Tescan XRE is a
prestigious company university
established in 2018 in Belgium. It is represented
by 6 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (2 scientists), Business & Management (1 scientists), and Social Sciences and Humanities (1 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
X-ray tomography
in-situ imaging
flow in porous media
dynamic imaging
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
21
0.840
* Total H Index Rankings
Ranking Based
On Selection :2
Geology
computed tomography
material science
natural building stones
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
* Total H Index Rankings
Ranking Based
On Selection :3
materials science - microscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
* Total H Index Rankings
Ranking Based
On Selection :4
Material Science
metallurgy
electron microscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
* Total H Index Rankings
Ranking Based
On Selection :5
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
4
0.667
* Total H Index Rankings
Ranking Based
On Selection :6
Nanofabrication
Nanotechnology
electron microscopy
focused ion beam
electron beam lithography
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Marijn A. Boone
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
21
0.840
X-ray tomography
in-situ imaging
flow in porous media
dynamic imaging
Wesley De Boever
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
13
11
0.846
Geology
computed tomography
material science
natural building stones
Jaroslav Kastyl
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
12
12
1.000
materials science - microscopy
Albert Duncan Smith
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Material Science
metallurgy
electron microscopy
Nabi Nabiollahi
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
6
4
0.667
Nanofabrication
Nanotechnology
electron microscopy
focused ion beam
electron beam lithography