ASM International is a
prestigious company university
established in 1913 in Netherlands. It is represented
by 40 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (11 scientists), Natural Sciences (2 scientists), and Medical and Health Sciences (0 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 1
Materials Chemistry
Thin Films
ALD
Surface Chemistry
Lab and Synchrotron Based X-ray Characterization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
20
0.952
* Total H Index Rankings
Ranking Based
On Selection: 2
Materials Science
Thin Films
Thermoelectrics
Energy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
* Total H Index Rankings
Ranking Based
On Selection: 3
OSCs
Ferroelectrics
Ultra high k materials
2D material
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
* Total H Index Rankings
Ranking Based
On Selection: 4
Nano materials
MOSFET
PEALD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
* Total H Index Rankings
Ranking Based
On Selection: 5
Etching
Compound Semiconductor
Low-k materials
Thin films
PECVD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
* Total H Index Rankings
Ranking Based
On Selection: 6
Nanotechnology
Materials Science
Microelectronics And Semiconductor Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
2
0.667
Ranjith K. Ramachandran
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
20
0.952
Materials Chemistry
Thin Films
ALD
Surface Chemistry
Lab and Synchrotron Based X-ray Characterization
Tommi Tynell
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
Materials Science
Thin Films
Thermoelectrics
Energy
Alessandra Leonhardt
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
OSCs
Ferroelectrics
Ultra high k materials
2D material
Taehee Yoo
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
Nano materials
MOSFET
PEALD
Robinson James
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Etching
Compound Semiconductor
Low-k materials
Thin films
PECVD
Wa Verweij
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
2
0.667
Nanotechnology
Materials Science
Microelectronics And Semiconductor Engineering