AD Scientific Index (Alper-Doger Scientific Index) offers the broadest spectrum of branches, providing analysis in 13 main fields and 197 sub-branches at global, national, and regional levels. These analyses can be based on indicators such as the H-index, i10-index, and citation count, as well as their values from the last 6 years. As of Sep 27, 2024, rankings are according to the Total H Index. BETA VERSION: The subject field rankings for the world, regions, countries, and universities are currently in beta. This is due to the exclusion of (1.014.157) scientists categorized under 'others,' whose profiles cannot yet be determined, edited, or classified. As these fields are updated, the rankings will adjust accordingly. Please keep this in mind. See Also: [University Subject Rankings]
* Total H IndexRankings
Ranking Based On Selection
:1
nanoconfinement
glass transition
molecular dynamics
dielctric spectroscopy
Metrics
H-Index
i10 Index
Citation Counts
26
68
1,798
* Total H IndexRankings
Ranking Based On Selection
:2
Thin film technology
Condensed Matter Physics
Nanotechnology
X-ray photoemission spectroscopy
Mass spectrometry
Metrics
H-Index
i10 Index
Citation Counts
19
34
1,085
* Total H IndexRankings
Ranking Based On Selection
:3
nanotechnology
scanning probe microscopy
AFM
thin films
nanomaterials
Metrics
H-Index
i10 Index
Citation Counts
13
22
630
Magdalena Tarnacka
University of Silesia in Katowice
Katowice, Poland
Metrics
H-Index
i10-Index
Citation Counts
26
68
1,798
nanoconfinement
glass transition
molecular dynamics
dielctric spectroscopy
Katarzyna Balin
University of Silesia in Katowice
Katowice, Poland
Metrics
H-Index
i10-Index
Citation Counts
19
34
1,085
Thin film technology
Condensed Matter Physics
Nanotechnology
X-ray photoemission spectroscopy
Mass spectrometry
Marcin Wojtyniak
University of Silesia in Katowice
Katowice, Poland
Metrics
H-Index
i10-Index
Citation Counts
13
22
630
nanotechnology
scanning probe microscopy
AFM
thin films
nanomaterials