Discover the world’s highly cited researchers through the AD Scientific Index 2025 Citation Rankings.
These rankings evaluate scientists based on their total and recent citation counts, capturing the breadth and real-time currency of academic recognition. Citation data reveals how widely a scholar’s work is referenced, applied, and extended across diverse disciplines. The rankings are routinely updated to reflect ongoing citation growth, while eliminating distortions from excessive co-authorship and institutional inflation. Premium tools provide access to detailed citation dynamics, unethical citation behavior detection, and field-normalized benchmarking.
* Total Citation Counts Rankings
Ranking Based On Selection: 1

EU
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,433
1,759
0.273
* Total Citation Counts Rankings
Ranking Based On Selection: 2

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,318
1,322
0.209
* Total Citation Counts Rankings
Ranking Based On Selection: 3

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,103
1,427
0.234
* Total Citation Counts Rankings
Ranking Based On Selection: 4

Microlithography for integrated circuit productio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,865
633
0.108
* Total Citation Counts Rankings
Ranking Based On Selection: 5

Correlated electron systems
Lithograph
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,404
1,678
0.311
* Total Citation Counts Rankings
Ranking Based On Selection: 6

Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysi
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,558
2,123
0.466
* Total Citation Counts Rankings
Ranking Based On Selection: 7

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,517
1,447
0.320
* Total Citation Counts Rankings
Ranking Based On Selection: 8

photolithography
simulation
photoresis
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,512
502
0.143
* Total Citation Counts Rankings
Ranking Based On Selection: 9

lithography
patterning
voltage contras
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,348
1,911
0.571
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* Total Citation Counts Rankings
Ranking Based On Selection: 10

Optical Communications
optical detectio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,214
1,051
0.327
* Total Citation Counts Rankings
Ranking Based On Selection: 11

lithograph
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,128
378
0.121
* Total Citation Counts Rankings
Ranking Based On Selection: 12

Electrochemistry
Physicochemistr
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,043
2,173
0.714
* Total Citation Counts Rankings
Ranking Based On Selection: 13

Lithography
3D integration
semiconductors
process
photovoltaic
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,854
751
0.263
* Total Citation Counts Rankings
Ranking Based On Selection: 14

EUV
Lithography
Plasm
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,810
1,279
0.455
* Total Citation Counts Rankings
Ranking Based On Selection: 15

comsol
matlab
simulink
modeling
simulatio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,784
1,073
0.385
* Total Citation Counts Rankings
Ranking Based On Selection: 16

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,626
690
0.263
* Total Citation Counts Rankings
Ranking Based On Selection: 17

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,621
1,576
0.601
* Total Citation Counts Rankings
Ranking Based On Selection: 18

Optische lithografie
warmte en stromin
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,151
628
0.292
* Total Citation Counts Rankings
Ranking Based On Selection: 19

Thin films
MEM
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,124
1,073
0.505
* Total Citation Counts Rankings
Ranking Based On Selection: 20

DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement techniqu
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,121
507
0.239
* Total Citation Counts Rankings
Ranking Based On Selection: 21

Semiconductor lithography
metrology
and inspectio
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,038
173
0.085
* Total Citation Counts Rankings
Ranking Based On Selection: 22

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,035
921
0.453
* Total Citation Counts Rankings
Ranking Based On Selection: 23

Control system
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,948
1,422
0.730
* Total Citation Counts Rankings
Ranking Based On Selection: 24

EUV Lithography
laser produced plasm
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,921
704
0.366
* Total Citation Counts Rankings
Ranking Based On Selection: 25

Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,725
726
0.421
Vadim Banine
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,433
1,759
0.273
Stefan Hunsche
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,318
1,322
0.209
Liang Wang
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
6,103
1,427
0.234
Timothy A. Brunner
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,865
633
0.108
Wolter Siemons
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
5,404
1,678
0.311
Farzad Fareed|Farzad Behafarid
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,558
2,123
0.466
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysi
Michael Engel
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
4,517
1,447
0.320
Steven G. Hansen
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,512
502
0.143
Achim Woessner
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,348
1,911
0.571
Jingshi Li
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,214
1,051
0.327
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Robert Socha
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,128
378
0.121
Isis Ledezma-Yanez
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
3,043
2,173
0.714
Steven E. Steen
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,854
751
0.263
Lithography
3D integration
semiconductors
process
photovoltaic
Mark Van De Kerkhof|M van de Kerkhof, Marcus van de Kerkhof, Marcus Adrianus van de Kerkhof
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,810
1,279
0.455
Awm (Jos) Van Schijndel
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,784
1,073
0.385
Ws Christian Roelofs
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,626
690
0.263
Ilias Katsouras
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,621
1,576
0.601
Carlo Luijten
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,151
628
0.292
Inci Donmez Noyan
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,124
1,073
0.505
Stephen D. Hsu
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,121
507
0.239
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement techniqu
Michael Lercel
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,038
173
0.085
Tristan Mes
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
2,035
921
0.453
Victor Dolk
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,948
1,422
0.730
Alex Schafgans
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,921
704
0.366
Seong Chan Kim
ASML Holding
Veldhoven, Netherlands
Citation Metrics
Total
Last 6 Years
Last 6 Years / Total
1,725
726
0.421