KLA is a
prestigious private university
established in 1995 in United States. It is represented
by 32 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (6 scientists), Natural Sciences (6 scientists), and Business & Management (1 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
Semiconductor
MEMS
Nanophotonics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
28
0.778
* Total H Index Rankings
Ranking Based
On Selection :2
Semiconductors
Graphene
RRAM
Materials Science
Physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
30
18
0.600
* Total H Index Rankings
Ranking Based
On Selection :3
Materials Science
Surface Chemistry
Nanomaterials
Catalysis
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
26
0.929
* Total H Index Rankings
Ranking Based
On Selection :4
carrier transport
thermal transport
thermochronology
luminescence dating
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
* Total H Index Rankings
Ranking Based
On Selection :5
Defect Inspection
Compound Semiconductor
Solar Energy Utilization
Perovskite Solar Cell
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
* Total H Index Rankings
Ranking Based
On Selection :6
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
11
0.550
* Total H Index Rankings
Ranking Based
On Selection :7
Semiconductors
Optical Physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
19
13
0.684
* Total H Index Rankings
Ranking Based
On Selection :8
nanoindentation
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
14
0.778
* Total H Index Rankings
Ranking Based
On Selection :9
Nanophotonics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
16
0.941
* Total H Index Rankings
Ranking Based
On Selection :10
Lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
6
0.353
* Total H Index Rankings
Ranking Based
On Selection :11
Laser induced damage
non-linear crystals
deep UV sensors. Nanomaterials
optoelectronic devices and characterisation tools
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
* Total H Index Rankings
Ranking Based
On Selection :12
Field Applications Engineer
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
* Total H Index Rankings
Ranking Based
On Selection :13
thermal physics
quantum optics
nanophotonics
phononics
ultrafast physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
* Total H Index Rankings
Ranking Based
On Selection :14
imaging
semiconductors
nanodevices
quantum information
quantum storage
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
8
0.615
* Total H Index Rankings
Ranking Based
On Selection :15
Atomic Physics
Plasma Physics
Optics
Radiation Sources
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
7
0.538
* Total H Index Rankings
Ranking Based
On Selection :16
Optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
7
0.538
* Total H Index Rankings
Ranking Based
On Selection :17
semiconductor manufacturing
low temperature plasmas
applied electromagnetics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
11
0.917
* Total H Index Rankings
Ranking Based
On Selection :18
Physics
EUV and X-ray optics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
* Total H Index Rankings
Ranking Based
On Selection :19
Fab Management
Semiconductors
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
* Total H Index Rankings
Ranking Based
On Selection :20
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
7
0.875
* Total H Index Rankings
Ranking Based
On Selection :21
Nano-fabrication
Semiconductor
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
* Total H Index Rankings
Ranking Based
On Selection :22
Signal Processing
Image Processing
Machine Learning
Pattern Recognition
Deep Learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
* Total H Index Rankings
Ranking Based
On Selection :23
FPGA
HPC
OpenCL
HLS
Stencil
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
* Total H Index Rankings
Ranking Based
On Selection :24
Algorithm
Software
Deep Learning
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
* Total H Index Rankings
Ranking Based
On Selection :25
Semiconductors
Wafer Inspection
Image processing
Machine learning
Design of Experiments
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Semiconductor
MEMS
Nanophotonics
Semiconductors
Graphene
RRAM
Materials Science
Physics
Materials Science
Surface Chemistry
Nanomaterials
Catalysis
Benny Guralnik
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
carrier transport
thermal transport
thermochronology
luminescence dating
Defect Inspection
Compound Semiconductor
Solar Energy Utilization
Perovskite Solar Cell
Bjorn Brauer
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
20
11
0.550
Jennifer Hay
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
18
14
0.778
Anatoly Burov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
17
6
0.353
Darren Chi Jin Neo
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
16
15
0.938
Laser induced damage
non-linear crystals
deep UV sensors. Nanomaterials
optoelectronic devices and characterisation tools
Filip Schleicher
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
15
15
1.000
thermal physics
quantum optics
nanophotonics
phononics
ultrafast physics
Florencia Pascual Winter
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
8
0.615
imaging
semiconductors
nanodevices
quantum information
quantum storage
Konstantin Tsigutkin
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
7
0.538
Atomic Physics
Plasma Physics
Optics
Radiation Sources
semiconductor manufacturing
low temperature plasmas
applied electromagnetics
Walan Grizolli
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
10
9
0.900
Nadine Asenbaum-Dörre
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
7
0.875
Ganesan Ramachandran
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
Signal Processing
Image Processing
Machine Learning
Pattern Recognition
Deep Learning
Hamid Reza Zohouri
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
7
7
1.000
Raghav Babulnath
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
5
0.833
Semiconductors
Wafer Inspection
Image processing
Machine learning
Design of Experiments