ASM International is a
prestigious company university
established in 1913 in Netherlands. It is represented
by 40 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (11 scientists), Natural Sciences (2 scientists), and Medical and Health Sciences (0 scientists).
* Total H Index Rankings
Ranking Based
On Selection: 1
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
18
0.419
* Total H Index Rankings
Ranking Based
On Selection: 2
Semiconductor Technology and Device Integration
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
36
0.857
* Total H Index Rankings
Ranking Based
On Selection: 3
Semiconductors
Atomic Layer Deposition
High-k Gate Dielectrics
Plasma Deposition
Thermal Deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
27
0.794
* Total H Index Rankings
Ranking Based
On Selection: 4
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
23
0.958
* Total H Index Rankings
Ranking Based
On Selection: 5
thin film
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
14
0.609
* Total H Index Rankings
Ranking Based
On Selection: 6
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
14
0.700
* Total H Index Rankings
Ranking Based
On Selection: 7
Atomic Layer Deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
18
0.947
* Total H Index Rankings
Ranking Based
On Selection: 8
Atomic layer deposition
initiated chemical vapor deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
11
0.647
* Total H Index Rankings
Ranking Based
On Selection: 9
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
* Total H Index Rankings
Ranking Based
On Selection: 10
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
* Total H Index Rankings
Ranking Based
On Selection: 11
Semiconductor Process/Process Integration Technology (3D NAND and Logic
BEOL)
micro-LED Fabrication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
10
0.714
* Total H Index Rankings
Ranking Based
On Selection: 12
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
10
0.714
* Total H Index Rankings
Ranking Based
On Selection: 13
ALD
Epitaxy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
* Total H Index Rankings
Ranking Based
On Selection: 14
Atomic layer deposition
Plasma processing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
12
0.923
* Total H Index Rankings
Ranking Based
On Selection: 15
Atomic Layer Deposition and applications
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
10
0.833
* Total H Index Rankings
Ranking Based
On Selection: 16
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
* Total H Index Rankings
Ranking Based
On Selection: 17
ALD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
* Total H Index Rankings
Ranking Based
On Selection: 18
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
* Total H Index Rankings
Ranking Based
On Selection: 19
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
* Total H Index Rankings
Ranking Based
On Selection: 20
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
* Total H Index Rankings
Ranking Based
On Selection: 21
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
* Total H Index Rankings
Ranking Based
On Selection: 22
Atomic Layer Deposition
Magnetism
Memory
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
* Total H Index Rankings
Ranking Based
On Selection: 23
III-V semiconductors
optical filters
chemical vapor deposition
atomic layer deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
* Total H Index Rankings
Ranking Based
On Selection: 24
Epitaxial growth of semiconductors
Material characterization
Electronic devices
Optoelectronic
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
* Total H Index Rankings
Ranking Based
On Selection: 25
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Vamsi Paruchuri
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
43
18
0.419
Michael E. Givens
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
36
0.857
Shankar Swaminathan
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
27
0.794
Semiconductors
Atomic Layer Deposition
High-k Gate Dielectrics
Plasma Deposition
Thermal Deposition
Chiyu Zhu
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
23
0.958
Andrea Illiberi
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
14
0.609
Mikas Remeika
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
14
0.700
Delphine Longrie
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
18
0.947
Do Han Kim
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
11
0.647
René Hj Vervuurt
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Shibesh Dutta
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
11
0.786
Debanjan Jana
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
10
0.714
Semiconductor Process/Process Integration Technology (3D NAND and Logic
BEOL)
micro-LED Fabrication
Yoann Tomczak
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
10
0.714
Krzysztof Kachel
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
13
1.000
Shuaidi Zhang
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
12
0.923
Devika Choudhury
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
10
0.833
Youngchol Byun
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
11
6
0.545
Joseph R. Nasr
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
10
1.000
Kwang-Seok Ahn
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
Lutz Muehlenbein
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Ville Liimatainen
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
Sidharth Reddy Karnati
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
Bart Vermeulen
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
Rochelle Lee
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
III-V semiconductors
optical filters
chemical vapor deposition
atomic layer deposition
Abheek Bardhan
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Epitaxial growth of semiconductors
Material characterization
Electronic devices
Optoelectronic
Davide Proserpio
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800