European XFEL GmbH is a
prestigious company university
established in 2009 in Germany. It is represented
by 60 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Natural Sciences (16 scientists), Engineering & Technology (2 scientists), and Medical and Health Sciences (1 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
X-ray spectroscopy
ultrafast dynamics
solvation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
48
32
0.667
* Total H Index Rankings
Ranking Based
On Selection :2
Accelerator based Research
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
23
0.523
* Total H Index Rankings
Ranking Based
On Selection :3
Computational Science
Data Science
Data Analysis
Reproducibility
Software Engineering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
30
0.714
* Total H Index Rankings
Ranking Based
On Selection :4
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
30
0.732
* Total H Index Rankings
Ranking Based
On Selection :5
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
32
0.821
* Total H Index Rankings
Ranking Based
On Selection :6
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
31
0.795
* Total H Index Rankings
Ranking Based
On Selection :7
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
31
0.886
* Total H Index Rankings
Ranking Based
On Selection :8
X-ray spectroscopy
free electron lasers
XFEL
warm dense matter
relativistic plasmas
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
29
0.829
* Total H Index Rankings
Ranking Based
On Selection :9
X-ray scattering
X-ray imaging
X-ray photon correlation spectroscopy
X-ray free-electron laser
Synchrotron radiation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
25
0.758
* Total H Index Rankings
Ranking Based
On Selection :10
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
27
0.871
* Total H Index Rankings
Ranking Based
On Selection :11
Ultrafast optical laser-matter interaction
surface dynamics
grazing-incidence x-ray FEL
plasma optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
21
0.700
* Total H Index Rankings
Ranking Based
On Selection :12
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
17
0.567
* Total H Index Rankings
Ranking Based
On Selection :13
Atomic and Molecular Physics. Free Electron Lasers
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
16
0.533
* Total H Index Rankings
Ranking Based
On Selection :14
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
26
0.897
* Total H Index Rankings
Ranking Based
On Selection :15
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
24
0.889
* Total H Index Rankings
Ranking Based
On Selection :16
mineral physics
spectroscopy
diffraction
synchrotron
FEL
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
25
0.962
* Total H Index Rankings
Ranking Based
On Selection :17
Ultrafast lasers & x-rays
higher harmonic generation
nonlinear light-matter interactions
emergent phenomena
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
22
0.917
* Total H Index Rankings
Ranking Based
On Selection :18
fisica acceleratori
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
19
0.792
* Total H Index Rankings
Ranking Based
On Selection :19
X-Rays
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
19
0.826
* Total H Index Rankings
Ranking Based
On Selection :20
condensed matter physics
soft matter physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
17
0.739
* Total H Index Rankings
Ranking Based
On Selection :21
Ultrafast magnetization dynamics
x-ray magnetic circular dichroism
x-ray magnetic linear dichroism
phase transition
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
* Total H Index Rankings
Ranking Based
On Selection :22
X-ray Scattering
X-ray Free-Electron Laser
X-ray Photon Correlation Spectroscopy
Small Angle X-ray Scattering
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
* Total H Index Rankings
Ranking Based
On Selection :23
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
* Total H Index Rankings
Ranking Based
On Selection :24
Photochemistry
Photophysics
X-ray Spectroscopy
Ultrafast Spectrsocopy
RIXS
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
* Total H Index Rankings
Ranking Based
On Selection :25
macromolecular X-ray crystallography
serial crystallography
structural biology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
Christopher Milne
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
48
32
0.667
Steve Aplin
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
23
0.523
Hans Fangohr
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
30
0.714
Computational Science
Data Science
Data Analysis
Reproducibility
Software Engineering
Adam Round
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
30
0.732
Adrian P. Mancuso
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
32
0.821
Christian Bressler
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
39
31
0.795
Tommaso Mazza
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
31
0.886
Ulf Zastrau
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
35
29
0.829
X-ray spectroscopy
free electron lasers
XFEL
warm dense matter
relativistic plasmas
Anders Madsen
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
25
0.758
X-ray scattering
X-ray imaging
X-ray photon correlation spectroscopy
X-ray free-electron laser
Synchrotron radiation
Richard J Bean
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
27
0.871
Motoaki Nakatsutsumi
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
21
0.700
Ultrafast optical laser-matter interaction
surface dynamics
grazing-incidence x-ray FEL
plasma optics
Joachim Schulz
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
17
0.567
Alberto De Fanis
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
16
0.533
Atomic and Molecular Physics. Free Electron Lasers
Johan Bielecki
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
26
0.897
Yevheniy Ovcharenko
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
24
0.889
Valerio Cerantola
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
25
0.962
Patrik Grychtol
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
22
0.917
Ultrafast lasers & x-rays
higher harmonic generation
nonlinear light-matter interactions
emergent phenomena
Barbara Marchetti
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
19
0.792
Ruslan Kurta
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
19
0.826
Alexey Zozulya
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
17
0.739
condensed matter physics
soft matter physics
Loí¯c Le Guyader
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
Ultrafast magnetization dynamics
x-ray magnetic circular dichroism
x-ray magnetic linear dichroism
phase transition
Johannes Möller
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
X-ray Scattering
X-ray Free-Electron Laser
X-ray Photon Correlation Spectroscopy
Small Angle X-ray Scattering
Yoonhee Kim
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
19
0.905
Benjamin E. Van Kuiken
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
Photochemistry
Photophysics
X-ray Spectroscopy
Ultrafast Spectrsocopy
RIXS
Huijong Han|huijeong han
European XFEL GmbH
Hamburg, Germany
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
21
17
0.810
macromolecular X-ray crystallography
serial crystallography
structural biology