AD Scientific Index (Alper-Doger Scientific Index) offers the broadest spectrum of branches, providing analysis in 13 main fields and 197 sub-branches at global, national, and regional levels. These analyses can be based on indicators such as the H-index, i10-index, and citation count, as well as their values from the last 6 years. As of Oct 07, 2024, rankings are according to the Total H Index. BETA VERSION: The subject field rankings for the world, regions, countries, and universities are currently in beta. This is due to the exclusion of (1.014.167) scientists categorized under 'others,' whose profiles cannot yet be determined, edited, or classified. As these fields are updated, the rankings will adjust accordingly. Please keep this in mind. See Also: [University Subject Rankings]
* Total H IndexRankings
Ranking Based On Selection
:1
Metrics
H-Index
i10 Index
Citation Counts
40
101
5,878
* Total H IndexRankings
Ranking Based On Selection
:2
Microlithography for integrated circuit production
Metrics
H-Index
i10 Index
Citation Counts
39
111
5,744
* Total H IndexRankings
Ranking Based On Selection
:3
EUV
Metrics
H-Index
i10 Index
Citation Counts
37
154
6,134
* Total H IndexRankings
Ranking Based On Selection
:4
Metrics
H-Index
i10 Index
Citation Counts
32
67
6,072
* Total H IndexRankings
Ranking Based On Selection
:5
Correlated electron systems
Lithography
Metrics
H-Index
i10 Index
Citation Counts
30
44
5,285
* Total H IndexRankings
Ranking Based On Selection
:6
lithography
Metrics
H-Index
i10 Index
Citation Counts
30
84
3,084
* Total H IndexRankings
Ranking Based On Selection
:7
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
Metrics
H-Index
i10 Index
Citation Counts
29
31
4,293
* Total H IndexRankings
Ranking Based On Selection
:8
photolithography
simulation
photoresist
Metrics
H-Index
i10 Index
Citation Counts
29
70
3,590
* Total H IndexRankings
Ranking Based On Selection
:9
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
Metrics
H-Index
i10 Index
Citation Counts
25
60
1,995
* Total H IndexRankings
Ranking Based On Selection
:10
comsol
matlab
simulink
modeling
simulation
Metrics
H-Index
i10 Index
Citation Counts
24
48
2,555
* Total H IndexRankings
Ranking Based On Selection
:11
Optische lithografie
warmte en stroming
Metrics
H-Index
i10 Index
Citation Counts
24
38
2,076
* Total H IndexRankings
Ranking Based On Selection
:12
EUV
Lithography
Plasma
Metrics
H-Index
i10 Index
Citation Counts
23
45
2,514
* Total H IndexRankings
Ranking Based On Selection
:13
Metrics
H-Index
i10 Index
Citation Counts
23
31
2,373
* Total H IndexRankings
Ranking Based On Selection
:14
Thin films
MEMS
Metrics
H-Index
i10 Index
Citation Counts
21
29
1,989
* Total H IndexRankings
Ranking Based On Selection
:15
EUV Lithography
laser produced plasma
Metrics
H-Index
i10 Index
Citation Counts
21
31
1,797
* Total H IndexRankings
Ranking Based On Selection
:16
Metrics
H-Index
i10 Index
Citation Counts
21
28
4,290
* Total H IndexRankings
Ranking Based On Selection
:17
Semiconductor lithography
metrology
and inspection
Metrics
H-Index
i10 Index
Citation Counts
21
35
2,010
* Total H IndexRankings
Ranking Based On Selection
:18
atomic spectroscopy
optical frequency standards
lithography
plasma physics
Metrics
H-Index
i10 Index
Citation Counts
20
38
2,006
* Total H IndexRankings
Ranking Based On Selection
:19
Metrics
H-Index
i10 Index
Citation Counts
19
26
2,543
* Total H IndexRankings
Ranking Based On Selection
:20
Metrics
H-Index
i10 Index
Citation Counts
19
24
1,633
* Total H IndexRankings
Ranking Based On Selection
:21
Metrics
H-Index
i10 Index
Citation Counts
19
22
1,070
* Total H IndexRankings
Ranking Based On Selection
:22
Metrics
H-Index
i10 Index
Citation Counts
19
29
1,416
* Total H IndexRankings
Ranking Based On Selection
:23
Metrics
H-Index
i10 Index
Citation Counts
17
23
1,927
* Total H IndexRankings
Ranking Based On Selection
:24
Optical Engineering
Metrics
H-Index
i10 Index
Citation Counts
17
24
1,373
* Total H IndexRankings
Ranking Based On Selection
:25
Lithography
3D integration
semiconductors
process
photovoltaics
Metrics
H-Index
i10 Index
Citation Counts
17
29
2,747
Timothy A. Brunner
Metrics
H-Index
i10-Index
Citation Counts
39
111
5,744
Farzad Fareed|Farzad Behafarid
Metrics
H-Index
i10-Index
Citation Counts
29
31
4,293
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
Awm (Jos) Van Schijndel
Metrics
H-Index
i10-Index
Citation Counts
24
48
2,555
Mark Van De Kerkhof|M van de Kerkhof, Marcus van de Kerkhof, Marcus Adrianus van de Kerkhof
Metrics
H-Index
i10-Index
Citation Counts
23
45
2,514
atomic spectroscopy
optical frequency standards
lithography
plasma physics
Ws Christian Roelofs
Metrics
H-Index
i10-Index
Citation Counts
19
26
2,543
Lithography
3D integration
semiconductors
process
photovoltaics