ASM International is a
prestigious company university
established in 1913 in Netherlands. It is represented
by 41 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (11 scientists), Natural Sciences (2 scientists), and Medical and Health Sciences (0 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
19
0.442
* Total H Index Rankings
Ranking Based
On Selection :2
Semiconductor Technology and Device Integration
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
35
0.833
* Total H Index Rankings
Ranking Based
On Selection :3
Semiconductors
Atomic Layer Deposition
High-k Gate Dielectrics
Plasma Deposition
Thermal Deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
29
0.879
* Total H Index Rankings
Ranking Based
On Selection :4
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
23
0.958
* Total H Index Rankings
Ranking Based
On Selection :5
thin film
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
16
0.696
* Total H Index Rankings
Ranking Based
On Selection :6
Materials Chemistry
Thin Films
ALD
Surface Chemistry
Lab and Synchrotron Based X-ray Characterization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
19
0.950
* Total H Index Rankings
Ranking Based
On Selection :7
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
15
0.750
* Total H Index Rankings
Ranking Based
On Selection :8
Semicon thin film process
Renewable energy
Supercapacitor
Nano materials
Thin film transistor
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
14
0.700
* Total H Index Rankings
Ranking Based
On Selection :9
Atomic Layer Deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
18
0.947
* Total H Index Rankings
Ranking Based
On Selection :10
Microelectronics & Nanotechnologies
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
13
0.765
* Total H Index Rankings
Ranking Based
On Selection :11
Atomic layer deposition
initiated chemical vapor deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
* Total H Index Rankings
Ranking Based
On Selection :12
Materials Science
Thin Films
Thermoelectrics
Energy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
* Total H Index Rankings
Ranking Based
On Selection :13
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
* Total H Index Rankings
Ranking Based
On Selection :14
OSCs
Ferroelectrics
Ultra high k materials
2D material
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
* Total H Index Rankings
Ranking Based
On Selection :15
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
* Total H Index Rankings
Ranking Based
On Selection :16
Atomic layer deposition
Plasma processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
12
0.923
* Total H Index Rankings
Ranking Based
On Selection :17
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
* Total H Index Rankings
Ranking Based
On Selection :18
Semiconductor Process/Process Integration Technology (3D NAND and Logic
BEOL)
micro-LED Fabrication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
* Total H Index Rankings
Ranking Based
On Selection :19
ALD
Epitaxy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
* Total H Index Rankings
Ranking Based
On Selection :20
Atomic Layer Deposition and applications
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
* Total H Index Rankings
Ranking Based
On Selection :21
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
* Total H Index Rankings
Ranking Based
On Selection :22
ALD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
* Total H Index Rankings
Ranking Based
On Selection :23
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
* Total H Index Rankings
Ranking Based
On Selection :24
Mechanical Engineering
Materials Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
* Total H Index Rankings
Ranking Based
On Selection :25
Material Chemistry
Nano Structure
Thin Film Processing
Microscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Vamsi Paruchuri
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
19
0.442
Michael E. Givens
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
35
0.833
Shankar Swaminathan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
29
0.879
Semiconductors
Atomic Layer Deposition
High-k Gate Dielectrics
Plasma Deposition
Thermal Deposition
Chiyu Zhu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
23
0.958
Andrea Illiberi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
16
0.696
Ranjith K. Ramachandran
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
19
0.950
Materials Chemistry
Thin Films
ALD
Surface Chemistry
Lab and Synchrotron Based X-ray Characterization
Mikas Remeika
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
15
0.750
Hyuck Lim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
14
0.700
Semicon thin film process
Renewable energy
Supercapacitor
Nano materials
Thin film transistor
Delphine Longrie
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
18
0.947
Andrey Shchepetov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
13
0.765
Microelectronics & Nanotechnologies
Do Han Kim
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
12
0.706
Tommi Tynell
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
13
0.929
Materials Science
Thin Films
Thermoelectrics
Energy
Yoann Tomczak
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
Alessandra Leonhardt
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
OSCs
Ferroelectrics
Ultra high k materials
2D material
René Hj Vervuurt
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
Shuaidi Zhang
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
12
0.923
Shibesh Dutta
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Debanjan Jana
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Semiconductor Process/Process Integration Technology (3D NAND and Logic
BEOL)
micro-LED Fabrication
Krzysztof Kachel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
Devika Choudhury
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
Youngchol Byun
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
Joseph R. Nasr
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Kwang-Seok Ahn
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Amin Azimi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Mechanical Engineering
Materials Science
Yu Xu
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
9
1.000
Material Chemistry
Nano Structure
Thin Film Processing
Microscopy