University, Subject, Country, Region, World

National Institute of Standards and Technology Scientists Others Rankings 2024

The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings and University Subject Rankings. Click here for individual or institutional registration.

Country

Total 284 scientist, 1 country, 1 institution

List without CERN, Statistical Data etc.

Sort by last 6 years H Index

Rd Shull

National Institute of Standards and Technology

United States

Others

Magnetic Domain Imaging

Magnetocaloric Effects

FORC analysis

Superconductivity

Magnetic Standards

H-Index Rankings

University / Institution:

# 136

Country:

# 42,381

Region:

# 47,799

World:

# 119,444

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.429

i10 Index

Total:

120

Last 6 Year:

Last 6 Year/Total:

0.317

Citation

Total:

8,006

Last 6 Year:

1,812

Last 6 Year/Total:

0.226

Esther Baumann

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 140

Country:

# 43,329

Region:

# 48,880

World:

# 122,876

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.707

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.750

Citation

Total:

6,005

Last 6 Year:

3,422

Last 6 Year/Total:

0.570

Adriana E Lita

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 147

Country:

# 45,320

Region:

# 51,156

World:

# 129,699

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.725

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.927

Citation

Total:

11,576

Last 6 Year:

5,465

Last 6 Year/Total:

0.472

Thomas A Germer

National Institute of Standards and Technology

United States

Others

diffuse scattering

polarization

diffraction

H-Index Rankings

University / Institution:

# 149

Country:

# 46,214

Region:

# 52,181

World:

# 132,875

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.500

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.364

Citation

Total:

4,578

Last 6 Year:

1,161

Last 6 Year/Total:

0.254

Norman Sanford

National Institute of Standards and Technology

United States

Others

EUV Atom Probe

III-Nitrides

Active Waveguides

PPLN

H-Index Rankings

University / Institution:

# 150

Country:

# 46,217

Region:

# 52,184

World:

# 132,889

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.500

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.358

Citation

Total:

6,402

Last 6 Year:

1,254

Last 6 Year/Total:

0.196

Robert N Goldberg

National Institute of Standards and Technology

United States

Others

Biochemical Thermodynamics

electrolyte solutions

H-Index Rankings

University / Institution:

# 152

Country:

# 46,409

Region:

# 52,401

World:

# 133,406

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.425

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.276

Citation

Total:

7,797

Last 6 Year:

1,420

Last 6 Year/Total:

0.182

Thomas R Gentile

National Institute of Standards and Technology

United States

Others

polarized gases

neutron physics

H-Index Rankings

University / Institution:

# 153

Country:

# 46,492

Region:

# 52,496

World:

# 133,613

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.375

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.301

Citation

Total:

4,492

Last 6 Year:

922

Last 6 Year/Total:

0.205

Jm Rowe

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 154

Country:

# 46,559

Region:

# 52,576

World:

# 133,769

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.225

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.108

Citation

Total:

5,630

Last 6 Year:

328

Last 6 Year/Total:

0.058

Anna Karion

National Institute of Standards and Technology

United States

Others

Carbon Cycle

Atmospheric measurements

greenhouse gases

H-Index Rankings

University / Institution:

# 155

Country:

# 46,740

Region:

# 52,777

World:

# 134,488

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.897

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.841

Citation

Total:

8,017

Last 6 Year:

4,618

Last 6 Year/Total:

0.576

James J Filliben

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 159

Country:

# 48,230

Region:

# 54,494

World:

# 139,788

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.564

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.414

Citation

Total:

6,712

Last 6 Year:

2,008

Last 6 Year/Total:

0.299

Click for INSTITUTIONAL REGISTRATION and PREMIUM MEMBERSHIP advantages

Jabez Mcclelland

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 162

Country:

# 48,719

Region:

# 55,050

World:

# 141,239

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.410

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.313

Citation

Total:

6,152

Last 6 Year:

1,312

Last 6 Year/Total:

0.213

Huai-Ruo Zhang

National Institute of Standards and Technology

United States

Others

Aberration-corrected TEM/STEM

FIB

Thin Films

Ceramics

Batteries

H-Index Rankings

University / Institution:

# 165

Country:

# 49,844

Region:

# 56,309

World:

# 145,320

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.711

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.671

Citation

Total:

6,053

Last 6 Year:

3,251

Last 6 Year/Total:

0.537

Michael Vissers

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 167

Country:

# 51,435

Region:

# 58,097

World:

# 150,906

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.865

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.961

Citation

Total:

5,614

Last 6 Year:

4,492

Last 6 Year/Total:

0.800

Wenqi Zhu

National Institute of Standards and Technology

United States

Others

Nano-optics

Metasurfaces

Ultrafast Optics

Nanofabrication

H-Index Rankings

University / Institution:

# 168

Country:

# 51,749

Region:

# 58,448

World:

# 152,051

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.811

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.880

Citation

Total:

5,045

Last 6 Year:

3,593

Last 6 Year/Total:

0.712

James G Kushmerick

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 171

Country:

# 53,597

Region:

# 60,559

World:

# 158,463

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.351

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.388

Citation

Total:

6,262

Last 6 Year:

848

Last 6 Year/Total:

0.135

Marcelo Davanco

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 172

Country:

# 54,482

Region:

# 61,581

World:

# 161,780

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.778

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.750

Citation

Total:

4,905

Last 6 Year:

2,888

Last 6 Year/Total:

0.589

Stephan Schlamminger

National Institute of Standards and Technology

United States

Others

Metrology

Gravity

H-Index Rankings

University / Institution:

# 174

Country:

# 55,134

Region:

# 62,334

World:

# 164,297

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.667

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.814

Citation

Total:

7,027

Last 6 Year:

3,015

Last 6 Year/Total:

0.429

Kenneth Snyder

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 175

Country:

# 55,722

Region:

# 63,001

World:

# 166,417

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.556

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.579

Citation

Total:

5,898

Last 6 Year:

1,778

Last 6 Year/Total:

0.301

Kevin Lyons

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 176

Country:

# 55,995

Region:

# 63,317

World:

# 167,333

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.472

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.493

Citation

Total:

4,832

Last 6 Year:

1,319

Last 6 Year/Total:

0.273

Richard E Cavicchi

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 178

Country:

# 56,134

Region:

# 63,465

World:

# 167,701

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.417

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.360

Citation

Total:

5,203

Last 6 Year:

682

Last 6 Year/Total:

0.131

David Lavan

National Institute of Standards and Technology

United States

Others

nanocalorimetry

MEMS

Biosensors

H-Index Rankings

University / Institution:

# 180

Country:

# 57,869

Region:

# 65,439

World:

# 174,245

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.657

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.578

Citation

Total:

9,853

Last 6 Year:

2,159

Last 6 Year/Total:

0.219

Nikolai Zhitenev

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 183

Country:

# 58,322

Region:

# 65,970

World:

# 175,965

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.571

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.529

Citation

Total:

4,419

Last 6 Year:

1,367

Last 6 Year/Total:

0.309

Jon Geist

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 186

Country:

# 58,970

Region:

# 66,702

World:

# 177,849

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.371

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.241

Citation

Total:

4,205

Last 6 Year:

608

Last 6 Year/Total:

0.145

Albert Rigosi

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 188

Country:

# 59,343

Region:

# 67,112

World:

# 179,184

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.912

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

1.000

Citation

Total:

8,663

Last 6 Year:

6,287

Last 6 Year/Total:

0.726

Edwin P Chan

National Institute of Standards and Technology

United States

Others

polymer mechanics

high rate deformation

adhesion & fracture

polymer physics

H-Index Rankings

University / Institution:

# 192

Country:

# 60,498

Region:

# 68,433

World:

# 183,747

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.706

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.929

Citation

Total:

4,818

Last 6 Year:

2,266

Last 6 Year/Total:

0.470

Erich Grossman

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 194

Country:

# 61,787

Region:

# 69,910

World:

# 188,245

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.412

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.241

Citation

Total:

3,873

Last 6 Year:

750

Last 6 Year/Total:

0.194

Shannon M Duff

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 198

Country:

# 62,207

Region:

# 70,373

World:

# 189,615

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.909

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.856

Citation

Total:

6,414

Last 6 Year:

5,679

Last 6 Year/Total:

0.885

Paul Haney

National Institute of Standards and Technology

United States

Others

spintronics

photovoltaics

H-Index Rankings

University / Institution:

# 199

Country:

# 63,433

Region:

# 71,771

World:

# 194,262

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.727

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.804

Citation

Total:

6,096

Last 6 Year:

3,417

Last 6 Year/Total:

0.561

Carelyn Campbell

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 200

Country:

# 63,464

Region:

# 71,807

World:

# 194,340

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.727

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.698

Citation

Total:

3,844

Last 6 Year:

2,294

Last 6 Year/Total:

0.597

Paul D Hale

National Institute of Standards and Technology

United States

Others

deconvolution

electro-optic sampling

oscilloscope

photodiode

waveform

H-Index Rankings

University / Institution:

# 204

Country:

# 64,537

Region:

# 73,030

World:

# 198,358

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.545

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.486

Citation

Total:

3,959

Last 6 Year:

1,561

Last 6 Year/Total:

0.394

The only Index that analyzes and compares 22,400 academic institutions.

AD Scientific Index

Xiaohong Gu

National Institute of Standards and Technology

United States

Others

Polymer Degradation

Nanocharacterization

Photovoltaic Encapsulation

H-Index Rankings

University / Institution:

# 206

Country:

# 64,556

Region:

# 73,051

World:

# 198,404

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.545

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.603

Citation

Total:

3,086

Last 6 Year:

1,161

Last 6 Year/Total:

0.376

Shaw Feng

National Institute of Standards and Technology

United States

Others

Metrology

Sustainability

Additive Manufacturing

H-Index Rankings

University / Institution:

# 207

Country:

# 64,651

Region:

# 73,152

World:

# 198,627

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.545

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.617

Citation

Total:

4,102

Last 6 Year:

2,024

Last 6 Year/Total:

0.493

Russell Johnson

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 208

Country:

# 64,810

Region:

# 73,331

World:

# 199,199

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.485

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.280

Citation

Total:

4,131

Last 6 Year:

1,183

Last 6 Year/Total:

0.286

Eugene Paulechka

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 215

Country:

# 67,048

Region:

# 75,872

World:

# 207,375

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.688

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.726

Citation

Total:

4,528

Last 6 Year:

1,548

Last 6 Year/Total:

0.342

Andre M Striegel

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 218

Country:

# 67,676

Region:

# 76,578

World:

# 209,759

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.594

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.492

Citation

Total:

3,624

Last 6 Year:

1,277

Last 6 Year/Total:

0.352

R David Holbrook

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 219

Country:

# 68,097

Region:

# 77,063

World:

# 211,214

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.531

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.548

Citation

Total:

4,623

Last 6 Year:

1,313

Last 6 Year/Total:

0.284

Paul Over

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 221

Country:

# 68,502

Region:

# 77,521

World:

# 212,498

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.375

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.286

Citation

Total:

5,753

Last 6 Year:

676

Last 6 Year/Total:

0.118

John Villarrubia

National Institute of Standards and Technology

United States

Others

electron scattering

scanning electron microscopy

atomic force microscopy

surface science

H-Index Rankings

University / Institution:

# 234

Country:

# 71,881

Region:

# 81,383

World:

# 225,375

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.452

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.350

Citation

Total:

4,926

Last 6 Year:

840

Last 6 Year/Total:

0.171

David Long

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 238

Country:

# 73,569

Region:

# 83,282

World:

# 231,834

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.767

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.764

Citation

Total:

8,955

Last 6 Year:

4,169

Last 6 Year/Total:

0.466

Neil Zimmerman

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 243

Country:

# 75,587

Region:

# 85,582

World:

# 239,399

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.467

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.457

Citation

Total:

3,115

Last 6 Year:

646

Last 6 Year/Total:

0.207

Only in AD Scientific Index !!!!

Subject Rankings, University Subject Rankings, Citiation Rankings, i10 Productivity Rankings, Country Rankings, Detailed analyses of universities

Steven Robey

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 245

Country:

# 75,846

Region:

# 85,874

World:

# 240,104

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.267

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.127

Citation

Total:

2,678

Last 6 Year:

233

Last 6 Year/Total:

0.087

Bert Coursey

National Institute of Standards and Technology

United States

Others

radioactivity

ionizing radiation

H-Index Rankings

University / Institution:

# 246

Country:

# 75,851

Region:

# 85,880

World:

# 240,110

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.267

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.100

Citation

Total:

7,515

Last 6 Year:

1,752

Last 6 Year/Total:

0.233

Shawn Moylan

National Institute of Standards and Technology

United States

Others

Additive Manufacturing

Advanced Manufacturing

Machine Performance

Metrology

H-Index Rankings

University / Institution:

# 251

Country:

# 77,334

Region:

# 87,545

World:

# 245,937

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.793

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.787

Citation

Total:

4,222

Last 6 Year:

3,023

Last 6 Year/Total:

0.716

James R Matey

National Institute of Standards and Technology

United States

Others

Biometrics

H-Index Rankings

University / Institution:

# 257

Country:

# 79,239

Region:

# 89,712

World:

# 253,456

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.552

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.360

Citation

Total:

5,434

Last 6 Year:

842

Last 6 Year/Total:

0.155

Jay Hendricks

National Institute of Standards and Technology

United States

Others

metrology

spectroscopy

refractive index

pressure standards

H-Index Rankings

University / Institution:

# 258

Country:

# 79,316

Region:

# 89,792

World:

# 253,638

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.552

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.571

Citation

Total:

2,738

Last 6 Year:

923

Last 6 Year/Total:

0.337

Michael Fasolka

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 262

Country:

# 79,747

Region:

# 90,279

World:

# 255,151

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.414

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.311

Citation

Total:

4,543

Last 6 Year:

687

Last 6 Year/Total:

0.151

John D Teufel

National Institute of Standards and Technology

United States

Others

optomechanics

electromechanics

superconductors

microwave

H-Index Rankings

University / Institution:

# 266

Country:

# 80,391

Region:

# 91,003

World:

# 257,526

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.929

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.857

Citation

Total:

8,691

Last 6 Year:

3,879

Last 6 Year/Total:

0.446

Paul Witherell

National Institute of Standards and Technology

United States

Others

H-Index Rankings

University / Institution:

# 268

Country:

# 81,104

Region:

# 91,812

World:

# 260,299

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.821

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.768

Citation

Total:

2,735

Last 6 Year:

2,150

Last 6 Year/Total:

0.786

Jared Wahlstrand

National Institute of Standards and Technology

United States

Others

nonlinear optics

spectroscopy

H-Index Rankings

University / Institution:

# 271

Country:

# 82,242

Region:

# 93,116

World:

# 264,858

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.714

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.625

Citation

Total:

2,825

Last 6 Year:

1,186

Last 6 Year/Total:

0.420

John H Lehman

National Institute of Standards and Technology

United States

Others

Optical and Infrared Detectors

Carbon Nanotubes

Laser Radiometry

Photon Momentum

H-Index Rankings

University / Institution:

# 272

Country:

# 82,448

Region:

# 93,345

World:

# 265,552

H-Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.679

i10 Index

Total:

Last 6 Year:

Last 6 Year/Total:

0.522

Citation

Total:

4,039

Last 6 Year:

1,853

Last 6 Year/Total:

0.459

				AD Scientific Index - World Scientists Rankings - 2024				H INDEX			i10 INDEX			CITATION
University / Institution	Country	Region	World	Name	Country	University / Institution	Subject	Total	Last 6 year	Last 6 year/total	Total	Last 6 year	Last 6 year/total	Total	Last 6 year	Last 6 year/total
136	42,381	47,799	119,444	Rd Shull	United States	National Institute of Standards and Technology	Others Magnetic Domain Imaging \| Magnetocaloric Effects \| FORC analysis \| Superconductivity \| Magnetic Standards \|	42	18	0.429	120	38	0.317	8,006	1,812	0.226
140	43,329	48,880	122,876	Esther Baumann	United States	National Institute of Standards and Technology	Others	41	29	0.707	60	45	0.750	6,005	3,422	0.570
147	45,320	51,156	129,699	Adriana E Lita	United States	National Institute of Standards and Technology	Others	40	29	0.725	55	51	0.927	11,576	5,465	0.472
149	46,214	52,181	132,875	Thomas A Germer	United States	National Institute of Standards and Technology	Others diffuse scattering \| polarization \| diffraction \|	40	20	0.500	99	36	0.364	4,578	1,161	0.254
150	46,217	52,184	132,889	Norman Sanford	United States	National Institute of Standards and Technology	Others EUV Atom Probe \| III-Nitrides \| Active Waveguides \| PPLN \|	40	20	0.500	95	34	0.358	6,402	1,254	0.196
152	46,409	52,401	133,406	Robert N Goldberg	United States	National Institute of Standards and Technology	Others Biochemical Thermodynamics \| electrolyte solutions \|	40	17	0.425	98	27	0.276	7,797	1,420	0.182
153	46,492	52,496	133,613	Thomas R Gentile	United States	National Institute of Standards and Technology	Others polarized gases \| neutron physics \|	40	15	0.375	83	25	0.301	4,492	922	0.205
154	46,559	52,576	133,769	Jm Rowe	United States	National Institute of Standards and Technology	Others	40	9	0.225	74	8	0.108	5,630	328	0.058
155	46,740	52,777	134,488	Anna Karion	United States	National Institute of Standards and Technology	Others Carbon Cycle \| Atmospheric measurements \| greenhouse gases \|	39	35	0.897	63	53	0.841	8,017	4,618	0.576
159	48,230	54,494	139,788	James J Filliben	United States	National Institute of Standards and Technology	Others	39	22	0.564	99	41	0.414	6,712	2,008	0.299
			Click for INSTITUTIONAL REGISTRATION and PREMIUM MEMBERSHIP advantages
162	48,719	55,050	141,239	Jabez Mcclelland	United States	National Institute of Standards and Technology	Others	39	16	0.410	80	25	0.313	6,152	1,312	0.213
165	49,844	56,309	145,320	Huai-Ruo Zhang	United States	National Institute of Standards and Technology	Others Aberration-corrected TEM/STEM \| FIB \| Thin Films \| Ceramics \| Batteries \|	38	27	0.711	70	47	0.671	6,053	3,251	0.537
167	51,435	58,097	150,906	Michael Vissers	United States	National Institute of Standards and Technology	Others	37	32	0.865	77	74	0.961	5,614	4,492	0.800
168	51,749	58,448	152,051	Wenqi Zhu	United States	National Institute of Standards and Technology	Others Nano-optics \| Metasurfaces \| Ultrafast Optics \| Nanofabrication \|	37	30	0.811	50	44	0.880	5,045	3,593	0.712
171	53,597	60,559	158,463	James G Kushmerick	United States	National Institute of Standards and Technology	Others	37	13	0.351	49	19	0.388	6,262	848	0.135
172	54,482	61,581	161,780	Marcelo Davanco	United States	National Institute of Standards and Technology	Others	36	28	0.778	56	42	0.750	4,905	2,888	0.589
174	55,134	62,334	164,297	Stephan Schlamminger	United States	National Institute of Standards and Technology	Others Metrology \| Gravity \|	36	24	0.667	59	48	0.814	7,027	3,015	0.429
175	55,722	63,001	166,417	Kenneth Snyder	United States	National Institute of Standards and Technology	Others	36	20	0.556	57	33	0.579	5,898	1,778	0.301
176	55,995	63,317	167,333	Kevin Lyons	United States	National Institute of Standards and Technology	Others	36	17	0.472	71	35	0.493	4,832	1,319	0.273
178	56,134	63,465	167,701	Richard E Cavicchi	United States	National Institute of Standards and Technology	Others	36	15	0.417	75	27	0.360	5,203	682	0.131
180	57,869	65,439	174,245	David Lavan	United States	National Institute of Standards and Technology	Others nanocalorimetry \| MEMS \| Biosensors \|	35	23	0.657	64	37	0.578	9,853	2,159	0.219
183	58,322	65,970	175,965	Nikolai Zhitenev	United States	National Institute of Standards and Technology	Others	35	20	0.571	70	37	0.529	4,419	1,367	0.309
186	58,970	66,702	177,849	Jon Geist	United States	National Institute of Standards and Technology	Others	35	13	0.371	83	20	0.241	4,205	608	0.145
188	59,343	67,112	179,184	Albert Rigosi	United States	National Institute of Standards and Technology	Others	34	31	0.912	42	42	1.000	8,663	6,287	0.726
192	60,498	68,433	183,747	Edwin P Chan	United States	National Institute of Standards and Technology	Others polymer mechanics \| high rate deformation \| adhesion & fracture \| polymer physics \|	34	24	0.706	56	52	0.929	4,818	2,266	0.470
194	61,787	69,910	188,245	Erich Grossman	United States	National Institute of Standards and Technology	Others	34	14	0.412	83	20	0.241	3,873	750	0.194
198	62,207	70,373	189,615	Shannon M Duff	United States	National Institute of Standards and Technology	Others	33	30	0.909	90	77	0.856	6,414	5,679	0.885
199	63,433	71,771	194,262	Paul Haney	United States	National Institute of Standards and Technology	Others spintronics \| photovoltaics \|	33	24	0.727	56	45	0.804	6,096	3,417	0.561
200	63,464	71,807	194,340	Carelyn Campbell	United States	National Institute of Standards and Technology	Others	33	24	0.727	53	37	0.698	3,844	2,294	0.597
204	64,537	73,030	198,358	Paul D Hale	United States	National Institute of Standards and Technology	Others deconvolution \| electro-optic sampling \| oscilloscope \| photodiode \| waveform \|	33	18	0.545	72	35	0.486	3,959	1,561	0.394
			The only Index that analyzes and compares 22,400 academic institutions. AD Scientific Index
206	64,556	73,051	198,404	Xiaohong Gu	United States	National Institute of Standards and Technology	Others Polymer Degradation \| Nanocharacterization \| Photovoltaic Encapsulation \|	33	18	0.545	68	41	0.603	3,086	1,161	0.376
207	64,651	73,152	198,627	Shaw Feng	United States	National Institute of Standards and Technology	Others Metrology \| Sustainability \| Additive Manufacturing \|	33	18	0.545	47	29	0.617	4,102	2,024	0.493
208	64,810	73,331	199,199	Russell Johnson	United States	National Institute of Standards and Technology	Others	33	16	0.485	75	21	0.280	4,131	1,183	0.286
215	67,048	75,872	207,375	Eugene Paulechka	United States	National Institute of Standards and Technology	Others	32	22	0.688	62	45	0.726	4,528	1,548	0.342
218	67,676	76,578	209,759	Andre M Striegel	United States	National Institute of Standards and Technology	Others	32	19	0.594	63	31	0.492	3,624	1,277	0.352
219	68,097	77,063	211,214	R David Holbrook	United States	National Institute of Standards and Technology	Others	32	17	0.531	42	23	0.548	4,623	1,313	0.284
221	68,502	77,521	212,498	Paul Over	United States	National Institute of Standards and Technology	Others	32	12	0.375	42	12	0.286	5,753	676	0.118
234	71,881	81,383	225,375	John Villarrubia	United States	National Institute of Standards and Technology	Others electron scattering \| scanning electron microscopy \| atomic force microscopy \| surface science \|	31	14	0.452	60	21	0.350	4,926	840	0.171
238	73,569	83,282	231,834	David Long	United States	National Institute of Standards and Technology	Others	30	23	0.767	55	42	0.764	8,955	4,169	0.466
243	75,587	85,582	239,399	Neil Zimmerman	United States	National Institute of Standards and Technology	Others	30	14	0.467	46	21	0.457	3,115	646	0.207
			Only in AD Scientific Index !!!! Subject Rankings, University Subject Rankings, Citiation Rankings, i10 Productivity Rankings, Country Rankings, Detailed analyses of universities
245	75,846	85,874	240,104	Steven Robey	United States	National Institute of Standards and Technology	Others	30	8	0.267	55	7	0.127	2,678	233	0.087
246	75,851	85,880	240,110	Bert Coursey	United States	National Institute of Standards and Technology	Others radioactivity \| ionizing radiation \|	30	8	0.267	50	5	0.100	7,515	1,752	0.233
251	77,334	87,545	245,937	Shawn Moylan	United States	National Institute of Standards and Technology	Others Additive Manufacturing \| Advanced Manufacturing \| Machine Performance \| Metrology \|	29	23	0.793	47	37	0.787	4,222	3,023	0.716
257	79,239	89,712	253,456	James R Matey	United States	National Institute of Standards and Technology	Others Biometrics \|	29	16	0.552	50	18	0.360	5,434	842	0.155
258	79,316	89,792	253,638	Jay Hendricks	United States	National Institute of Standards and Technology	Others metrology \| spectroscopy \| refractive index \| pressure standards \|	29	16	0.552	42	24	0.571	2,738	923	0.337
262	79,747	90,279	255,151	Michael Fasolka	United States	National Institute of Standards and Technology	Others	29	12	0.414	45	14	0.311	4,543	687	0.151
266	80,391	91,003	257,526	John D Teufel	United States	National Institute of Standards and Technology	Others optomechanics \| electromechanics \| superconductors \| microwave \|	28	26	0.929	35	30	0.857	8,691	3,879	0.446
268	81,104	91,812	260,299	Paul Witherell	United States	National Institute of Standards and Technology	Others	28	23	0.821	56	43	0.768	2,735	2,150	0.786
271	82,242	93,116	264,858	Jared Wahlstrand	United States	National Institute of Standards and Technology	Others nonlinear optics \| spectroscopy \|	28	20	0.714	48	30	0.625	2,825	1,186	0.420
272	82,448	93,345	265,552	John H Lehman	United States	National Institute of Standards and Technology	Others Optical and Infrared Detectors \| Carbon Nanotubes \| Laser Radiometry \| Photon Momentum \|	28	19	0.679	69	36	0.522	4,039	1,853	0.459