Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings. Click here for individual or institutional registration.
computational optics
imaging and photography
laser
ultrafast and nonlinear optics
computational electromagnetics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Sensors
MEMS
semiconductors
lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
MEMS
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Optics
Surface Physics
Plasmonics
Lithography
Metrology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
EUV Lithography
Biomimetics
MEMS
Microsensors
Semiconductors
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Control
signal processing
system identification
Kalman filtering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
2
0.286
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Computational Physics and Chemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Nanotechnology
photonics
semiconductors
optics
tomography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Photolithography
Nano Fabrication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Software Engineering
Persistent Memory Systems
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Development of (Finite Element) Methods
Isogeometric Analysis
Compatible Discretizations
Tribology
Surface Chemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Tribology
Materials Characterization
Metallic Glass
Mechanical Properties
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Air bearings
Compliant mechanisms
Tribology
Bearings
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Optical Science
Laser Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
EUV
Photolithography
inkjet
condensed matter physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Mems
photonics
TEM
micro/nano fabrication
Photolithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Nikhil Mehta
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
computational optics
imaging and photography
laser
ultrafast and nonlinear optics
computational electromagnetics
Joseph Zekry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Tiannan Guan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Todd R. Downey
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Optics
Surface Physics
Plasmonics
Lithography
Metrology
Romain Cauchois
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
Robin Soetens
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Alejandro Arrizabalaga
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Muhsin Eralp
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Frank Driessen
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Ram Jaganatharaja
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Sam Crisafulli
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
2
0.286
Control
signal processing
system identification
Kalman filtering
Xiangyun Amy Chen
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Alexandru Onose
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Ian S. Dunn
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Computational Physics and Chemistry
Da Grishina
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Nanotechnology
photonics
semiconductors
optics
tomography
Chunlei Yue
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Taciano Dreckmann Perez
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Software Engineering
Persistent Memory Systems
Dennis Ernens
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Development of (Finite Element) Methods
Isogeometric Analysis
Compatible Discretizations
Tribology
Surface Chemistry
Chaiyapat Tangpatjaroen
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Tribology
Materials Characterization
Metallic Glass
Mechanical Properties
Joep Nijssen
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Aabid Patel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Xiaokun Ma
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Syarif Riyadi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
EUV
Photolithography
inkjet
condensed matter physics
Prashanth Anandan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Ahmet Koray Erdamar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Mems
photonics
TEM
micro/nano fabrication
Photolithography