ASM International is a
prestigious company university
established in 1913 in Netherlands. It is represented
by 41 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (11 scientists), Natural Sciences (2 scientists), and Medical and Health Sciences (0 scientists).
* Total H Index Rankings
Ranking Based
On Selection :26
Nano materials
MOSFET
PEALD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
* Total H Index Rankings
Ranking Based
On Selection :27
ALD
ALE
Surface chemistry
2D materials
semiconductor devices
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
* Total H Index Rankings
Ranking Based
On Selection :28
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
* Total H Index Rankings
Ranking Based
On Selection :29
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
* Total H Index Rankings
Ranking Based
On Selection :30
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
* Total H Index Rankings
Ranking Based
On Selection :31
Atomic Layer Deposition
Magnetism
Memory
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
* Total H Index Rankings
Ranking Based
On Selection :32
Etching
Compound Semiconductor
Low-k materials
Thin films
PECVD
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
* Total H Index Rankings
Ranking Based
On Selection :33
III-V semiconductors
optical filters
chemical vapor deposition
atomic layer deposition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
* Total H Index Rankings
Ranking Based
On Selection :34
Epitaxy
CVD
ALD
HARC Dielectric Etch
XPS.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
4
0.667
* Total H Index Rankings
Ranking Based
On Selection :35
Nanotechnology
Material Science
Semiconductors
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection :36
Epitaxial growth of semiconductors
Material characterization
Electronic devices
Optoelectronic
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection :37
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
* Total H Index Rankings
Ranking Based
On Selection :38
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
* Total H Index Rankings
Ranking Based
On Selection :39
Semiconductors
PEALD
Thermal ALD
Epitaxy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
* Total H Index Rankings
Ranking Based
On Selection :40
Nanotechnology
Materials Science
Microelectronics And Semiconductor Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
2
0.667
* Total H Index Rankings
Ranking Based
On Selection :41
Artificial Intelligence
Computational Neuroscience
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Taehee Yoo
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
9
8
0.889
Nano materials
MOSFET
PEALD
Petro Deminskyi
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
ALD
ALE
Surface chemistry
2D materials
semiconductor devices
Lutz Muehlenbein
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
8
1.000
Ville Liimatainen
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
Sidharth Reddy Karnati
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
Bart Vermeulen
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
Robinson James
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
4
0.571
Etching
Compound Semiconductor
Low-k materials
Thin films
PECVD
Rochelle Lee
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
III-V semiconductors
optical filters
chemical vapor deposition
atomic layer deposition
Theodore J Kraus
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
4
0.667
Arpita Saha
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Nanotechnology
Material Science
Semiconductors
Abheek Bardhan
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Epitaxial growth of semiconductors
Material characterization
Electronic devices
Optoelectronic
De Guzmán-Caballero
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
5
1.000
Davide Proserpio
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
5
4
0.800
Chandra Nannuri
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Wa Verweij
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
3
2
0.667
Nanotechnology
Materials Science
Microelectronics And Semiconductor Engineering
Padraic Edgington
ASM International
Almere, Netherlands
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Artificial Intelligence
Computational Neuroscience