University, Subject, Country, Region, World

National Institute of Standards and Technology Scientists Others Rankings 2024

The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings and University Subject Rankings. Click here for individual or institutional registration.

Country

Total 284 scientist, 1 country, 1 institution

List without CERN, Statistical Data etc.

Sort by last 6 years H Index

Kimberly L Mueller

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 423

Country:

# 122,812

Region:

# 138,834

World:

# 423,628

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.667

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.750

Citation

Total:

1,294

Last 6 Year:

666

Last 6 Year/Total:

0.515

Michael A Lombardi

National Institute of Standards and Technology

United States

Others

calibrations

clocks

oscillators

frequency

time

H-Index Rankings

University / Institution:

# 426

Country:

# 122,992

Region:

# 139,031

World:

# 424,166

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.619

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.314

Citation

Total:

1,920

Last 6 Year:

596

Last 6 Year/Total:

0.310

Joy Dunkers

National Institute of Standards and Technology

United States

Others

optical imaging and spectroscopy

GUV

microbiology

H-Index Rankings

University / Institution:

# 429

Country:

# 123,500

Region:

# 139,609

World:

# 426,714

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.571

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.471

Citation

Total:

1,938

Last 6 Year:

515

Last 6 Year/Total:

0.266

Andrey Shkabko

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 430

Country:

# 123,711

Region:

# 139,844

World:

# 427,324

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.571

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.577

Citation

Total:

1,448

Last 6 Year:

528

Last 6 Year/Total:

0.365

Jason Averill

National Institute of Standards and Technology

United States

Others

disaster resilience

failure analysis

fire safety

H-Index Rankings

University / Institution:

# 431

Country:

# 123,802

Region:

# 139,948

World:

# 427,756

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.524

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.359

Citation

Total:

1,505

Last 6 Year:

490

Last 6 Year/Total:

0.326

Robert F Berg

National Institute of Standards and Technology

United States

Others

radiometry

humidity

gas flow

ultraviolet

H-Index Rankings

University / Institution:

# 433

Country:

# 124,088

Region:

# 140,255

World:

# 428,826

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.476

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.286

Citation

Total:

1,503

Last 6 Year:

324

Last 6 Year/Total:

0.216

Timothy J Burns

National Institute of Standards and Technology

United States

Others

nonlinear dynamics

adiabatic shear

machining

H-Index Rankings

University / Institution:

# 434

Country:

# 124,149

Region:

# 140,321

World:

# 429,050

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.476

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.345

Citation

Total:

1,810

Last 6 Year:

305

Last 6 Year/Total:

0.169

Adam J Biacchi

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 437

Country:

# 125,444

Region:

# 141,742

World:

# 433,867

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.950

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.929

Citation

Total:

5,113

Last 6 Year:

2,750

Last 6 Year/Total:

0.538

Bala Muralikrishnan

National Institute of Standards and Technology

United States

Others

dimensional metrology

performance evaluation

measurement uncertainty

H-Index Rankings

University / Institution:

# 439

Country:

# 128,014

Region:

# 144,608

World:

# 443,624

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.800

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.579

Citation

Total:

2,566

Last 6 Year:

1,097

Last 6 Year/Total:

0.428

Yee-Yin Choong

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 440

Country:

# 128,087

Region:

# 144,692

World:

# 444,111

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.800

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.735

Citation

Total:

2,234

Last 6 Year:

1,068

Last 6 Year/Total:

0.478

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John Pettibone

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 442

Country:

# 128,447

Region:

# 145,103

World:

# 445,585

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.800

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.741

Citation

Total:

2,575

Last 6 Year:

879

Last 6 Year/Total:

0.341

Daniel Sunday

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 444

Country:

# 129,074

Region:

# 145,813

World:

# 448,044

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.750

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.909

Citation

Total:

1,363

Last 6 Year:

852

Last 6 Year/Total:

0.625

Jeyavel Velmurugan

National Institute of Standards and Technology

United States

Others

Electrochemistry

H-Index Rankings

University / Institution:

# 445

Country:

# 129,578

Region:

# 146,389

World:

# 449,991

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.750

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.826

Citation

Total:

1,946

Last 6 Year:

802

Last 6 Year/Total:

0.412

David W Allen

National Institute of Standards and Technology

United States

Others

Hyperspectral

Imaging Spectroscopy

Remote Sensing

H-Index Rankings

University / Institution:

# 446

Country:

# 129,691

Region:

# 146,518

World:

# 450,331

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.700

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.438

Citation

Total:

1,338

Last 6 Year:

602

Last 6 Year/Total:

0.450

Douglas Olson

National Institute of Standards and Technology

United States

Others

pressure metrology

H-Index Rankings

University / Institution:

# 448

Country:

# 130,300

Region:

# 147,204

World:

# 453,383

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.650

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.425

Citation

Total:

1,482

Last 6 Year:

563

Last 6 Year/Total:

0.380

Steven T Bushby

National Institute of Standards and Technology

United States

Others

building control

H-Index Rankings

University / Institution:

# 449

Country:

# 130,382

Region:

# 147,299

World:

# 453,942

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.650

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.485

Citation

Total:

1,975

Last 6 Year:

766

Last 6 Year/Total:

0.388

Kevin O Douglass

National Institute of Standards and Technology

United States

Others

spectroscopy

pressure metrology

optical cavities

H-Index Rankings

University / Institution:

# 450

Country:

# 130,421

Region:

# 147,345

World:

# 454,178

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.650

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.645

Citation

Total:

2,299

Last 6 Year:

1,042

Last 6 Year/Total:

0.453

Jonathan Guyer

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 451

Country:

# 130,512

Region:

# 147,449

World:

# 454,594

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.650

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.571

Citation

Total:

2,458

Last 6 Year:

1,298

Last 6 Year/Total:

0.528

Luis Miaja-Avila

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 452

Country:

# 130,618

Region:

# 147,567

World:

# 455,017

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.650

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.720

Citation

Total:

2,545

Last 6 Year:

1,142

Last 6 Year/Total:

0.449

Erik L Johnsson

National Institute of Standards and Technology

United States

Others

fire research

wildland-urban interface fires

compartment fires

motor coach fires

kitchen fires

H-Index Rankings

University / Institution:

# 454

Country:

# 130,940

Region:

# 147,936

World:

# 456,468

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.600

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.500

Citation

Total:

1,482

Last 6 Year:

403

Last 6 Year/Total:

0.272

Robert Bohn

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 456

Country:

# 131,116

Region:

# 148,124

World:

# 457,020

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.600

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.583

Citation

Total:

3,499

Last 6 Year:

1,153

Last 6 Year/Total:

0.330

Thomas Lebrun

National Institute of Standards and Technology

United States

Others

Optomechanical sensing

Optical levitation

AMO physics

X-ray physics

H-Index Rankings

University / Institution:

# 458

Country:

# 131,536

Region:

# 148,596

World:

# 458,717

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.500

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.308

Citation

Total:

1,764

Last 6 Year:

298

Last 6 Year/Total:

0.169

Richard Candell

National Institute of Standards and Technology

United States

Others

Industrial Wireless Systems

H-Index Rankings

University / Institution:

# 463

Country:

# 132,393

Region:

# 149,570

World:

# 462,029

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

1.000

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.923

Citation

Total:

1,771

Last 6 Year:

1,521

Last 6 Year/Total:

0.859

Mohamed Kashef (Mohamed Hany)

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 470

Country:

# 135,197

Region:

# 152,676

World:

# 472,734

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.842

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.710

Citation

Total:

1,189

Last 6 Year:

875

Last 6 Year/Total:

0.736

Bryan M Barnes

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 480

Country:

# 139,585

Region:

# 157,579

World:

# 491,014

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.526

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.333

Citation

Total:

1,345

Last 6 Year:

673

Last 6 Year/Total:

0.500

Uwe Arp

National Institute of Standards and Technology

United States

Others

Synchrotron radiation applications

Radiometry

Spectroscopy

Imaging and Microscopy

Compact Light Sources

H-Index Rankings

University / Institution:

# 482

Country:

# 140,293

Region:

# 158,361

World:

# 493,378

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.368

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.167

Citation

Total:

1,068

Last 6 Year:

192

Last 6 Year/Total:

0.180

David A Sheen

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 489

Country:

# 142,796

Region:

# 161,124

World:

# 503,017

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.889

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.852

Citation

Total:

2,338

Last 6 Year:

1,244

Last 6 Year/Total:

0.532

Dustin Poppendieck

National Institute of Standards and Technology

United States

Others

Indoor Air

Ozone

Emissions

Formaldehdye

Air Cleaners

H-Index Rankings

University / Institution:

# 501

Country:

# 145,499

Region:

# 164,169

World:

# 514,100

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.778

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.720

Citation

Total:

1,311

Last 6 Year:

549

Last 6 Year/Total:

0.419

Adam Sirois

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 504

Country:

# 145,849

Region:

# 164,569

World:

# 515,395

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.778

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.810

Citation

Total:

4,696

Last 6 Year:

1,593

Last 6 Year/Total:

0.339

Brian Simonds

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 506

Country:

# 146,219

Region:

# 164,988

World:

# 516,897

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.722

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.613

Citation

Total:

1,137

Last 6 Year:

724

Last 6 Year/Total:

0.637

The only Index that analyzes and compares 22,400 academic institutions.

AD Scientific Index

Matt Brubaker

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 507

Country:

# 146,320

Region:

# 165,102

World:

# 517,661

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.722

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.519

Citation

Total:

1,642

Last 6 Year:

675

Last 6 Year/Total:

0.411

Hongxuan Guo

National Institute of Standards and Technology

United States

Others

In situ characterization

Surface characterization

graphene

scanning helium ion microscopy

resistive switching memory

H-Index Rankings

University / Institution:

# 509

Country:

# 147,088

Region:

# 165,971

World:

# 520,876

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.667

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.467

Citation

Total:

1,017

Last 6 Year:

526

Last 6 Year/Total:

0.517

Alessandro Restelli

National Institute of Standards and Technology

United States

Others

Single Photon Detection

H-Index Rankings

University / Institution:

# 511

Country:

# 147,216

Region:

# 166,114

World:

# 521,608

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.667

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.577

Citation

Total:

1,286

Last 6 Year:

703

Last 6 Year/Total:

0.547

John D Wright

National Institute of Standards and Technology

United States

Others

flow metrology

H-Index Rankings

University / Institution:

# 517

Country:

# 148,278

Region:

# 167,284

World:

# 526,054

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.556

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.333

Citation

Total:

913

Last 6 Year:

356

Last 6 Year/Total:

0.390

Walid Keyrouz

National Institute of Standards and Technology

United States

Others

HPC

GPU Computing

Computer-Aided Engineering Design

H-Index Rankings

University / Institution:

# 518

Country:

# 148,444

Region:

# 167,464

World:

# 526,694

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.556

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.500

Citation

Total:

1,289

Last 6 Year:

388

Last 6 Year/Total:

0.301

Chris Greer

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 520

Country:

# 149,270

Region:

# 168,381

World:

# 529,644

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.333

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.143

Citation

Total:

1,364

Last 6 Year:

122

Last 6 Year/Total:

0.089

Nikolas Hrabe

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 521

Country:

# 150,615

Region:

# 169,871

World:

# 535,027

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.941

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.880

Citation

Total:

2,568

Last 6 Year:

1,874

Last 6 Year/Total:

0.730

Julia Scherschligt

National Institute of Standards and Technology

United States

Others

Pressure

Vacuum

cold-atom

H-Index Rankings

University / Institution:

# 525

Country:

# 152,165

Region:

# 171,592

World:

# 540,529

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.882

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.808

Citation

Total:

1,124

Last 6 Year:

844

Last 6 Year/Total:

0.751

Joshua Kneifel

National Institute of Standards and Technology

United States

Others

buildings

sustainability

life-cycle cost

life-cycle assessment

circular economy

H-Index Rankings

University / Institution:

# 532

Country:

# 155,246

Region:

# 175,033

World:

# 552,709

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.765

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.583

Citation

Total:

1,764

Last 6 Year:

783

Last 6 Year/Total:

0.444

Jon Wyrick

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 534

Country:

# 155,904

Region:

# 175,767

World:

# 555,087

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.765

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.895

Citation

Total:

1,028

Last 6 Year:

650

Last 6 Year/Total:

0.632

Only in AD Scientific Index !!!!

Subject Rankings, University Subject Rankings, Citiation Rankings, i10 Productivity Rankings, Country Rankings, Detailed analyses of universities

Paul Kienzle

National Institute of Standards and Technology

United States

Others

Data Analysis

Bayesian Statistics

Visualization

Neutron Scattering

H-Index Rankings

University / Institution:

# 535

Country:

# 156,130

Region:

# 176,021

World:

# 556,378

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.706

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.571

Citation

Total:

1,170

Last 6 Year:

674

Last 6 Year/Total:

0.576

Steven Choquette

National Institute of Standards and Technology

United States

Others

spectroscopy

H-Index Rankings

University / Institution:

# 542

Country:

# 158,251

Region:

# 178,413

World:

# 565,670

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.529

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.296

Citation

Total:

1,032

Last 6 Year:

279

Last 6 Year/Total:

0.270

Gary Zabow

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 543

Country:

# 158,382

Region:

# 178,561

World:

# 566,136

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.529

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.304

Citation

Total:

1,197

Last 6 Year:

265

Last 6 Year/Total:

0.221

Felix Hoyean Kim

National Institute of Standards and Technology

United States

Others

Additive Manufacturing

X-ray Computed Tomography

Nondestructive Testing

Reliability

H-Index Rankings

University / Institution:

# 544

Country:

# 159,634

Region:

# 179,918

World:

# 570,739

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

1.000

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.952

Citation

Total:

944

Last 6 Year:

744

Last 6 Year/Total:

0.788

Charles H Camp Jr |Charles H. Camp, Charlie Camp

National Institute of Standards and Technology

United States

Others

Raman

BCARS

Raman Imaging

Label-Free

Flow Cytometry

H-Index Rankings

University / Institution:

# 545

Country:

# 160,705

Region:

# 181,097

World:

# 574,893

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.938

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

1.000

Citation

Total:

1,709

Last 6 Year:

1,131

Last 6 Year/Total:

0.662

Daniel C Cole

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 546

Country:

# 161,189

Region:

# 181,635

World:

# 576,667

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.938

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.850

Citation

Total:

1,910

Last 6 Year:

1,519

Last 6 Year/Total:

0.795

Matthew Staymates

National Institute of Standards and Technology

United States

Others

Trace explosives detection

trace narcotics detection

fluid dynamics

flow visualization

schlieren

H-Index Rankings

University / Institution:

# 547

Country:

# 162,632

Region:

# 183,210

World:

# 581,652

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.875

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.739

Citation

Total:

1,102

Last 6 Year:

705

Last 6 Year/Total:

0.640

Pragya Rasmi Shrestha

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 554

Country:

# 165,815

Region:

# 186,812

World:

# 595,006

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.750

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.818

Citation

Total:

861

Last 6 Year:

563

Last 6 Year/Total:

0.654

Bin Hu

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 556

Country:

# 166,708

Region:

# 187,811

World:

# 598,724

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.688

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.500

Citation

Total:

844

Last 6 Year:

334

Last 6 Year/Total:

0.396

Kamel S Saidi

National Institute of Standards and Technology

United States

Others

remote sensing

emergency response robots

unmanned aircraft

robot perception

construction automation

H-Index Rankings

University / Institution:

# 562

Country:

# 168,310

Region:

# 189,601

World:

# 605,661

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.563

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.321

Citation

Total:

1,091

Last 6 Year:

420

Last 6 Year/Total:

0.385

				AD Scientific Index - World Scientists Rankings - 2024				H INDEX			i10 INDEX			CITATION
University / Institution	Country	Region	World	Name	Country	University / Institution	Subject	Total	Last 6 year	Last 6 year/total	Total	Last 6 year	Last 6 year/total	Total	Last 6 year	Last 6 year/total
423	122,812	138,834	423,628	Kimberly L Mueller	United States	National Institute of Standards and Technology	Others	21	14	0.667	28	21	0.750	1,294	666	0.515
426	122,992	139,031	424,166	Michael A Lombardi	United States	National Institute of Standards and Technology	Others calibrations \| clocks \| oscillators \| frequency \| time \|	21	13	0.619	51	16	0.314	1,920	596	0.310
429	123,500	139,609	426,714	Joy Dunkers	United States	National Institute of Standards and Technology	Others optical imaging and spectroscopy \| GUV \| microbiology \|	21	12	0.571	34	16	0.471	1,938	515	0.266
430	123,711	139,844	427,324	Andrey Shkabko	United States	National Institute of Standards and Technology	Others	21	12	0.571	26	15	0.577	1,448	528	0.365
431	123,802	139,948	427,756	Jason Averill	United States	National Institute of Standards and Technology	Others disaster resilience \| failure analysis \| fire safety \|	21	11	0.524	39	14	0.359	1,505	490	0.326
433	124,088	140,255	428,826	Robert F Berg	United States	National Institute of Standards and Technology	Others radiometry \| humidity \| gas flow \| ultraviolet \|	21	10	0.476	35	10	0.286	1,503	324	0.216
434	124,149	140,321	429,050	Timothy J Burns	United States	National Institute of Standards and Technology	Others nonlinear dynamics \| adiabatic shear \| machining \|	21	10	0.476	29	10	0.345	1,810	305	0.169
437	125,444	141,742	433,867	Adam J Biacchi	United States	National Institute of Standards and Technology	Others	20	19	0.950	28	26	0.929	5,113	2,750	0.538
439	128,014	144,608	443,624	Bala Muralikrishnan	United States	National Institute of Standards and Technology	Others dimensional metrology \| performance evaluation \| measurement uncertainty \|	20	16	0.800	38	22	0.579	2,566	1,097	0.428
440	128,087	144,692	444,111	Yee-Yin Choong	United States	National Institute of Standards and Technology	Others	20	16	0.800	34	25	0.735	2,234	1,068	0.478
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442	128,447	145,103	445,585	John Pettibone	United States	National Institute of Standards and Technology	Others	20	16	0.800	27	20	0.741	2,575	879	0.341
444	129,074	145,813	448,044	Daniel Sunday	United States	National Institute of Standards and Technology	Others	20	15	0.750	33	30	0.909	1,363	852	0.625
445	129,578	146,389	449,991	Jeyavel Velmurugan	United States	National Institute of Standards and Technology	Others Electrochemistry \|	20	15	0.750	23	19	0.826	1,946	802	0.412
446	129,691	146,518	450,331	David W Allen	United States	National Institute of Standards and Technology	Others Hyperspectral \| Imaging Spectroscopy \| Remote Sensing \|	20	14	0.700	48	21	0.438	1,338	602	0.450
448	130,300	147,204	453,383	Douglas Olson	United States	National Institute of Standards and Technology	Others pressure metrology \|	20	13	0.650	40	17	0.425	1,482	563	0.380
449	130,382	147,299	453,942	Steven T Bushby	United States	National Institute of Standards and Technology	Others building control \|	20	13	0.650	33	16	0.485	1,975	766	0.388
450	130,421	147,345	454,178	Kevin O Douglass	United States	National Institute of Standards and Technology	Others spectroscopy \| pressure metrology \| optical cavities \|	20	13	0.650	31	20	0.645	2,299	1,042	0.453
451	130,512	147,449	454,594	Jonathan Guyer	United States	National Institute of Standards and Technology	Others	20	13	0.650	28	16	0.571	2,458	1,298	0.528
452	130,618	147,567	455,017	Luis Miaja-Avila	United States	National Institute of Standards and Technology	Others	20	13	0.650	25	18	0.720	2,545	1,142	0.449
454	130,940	147,936	456,468	Erik L Johnsson	United States	National Institute of Standards and Technology	Others fire research \| wildland-urban interface fires \| compartment fires \| motor coach fires \| kitchen fires \|	20	12	0.600	30	15	0.500	1,482	403	0.272
456	131,116	148,124	457,020	Robert Bohn	United States	National Institute of Standards and Technology	Others	20	12	0.600	24	14	0.583	3,499	1,153	0.330
458	131,536	148,596	458,717	Thomas Lebrun	United States	National Institute of Standards and Technology	Others Optomechanical sensing \| Optical levitation \| AMO physics \| X-ray physics \|	20	10	0.500	39	12	0.308	1,764	298	0.169
463	132,393	149,570	462,029	Richard Candell	United States	National Institute of Standards and Technology	Others Industrial Wireless Systems \|	19	19	1.000	26	24	0.923	1,771	1,521	0.859
470	135,197	152,676	472,734	Mohamed Kashef (Mohamed Hany)	United States	National Institute of Standards and Technology	Others	19	16	0.842	31	22	0.710	1,189	875	0.736
480	139,585	157,579	491,014	Bryan M Barnes	United States	National Institute of Standards and Technology	Others	19	10	0.526	33	11	0.333	1,345	673	0.500
482	140,293	158,361	493,378	Uwe Arp	United States	National Institute of Standards and Technology	Others Synchrotron radiation applications \| Radiometry \| Spectroscopy \| Imaging and Microscopy \| Compact Light Sources \|	19	7	0.368	30	5	0.167	1,068	192	0.180
489	142,796	161,124	503,017	David A Sheen	United States	National Institute of Standards and Technology	Others	18	16	0.889	27	23	0.852	2,338	1,244	0.532
501	145,499	164,169	514,100	Dustin Poppendieck	United States	National Institute of Standards and Technology	Others Indoor Air \| Ozone \| Emissions \| Formaldehdye \| Air Cleaners \|	18	14	0.778	25	18	0.720	1,311	549	0.419
504	145,849	164,569	515,395	Adam Sirois	United States	National Institute of Standards and Technology	Others	18	14	0.778	21	17	0.810	4,696	1,593	0.339
506	146,219	164,988	516,897	Brian Simonds	United States	National Institute of Standards and Technology	Others	18	13	0.722	31	19	0.613	1,137	724	0.637
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507	146,320	165,102	517,661	Matt Brubaker	United States	National Institute of Standards and Technology	Others	18	13	0.722	27	14	0.519	1,642	675	0.411
509	147,088	165,971	520,876	Hongxuan Guo	United States	National Institute of Standards and Technology	Others In situ characterization \| Surface characterization \| graphene \| scanning helium ion microscopy \| resistive switching memory \|	18	12	0.667	30	14	0.467	1,017	526	0.517
511	147,216	166,114	521,608	Alessandro Restelli	United States	National Institute of Standards and Technology	Others Single Photon Detection \|	18	12	0.667	26	15	0.577	1,286	703	0.547
517	148,278	167,284	526,054	John D Wright	United States	National Institute of Standards and Technology	Others flow metrology \|	18	10	0.556	30	10	0.333	913	356	0.390
518	148,444	167,464	526,694	Walid Keyrouz	United States	National Institute of Standards and Technology	Others HPC \| GPU Computing \| Computer-Aided Engineering Design \|	18	10	0.556	24	12	0.500	1,289	388	0.301
520	149,270	168,381	529,644	Chris Greer	United States	National Institute of Standards and Technology	Others	18	6	0.333	21	3	0.143	1,364	122	0.089
521	150,615	169,871	535,027	Nikolas Hrabe	United States	National Institute of Standards and Technology	Others	17	16	0.941	25	22	0.880	2,568	1,874	0.730
525	152,165	171,592	540,529	Julia Scherschligt	United States	National Institute of Standards and Technology	Others Pressure \| Vacuum \| cold-atom \|	17	15	0.882	26	21	0.808	1,124	844	0.751
532	155,246	175,033	552,709	Joshua Kneifel	United States	National Institute of Standards and Technology	Others buildings \| sustainability \| life-cycle cost \| life-cycle assessment \| circular economy \|	17	13	0.765	24	14	0.583	1,764	783	0.444
534	155,904	175,767	555,087	Jon Wyrick	United States	National Institute of Standards and Technology	Others	17	13	0.765	19	17	0.895	1,028	650	0.632
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535	156,130	176,021	556,378	Paul Kienzle	United States	National Institute of Standards and Technology	Others Data Analysis \| Bayesian Statistics \| Visualization \| Neutron Scattering \|	17	12	0.706	28	16	0.571	1,170	674	0.576
542	158,251	178,413	565,670	Steven Choquette	United States	National Institute of Standards and Technology	Others spectroscopy \|	17	9	0.529	27	8	0.296	1,032	279	0.270
543	158,382	178,561	566,136	Gary Zabow	United States	National Institute of Standards and Technology	Others	17	9	0.529	23	7	0.304	1,197	265	0.221
544	159,634	179,918	570,739	Felix Hoyean Kim	United States	National Institute of Standards and Technology	Others Additive Manufacturing \| X-ray Computed Tomography \| Nondestructive Testing \| Reliability \|	16	16	1.000	21	20	0.952	944	744	0.788
545	160,705	181,097	574,893	Charles H Camp Jr \|Charles H. Camp, Charlie Camp	United States	National Institute of Standards and Technology	Others Raman \| BCARS \| Raman Imaging \| Label-Free \| Flow Cytometry \|	16	15	0.938	23	23	1.000	1,709	1,131	0.662
546	161,189	181,635	576,667	Daniel C Cole	United States	National Institute of Standards and Technology	Others	16	15	0.938	20	17	0.850	1,910	1,519	0.795
547	162,632	183,210	581,652	Matthew Staymates	United States	National Institute of Standards and Technology	Others Trace explosives detection \| trace narcotics detection \| fluid dynamics \| flow visualization \| schlieren \|	16	14	0.875	23	17	0.739	1,102	705	0.640
554	165,815	186,812	595,006	Pragya Rasmi Shrestha	United States	National Institute of Standards and Technology	Others	16	12	0.750	22	18	0.818	861	563	0.654
556	166,708	187,811	598,724	Bin Hu	United States	National Institute of Standards and Technology	Others	16	11	0.688	26	13	0.500	844	334	0.396
562	168,310	189,601	605,661	Kamel S Saidi	United States	National Institute of Standards and Technology	Others remote sensing \| emergency response robots \| unmanned aircraft \| robot perception \| construction automation \|	16	9	0.563	28	9	0.321	1,091	420	0.385