Carl Zeiss AG is a
prestigious company university
established in 1846 in Germany. It is represented
by 101 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (34 scientists), Natural Sciences (15 scientists), and Social Sciences and Humanities (3 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
plasma physics
ion beams
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
23
0.561
* Total H Index Rankings
Ranking Based
On Selection :2
Microscopy
Microanalysis
Metamorphic Geology
Geochemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
28
0.875
* Total H Index Rankings
Ranking Based
On Selection :3
optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
15
0.500
* Total H Index Rankings
Ranking Based
On Selection :4
Image processing
Automated segmentation
Automated quantification
Machine learning
Predictive modeling
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
29
1.000
* Total H Index Rankings
Ranking Based
On Selection :5
Bioprinting
Biofabrication
Biomaterials
Tissue Engineering
Biomedical Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
26
1.000
* Total H Index Rankings
Ranking Based
On Selection :6
phase shifting interferometry
ptychography
tomography
learning machines
coherent diffractive imaging
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
22
0.880
* Total H Index Rankings
Ranking Based
On Selection :7
Flow in Porous Media
Petroleum Engineering
Multiscale Imaging
Optical petrography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
23
0.958
* Total H Index Rankings
Ranking Based
On Selection :8
microscopy
superresolution
imaging
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
17
0.739
* Total H Index Rankings
Ranking Based
On Selection :9
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
17
0.773
* Total H Index Rankings
Ranking Based
On Selection :10
nanotechnology
imaging
FIB
TEM sample prep. nanofluidic
helium ion microscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
15
0.682
* Total H Index Rankings
Ranking Based
On Selection :11
Image Processing
Computerized Tomography
Energy Materials
Renewable Energy Systems
Machine
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
20
0.952
* Total H Index Rankings
Ranking Based
On Selection :12
Correlative Light and Electron Microscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
* Total H Index Rankings
Ranking Based
On Selection :13
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
18
0.857
* Total H Index Rankings
Ranking Based
On Selection :14
X-ray and Optics components
Nonvolatile memory and magnetic recording
Thin film and nano fabrication
MEMS and microwave devic
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
* Total H Index Rankings
Ranking Based
On Selection :15
metallurgy
laser material processing
additive manufacturing
laser cladding
rolling contact fatigue
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
* Total H Index Rankings
Ranking Based
On Selection :16
Control
Robotics
Reinforcement Learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
19
0.950
* Total H Index Rankings
Ranking Based
On Selection :17
energy materials
x-ray analysis
microscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
17
0.850
* Total H Index Rankings
Ranking Based
On Selection :18
Research
Innovation
Education
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
13
0.684
* Total H Index Rankings
Ranking Based
On Selection :19
Optics
Microscopy
Precision Metrology
X-ray Computed Tomography
Nondestructive Testing
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
17
0.944
* Total H Index Rankings
Ranking Based
On Selection :20
Computer Vision
Machine Learning
Deep Learning
Computer Science
Artificial Intelligence
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
14
0.778
* Total H Index Rankings
Ranking Based
On Selection :21
Family
Travel
Science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
5
0.278
* Total H Index Rankings
Ranking Based
On Selection :22
Materials Science and Engineering
Nanotechnology
Lithography
Beam Induced Processing
Ion Beams
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
15
0.882
* Total H Index Rankings
Ranking Based
On Selection :23
Coating
polymer
organic electronic/semiconductor
organic/inorganic synthesis
material science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
16
1.000
* Total H Index Rankings
Ranking Based
On Selection :24
Nanomaterial Characterization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
* Total H Index Rankings
Ranking Based
On Selection :25
Optics and photonics
Integrated Optics
silicon photonics
Electro-Optic Modulators
photonic integration
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
John A Notte
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
23
0.561
Rich Taylor
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
28
0.875
Microscopy
Microanalysis
Metamorphic Geology
Geochemistry
Michael Kempe
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
15
0.500
Luis De Sisternes
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
29
1.000
Image processing
Automated segmentation
Automated quantification
Machine learning
Predictive modeling
Tilman Ahlfeld (Tilman Von Strauwitz)|Tilman von Strauwitz, Tilman Ahlfeld
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
26
1.000
Bioprinting
Biofabrication
Biomaterials
Tissue Engineering
Biomedical Engineering
Michal Kronenberg (Odstrčil)
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
22
0.880
phase shifting interferometry
ptychography
tomography
learning machines
coherent diffractive imaging
Matthew Andrew
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
23
0.958
Flow in Porous Media
Petroleum Engineering
Multiscale Imaging
Optical petrography
Kai Wicker
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
17
0.739
Tilman Schmoll
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
17
0.773
Deying Xia
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
22
15
0.682
nanotechnology
imaging
FIB
TEM sample prep. nanofluidic
helium ion microscopy
Robin T. White
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
20
0.952
Image Processing
Computerized Tomography
Energy Materials
Renewable Energy Systems
Machine
Amita Gorur
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
Abouzar Eslami
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
18
0.857
Mojtaba Ranjbar
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
X-ray and Optics components
Nonvolatile memory and magnetic recording
Thin film and nano fabrication
MEMS and microwave devic
Edson Santos
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
16
0.762
metallurgy
laser material processing
additive manufacturing
laser cladding
rolling contact fatigue
Jonas Umlauft
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
19
0.950
Control
Robotics
Reinforcement Learning
Stephen T Kelly
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
17
0.850
energy materials
x-ray analysis
microscopy
Tobias Buehren
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
13
0.684
Herminso Villarraga-Gómez
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
17
0.944
Optics
Microscopy
Precision Metrology
X-ray Computed Tomography
Nondestructive Testing
Christian Wojek
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
14
0.778
Computer Vision
Machine Learning
Deep Learning
Computer Science
Artificial Intelligence
Douglas J. Fishkind
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
5
0.278
Brett B. Lewis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
15
0.882
Materials Science and Engineering
Nanotechnology
Lithography
Beam Induced Processing
Ion Beams
Hamed Sharifi Dehsari|Hamed Sharifi Dehsari
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
16
1.000
Coating
polymer
organic electronic/semiconductor
organic/inorganic synthesis
material science
Arul Maximus Rabel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
Heiner Zwickel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
13
0.813
Optics and photonics
Integrated Optics
silicon photonics
Electro-Optic Modulators
photonic integration