Institut des Materiaux Jean Rouxel is a
prestigious institution university
established in 1988 in France. It is represented
by 50 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (16 scientists), Natural Sciences (15 scientists), and Medical and Health Sciences (0 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
Solid State Electrochemistry
Energy Storage
Material Science
Batteries
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
72
45
0.625
* Total H Index Rankings
Ranking Based
On Selection :2
Electrochimie
générateurs électrochimiques
batteries
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
52
39
0.750
* Total H Index Rankings
Ranking Based
On Selection :3
Nanocarbon
defects
modelling
science communication
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
52
32
0.615
* Total H Index Rankings
Ranking Based
On Selection :4
Solid State Chemistry and Physics
Material science
Resistive Switching
Correlated Materials
p-type Transparent Conductors.
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
33
0.750
* Total H Index Rankings
Ranking Based
On Selection :5
Solid State Chemistry
X ray diffraction
struture/property relationship
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
21
0.500
* Total H Index Rankings
Ranking Based
On Selection :6
nanomaterials
nanophysics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
19
0.463
* Total H Index Rankings
Ranking Based
On Selection :7
Electron microscopy
EELS
Li batteries
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
40
23
0.575
* Total H Index Rankings
Ranking Based
On Selection :8
DFT calculations
simulations and spectroscopies
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
38
21
0.553
* Total H Index Rankings
Ranking Based
On Selection :9
Hybrid O/I materials
Ionogels
Hydrogels
Energy storage
Biomaterials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
37
27
0.730
* Total H Index Rankings
Ranking Based
On Selection :10
nanostuctured transition metal oxides
solvothermal synthesis
thin films by low temperature chemical process
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
18
0.500
* Total H Index Rankings
Ranking Based
On Selection :11
Inorganic solid state chemistry
Magnetic properties of solids
Materials chemistry
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
18
0.529
* Total H Index Rankings
Ranking Based
On Selection :12
Nuclear Magnetic Resonance
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
26
0.788
* Total H Index Rankings
Ranking Based
On Selection :13
Solid State Chemistry Electrochemistry Inorganic and organic electroactive materials Batteries Supercapacitor
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
22
0.667
* Total H Index Rankings
Ranking Based
On Selection :14
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
19
0.576
* Total H Index Rankings
Ranking Based
On Selection :15
materials science
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
16
0.500
* Total H Index Rankings
Ranking Based
On Selection :16
matériaux
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
20
0.645
* Total H Index Rankings
Ranking Based
On Selection :17
Materials Science
Strongly correlated systems
Mottronics application (non-volatile memory
artificial neurons)
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
22
0.733
* Total H Index Rankings
Ranking Based
On Selection :18
physique des Matériaux - RRAM
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
20
0.667
* Total H Index Rankings
Ranking Based
On Selection :19
Thin films - Plasma processes - Microtechnology - Nanomaterials
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
16
0.571
* Total H Index Rankings
Ranking Based
On Selection :20
Thin layers of functionnal materials
RRAM memories
oxides
chalcogenides
physico-chemical characterization
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
15
0.556
* Total H Index Rankings
Ranking Based
On Selection :21
(cold -low pressure) plasma etching of materials
plasma-surface interaction mechanisms
surface analysis
plasma diagnostics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
14
0.519
* Total H Index Rankings
Ranking Based
On Selection :22
Inorganic chemistry
Crystallography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
21
0.808
* Total H Index Rankings
Ranking Based
On Selection :23
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
16
0.615
* Total H Index Rankings
Ranking Based
On Selection :24
Materials Science
Radiation Chemistry
Radiation Damage
Electron Microscopy
Molecular spectroscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
19
0.792
* Total H Index Rankings
Ranking Based
On Selection :25
Cold plasma processes
Nanotechnology
thin films
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
15
0.652
Dominique Guyomard
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
72
45
0.625
Solid State Electrochemistry
Energy Storage
Material Science
Batteries
Philippe Poizot
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
52
39
0.750
Electrochimie
générateurs électrochimiques
batteries
Chris Ewels
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
52
32
0.615
Laurent Cario
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
44
33
0.750
Solid State Chemistry and Physics
Material science
Resistive Switching
Correlated Materials
p-type Transparent Conductors.
Philippe Deniard
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
21
0.500
Solid State Chemistry
X ray diffraction
struture/property relationship
Jean-Luc Duvail
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
41
19
0.463
nanomaterials
nanophysics
Philippe Moreau
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
40
23
0.575
Florent Boucher
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
38
21
0.553
Jean LE BIDEAU
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
37
27
0.730
Hybrid O/I materials
Ionogels
Hydrogels
Energy storage
Biomaterials
Mireille Richard-Plouet
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
18
0.500
nanostuctured transition metal oxides
solvothermal synthesis
thin films by low temperature chemical process
Christophe PAYEN
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
34
18
0.529
Inorganic solid state chemistry
Magnetic properties of solids
Materials chemistry
Michaël Paris
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
26
0.788
Joel Gaubicher
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
22
0.667
Solid State Chemistry Electrochemistry Inorganic and organic electroactive materials Batteries Supercapacitor
Vincent Fernandez
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
33
19
0.576
Eric Faulques
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
32
16
0.500
Olivier JOUBERT
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
31
20
0.645
Etienne Janod
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
22
0.733
Materials Science
Strongly correlated systems
Mottronics application (non-volatile memory
artificial neurons)
benoit corraze
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
20
0.667
Pierre-Yves Tessier
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
16
0.571
Thin films - Plasma processes - Microtechnology - Nanomaterials
Besland MP
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
15
0.556
Thin layers of functionnal materials
RRAM memories
oxides
chalcogenides
physico-chemical characterization
Christophe Cardinaud
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
27
14
0.519
(cold -low pressure) plasma etching of materials
plasma-surface interaction mechanisms
surface analysis
plasma diagnostics
Romain Gautier
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
21
0.808
Inorganic chemistry
Crystallography
Pierre-Yves Jouan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
16
0.615
Patricia Abellan
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
24
19
0.792
Materials Science
Radiation Chemistry
Radiation Damage
Electron Microscopy
Molecular spectroscopy
Abdel-Aziz El Mel
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
23
15
0.652
Cold plasma processes
Nanotechnology
thin films