts
27
56
3,105
* Total H IndexRankings
Ranking Based On Selection: 18
Semiconductor Materials and Devices
CMOS
Metrics
H-Index
i10 Index
Citation Counts
25
68
2,502
* Total H IndexRankings
Ranking Based On Selection: 19
accelerated materials discovery
Metrics
H-Index
i10 Index
Citation Counts
25
33
2,883
* Total H IndexRankings
Ranking Based On Selection: 20
Integrated Circuits Materials and Physics
Metrics
H-Index
i10 Index
Citation Counts
25
64
4,216
* Total H IndexRankings
Ranking Based On Selection: 21
III-V Material
MOCVD
Phase Change Materials
Metrics
H-Index
i10 Index
Citation Counts
20
44
2,279
* Total H IndexRankings
Ranking Based On Selection: 22
Hardware for AI
Graphene
2D materials
Sensors
Metrics
H-Index
i10 Index
Citation Counts
19
23
1,496
* Total H IndexRankings
Ranking Based On Selection: 23
TCAD
device physics
computational materials
device simulation
nanotechology
Metrics
H-Index
i10 Index
Citation Counts
18
36
2,477
* Total H IndexRankings
Ranking Based On Selection: 24
post-Cu interconnects
topological materials
non-volatile memories
AI hardware architecture
Metrics
H-Index
i10 Index
Citation Counts
18
25
1,680
* Total H IndexRankings
Ranking Based On Selection: 25
Material Science
Semiconductor Device
Metrics
H-Index
i10 Index
Citation Counts
17
27
1,481
Charles T Rettner
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
86
262
26,792
Nano-fabrication
material science
device physics
Alfred Grill
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
80
261
29,052
Matt Copel
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
68
174
16,889
materials science
electronic materials
ion beam analysis
Devendra Sadana
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
65
370
21,057
Semiconductor Technology
Photovoltaics
LEDs
Analog Compute Materials & Devices
Lithium Ion Battery
Willi Volksen
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
57
157
11,816
Hybrid Polymeric Materials
John A Ott
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
53
125
10,166
Materials Science
TEM Characterization
Process Development
Guy Cohen
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
48
156
8,044
AI hardware
phase change materials
Kenneth P Rodbell
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
47
167
8,709
soft error rates
semiconductor technology
materials science and engineering
Jean Jordan-Sweet
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
45
118
6,532
synchrotron x-ray diffraction of microelectronics materials
Vaughn R Deline
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
45
89
8,101
Materials Characterization
Secondary Ion Mass Spectrometry
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James B Hannon
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
44
94
9,860
materials science
surface science
low energy electron microscopy
carbon nanotubes
Teodor Todorov
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
39
57
17,477
Accelerated materials discovery
next-generation computing
materials and devices for AI
solar energy
materials science
Satyanarayana V Nitta
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
37
96
5,968
materials science
nanotechnology
artificial intelligence
semiconductors
space sciences
Malcolm Carroll
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
34
77
3,646
Quantum computing (semiconductor & superconductor platforms)
Systems Research
Materials & Device Physics
Epitaxy
SiGe(C)
Robert L Bruce
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
33
96
4,210
Chandrasekhar Narayan|C Narayan, Spike Narayan
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
30
58
3,226
Materials Science
Nanotechnology
AI
Quantum
James Kelly
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
27
56
3,105
electrochemistry
materials science
electrodeposition
Chen Zhang
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
25
68
2,502
Semiconductor Materials and Devices
CMOS
Kristin Schmidt
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
25
33
2,883
accelerated materials discovery
Naftali E Lustig
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
25
64
4,216
Integrated Circuits Materials and Physics
Cheng-Wei Cheng(鄭政瑋)
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
20
44
2,279
III-V Material
MOCVD
Phase Change Materials
Charles Mackin
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
19
23
1,496
Hardware for AI
Graphene
2D materials
Sensors
Robert R Robison
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
18
36
2,477
TCAD
device physics
computational materials
device simulation
nanotechology
Ching-Tzu Chen
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
18
25
1,680
post-Cu interconnects
topological materials
non-volatile memories
AI hardware architecture
Nicolas Breil
IBM Corporation
New York, United States
Metrics
H-Index
i10-Index
Citation Counts
17
27
1,481
Material Science
Semiconductor Device