Welcome to AD Scientific Index. The international independent ranking organisation AD Scientific Index is more than an ordinary "Ranking". The "AD Scientific Index" analyses the academic work of scientists using the H-index, i10 index and number of citations, and provides results that can be used to evaluate the productivity and efficiency of individuals and institutions. In addition to ranking according to "total H-index" for individuals and institutions, you can also see the ranking and analyses according to "last 6 years H-index", "total i10 Productivity index", "last 6 years i10 Productivity index", "total citations" and "last 6 years citations" only in "AD Scientific Index". See also: Subject Rankings, University Subject Rankings and Universities Rankings. Click here for individual or institutional registration.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Scientific computing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Wide Bandgap Semiconductor
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Ultracold Atoms
Extreme Ultraviolet Light (EUV)
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
partially coherent light
aberration theory
Fourier optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
photolithograhy
precision engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Semiconductor Process
EUV
MEMS
Silicon Photonics
Optofluidic Sensing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
lithography
OPC
process
design
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Computer Vision
SEM metrology
Ultracold Quantum Gases
Ultrafast Laser
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Lithography
Overlay
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Nanotechnology
Semiconductor device
Semiconductor fabrication
2D materials
Graphene
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Physics
Optics
EUV
Photolithography
Data Analysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Fluid dynamics
Vacuum system
Semiconductor equipment
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Computer Graphics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Materials
Microstructure
Damage
Quasi-static and Dynamic Mechanical Properties
Texture
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
MEMS
Integrated Optics
Nanotechnology
sensors and actuators
microfluidics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
metallurgy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Super-resolution optical imaging
computational lithography
optoelectronics
Metamaterials
nanophotonic
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Voice Over IP - Telecommunications Software
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Guido Volleberg
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Reinaldo Astudillo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Qingwen Wang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Armin Ridinger
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Ultracold Atoms
Extreme Ultraviolet Light (EUV)
Jh Jacobs
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Minyi Zhong
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Wan-Soo Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Shuling Wang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Semiconductor Process
EUV
MEMS
Silicon Photonics
Optofluidic Sensing
Aravind Narayana Samy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Chen Zhang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Computer Vision
SEM metrology
Ultracold Quantum Gases
Ultrafast Laser
Prashant Raman
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Archana Sampath
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Milena Cervo Sulzbach
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Sanghoon Park|Jaden Park
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Nanotechnology
Semiconductor device
Semiconductor fabrication
2D materials
Graphene
Faisal Nadeem
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Physics
Optics
EUV
Photolithography
Data Analysis
Dongchi Yu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Fluid dynamics
Vacuum system
Semiconductor equipment
Erik Abegg
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Vivek Kumar Jain
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
Subhasish Sutradhar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
Behnam Shakerifard
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Materials
Microstructure
Damage
Quasi-static and Dynamic Mechanical Properties
Texture
Pham, Sv, So Van Pham
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
MEMS
Integrated Optics
Nanotechnology
sensors and actuators
microfluidics
Mike Callahan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Zun Huang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Super-resolution optical imaging
computational lithography
optoelectronics
Metamaterials
nanophotonic
Mohamed Adel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Voice Over IP - Telecommunications Software