V. Ye. Lashkaryov Institute of Semiconductor Physics is a
prestigious institution university
established in 1960 in Ukraine. It is represented
by 6 scientists in the AD Scientific Index. The
university’s scientists are particularly concentrated in
Engineering & Technology (2 scientists), Natural Sciences (2 scientists), and Medical and Health Sciences (0 scientists).
* Total H Index Rankings
Ranking Based
On Selection :1
semiconductors
Raman spectroscopy
nanoparticles
photoluminescence
photoelectron spectroscopy
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
31
0.738
* Total H Index Rankings
Ranking Based
On Selection :2
Physics of Semiconductors
Optics
Raman Scattering
Nanostructures
Optical Diagnostics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
22
0.611
* Total H Index Rankings
Ranking Based
On Selection :3
physics
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
14
0.483
* Total H Index Rankings
Ranking Based
On Selection :4
nanotechnology
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
16
0.571
* Total H Index Rankings
Ranking Based
On Selection :5
Material Characterization
Nanostructured Materials
Thin Films and Nanotechnology
Atomic Force Microscopy
Scanning Probe Micr
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
16
0.615
* Total H Index Rankings
Ranking Based
On Selection :6
Ir and THz Physics
Physics of Semiconductors
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
14
0.560
Volodymyr Dzhagan|Володимир Джаган
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
42
31
0.738
semiconductors
Raman spectroscopy
nanoparticles
photoluminescence
photoelectron spectroscopy
Mykhailo Valakh
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
36
22
0.611
Physics of Semiconductors
Optics
Raman Scattering
Nanostructures
Optical Diagnostics
Belyaev AE
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
29
14
0.483
AN Nazarov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
28
16
0.571
PM Lytvyn, PM Litvin, П М Литвин
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
26
16
0.615
Material Characterization
Nanostructured Materials
Thin Films and Nanotechnology
Atomic Force Microscopy
Scanning Probe Micr
Fedir Sizov
H-Index Metrics
Total
Last 6 Years
Last 6 Years / Total
25
14
0.560