Citation Rankings
Highly Cited Researchers

Others Highly Cited Researchers 142 Scientists Citation Rankings - 2025

Discover the world’s highly cited researchers through the AD Scientific Index 2025 Citation Rankings.
These rankings evaluate scientists based on their total and recent citation counts, capturing the breadth and real-time currency of academic recognition. Citation data reveals how widely a scholar’s work is referenced, applied, and extended across diverse disciplines. The rankings are routinely updated to reflect ongoing citation growth, while eliminating distortions from excessive co-authorship and institutional inflation. Premium tools provide access to detailed citation dynamics, unethical citation behavior detection, and field-normalized benchmarking.

* Total Citation Counts Rankings
Ranking Based On Selection: 1
Netherlands
Vadim Banine
EU
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,433
1,759
0.273
* Total Citation Counts Rankings
Ranking Based On Selection: 2
Netherlands
Stefan Hunsche
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,318
1,322
0.209
* Total Citation Counts Rankings
Ranking Based On Selection: 3
Netherlands
Liang Wang
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,103
1,427
0.234
* Total Citation Counts Rankings
Ranking Based On Selection: 4
Netherlands
Timothy A. Brunner
Microlithography for integrated circuit productio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,865
633
0.108
* Total Citation Counts Rankings
Ranking Based On Selection: 5
Netherlands
Wolter Siemons
Correlated electron systems
Lithograph
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,404
1,678
0.311
* Total Citation Counts Rankings
Ranking Based On Selection: 6
Netherlands
Farzad Fareed|Farzad Behafarid
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysi
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,558
2,123
0.466
* Total Citation Counts Rankings
Ranking Based On Selection: 7
Netherlands
Michael Engel
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,517
1,447
0.320
* Total Citation Counts Rankings
Ranking Based On Selection: 8
Netherlands
Steven G. Hansen
photolithography
simulation
photoresis
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,512
502
0.143
* Total Citation Counts Rankings
Ranking Based On Selection: 9
Netherlands
Achim Woessner
lithography
patterning
voltage contras
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,348
1,911
0.571

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* Total Citation Counts Rankings
Ranking Based On Selection: 10
Netherlands
Jingshi Li
Optical Communications
optical detectio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,214
1,051
0.327
* Total Citation Counts Rankings
Ranking Based On Selection: 11
Netherlands
Robert Socha
lithograph
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,128
378
0.121
* Total Citation Counts Rankings
Ranking Based On Selection: 12
Netherlands
Isis Ledezma-Yanez
Electrochemistry
Physicochemistr
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,043
2,173
0.714
* Total Citation Counts Rankings
Ranking Based On Selection: 13
Netherlands
Steven E. Steen
Lithography
3D integration
semiconductors
process
photovoltaic
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,854
751
0.263
* Total Citation Counts Rankings
Ranking Based On Selection: 14
Netherlands
Mark Van De Kerkhof|M van de Kerkhof, Marcus van de Kerkhof, Marcus Adrianus van de Kerkhof
EUV
Lithography
Plasm
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,810
1,279
0.455
* Total Citation Counts Rankings
Ranking Based On Selection: 15
Netherlands
Awm (Jos) Van Schijndel
comsol
matlab
simulink
modeling
simulatio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,784
1,073
0.385
* Total Citation Counts Rankings
Ranking Based On Selection: 16
Netherlands
Ws Christian Roelofs
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,626
690
0.263
* Total Citation Counts Rankings
Ranking Based On Selection: 17
Netherlands
Ilias Katsouras
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,621
1,576
0.601
* Total Citation Counts Rankings
Ranking Based On Selection: 18
Netherlands
Carlo Luijten
Optische lithografie
warmte en stromin
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,151
628
0.292
* Total Citation Counts Rankings
Ranking Based On Selection: 19
Netherlands
Inci Donmez Noyan
Thin films
MEM
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,124
1,073
0.505
* Total Citation Counts Rankings
Ranking Based On Selection: 20
Netherlands
Stephen D. Hsu
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement techniqu
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,121
507
0.239
* Total Citation Counts Rankings
Ranking Based On Selection: 21
Netherlands
Michael Lercel
Semiconductor lithography
metrology
and inspectio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,038
173
0.085
* Total Citation Counts Rankings
Ranking Based On Selection: 22
Netherlands
Tristan Mes
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,035
921
0.453
* Total Citation Counts Rankings
Ranking Based On Selection: 23
Netherlands
Victor Dolk
Control system
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,948
1,422
0.730
* Total Citation Counts Rankings
Ranking Based On Selection: 24
Netherlands
Alex Schafgans
EUV Lithography
laser produced plasm
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,921
704
0.366
* Total Citation Counts Rankings
Ranking Based On Selection: 25
Netherlands
Seong Chan Kim
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,725
726
0.421
* Total Citation Counts Rankings
Rankings
169,967
Netherlands
4,058
1
Ranking Based On Selection: 1
Vadim Banine
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,433
1,759
0.273
* Total Citation Counts Rankings
Rankings
173,004
Netherlands
4,112
2
Ranking Based On Selection: 2
Stefan Hunsche
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,318
1,322
0.209
* Total Citation Counts Rankings
Rankings
179,181
Netherlands
4,251
3
Ranking Based On Selection: 3
Liang Wang
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,103
1,427
0.234
* Total Citation Counts Rankings
Rankings
186,510
Netherlands
4,392
4
Ranking Based On Selection: 4
Timothy A. Brunner
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,865
633
0.108
Microlithography for integrated circuit productio
* Total Citation Counts Rankings
Rankings
202,056
Netherlands
4,696
5
Ranking Based On Selection: 5
Wolter Siemons
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,404
1,678
0.311
Correlated electron systems
Lithograph
* Total Citation Counts Rankings
Rankings
237,640
Netherlands
5,335
7
Ranking Based On Selection: 6
Farzad Fareed|Farzad Behafarid
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,558
2,123
0.466
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysi
* Total Citation Counts Rankings
Rankings
239,599
Netherlands
5,376
8
Ranking Based On Selection: 7
Michael Engel
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,517
1,447
0.320
* Total Citation Counts Rankings
Rankings
299,517
Netherlands
6,457
11
Ranking Based On Selection: 8
Steven G. Hansen
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,512
502
0.143
photolithography
simulation
photoresis
* Total Citation Counts Rankings
Rankings
311,823
Netherlands
6,655
12
Ranking Based On Selection: 9
Achim Woessner
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,348
1,911
0.571
lithography
patterning
voltage contras
* Total Citation Counts Rankings
Rankings
322,689
Netherlands
6,859
15
Ranking Based On Selection: 10
Jingshi Li
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,214
1,051
0.327
Optical Communications
optical detectio

Smart Institutional Plan

Powerful Insights + Smart Membership = Institutional Success
Unlock 360° Real-Time Institutional Analysis to identify your institution’s strengths and areas for improvement.

* Total Citation Counts Rankings
Rankings
330,079
Netherlands
6,959
18
Ranking Based On Selection: 11
Robert Socha
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,128
378
0.121
* Total Citation Counts Rankings
Rankings
337,415
Netherlands
7,083
19
Ranking Based On Selection: 12
Isis Ledezma-Yanez
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,043
2,173
0.714
Electrochemistry
Physicochemistr
* Total Citation Counts Rankings
Rankings
355,481
Netherlands
7,389
20
Ranking Based On Selection: 13
Steven E. Steen
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,854
751
0.263
Lithography
3D integration
semiconductors
process
photovoltaic
* Total Citation Counts Rankings
Rankings
359,921
Netherlands
7,457
21
Ranking Based On Selection: 14
Mark Van De Kerkhof|M van de Kerkhof, Marcus van de Kerkhof, Marcus Adrianus van de Kerkhof
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,810
1,279
0.455
* Total Citation Counts Rankings
Rankings
362,617
Netherlands
7,499
22
Ranking Based On Selection: 15
Awm (Jos) Van Schijndel
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,784
1,073
0.385
comsol
matlab
simulink
modeling
simulatio
* Total Citation Counts Rankings
Rankings
379,673
Netherlands
7,759
24
Ranking Based On Selection: 16
Ws Christian Roelofs
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,626
690
0.263
* Total Citation Counts Rankings
Rankings
380,167
Netherlands
7,768
25
Ranking Based On Selection: 17
Ilias Katsouras
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,621
1,576
0.601
* Total Citation Counts Rankings
Rankings
440,500
Netherlands
8,723
27
Ranking Based On Selection: 18
Carlo Luijten
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,151
628
0.292
Optische lithografie
warmte en stromin
* Total Citation Counts Rankings
Rankings
444,388
Netherlands
8,783
28
Ranking Based On Selection: 19
Inci Donmez Noyan
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,124
1,073
0.505
* Total Citation Counts Rankings
Rankings
444,906
Netherlands
8,791
29
Ranking Based On Selection: 20
Stephen D. Hsu
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,121
507
0.239
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement techniqu
* Total Citation Counts Rankings
Rankings
457,673
Netherlands
8,992
31
Ranking Based On Selection: 21
Michael Lercel
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,038
173
0.085
Semiconductor lithography
metrology
and inspectio
* Total Citation Counts Rankings
Rankings
458,133
Netherlands
9,001
32
Ranking Based On Selection: 22
Tristan Mes
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,035
921
0.453
* Total Citation Counts Rankings
Rankings
472,426
Netherlands
9,216
34
Ranking Based On Selection: 23
Victor Dolk
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,948
1,422
0.730
* Total Citation Counts Rankings
Rankings
477,173
Netherlands
9,299
36
Ranking Based On Selection: 24
Alex Schafgans
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,921
704
0.366
EUV Lithography
laser produced plasm
* Total Citation Counts Rankings
Rankings
513,314
Netherlands
9,814
38
Ranking Based On Selection: 25
Seong Chan Kim
       Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,725
726
0.421