i10 Productivity
Rankings
ASML Holding Scientists i10 Productivity Rankings (Sort by last 6 years i10 Index) 2024
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Click for "last 6 years' i10 index". Also see: Universities Rankings 2024 (Sort by : Total i10 Index) and Universities Rankings 2024 (Sort by : Last 6 Years i10 Index)
Computational Science
Numerical Simulation
Software Engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
Nanotechnology
Helium ion Microscopy
Graphene
AFM
Optical CD & Overlay Metrology
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
smart materials
morphing structures
laminated composites
mechanical design
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Motion Control
Nonlinear/Hybrid Systems and Control
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Embedded Systems
Wireless Sensor Networks
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Light-Matter Interaction
Advanced Manufacturing
Electron Optics
Surface Plasmonic Polariton
Quantum physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Software engineering
Software testing
Model-based testing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Condensed matter physics
Spintronics
Nanoscience
Graphene
Solid-state physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Computational Physics and Chemistry
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Energy conversion
nanotechnology
nanomaterials
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
semiconductor lithography
III-V semiconductors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
5
0.238
EUV patterning control & metrology
CMP
nanotechnology
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
13
5
0.385
Formal methods
Graph transformation
Data flow models
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
12
5
0.417
Robust control
Signal processing
Fault diagnosis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
Semiconductors
machine overlay
Optics
Medical ultrasound
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
Thin films
Optical coatings
Plasma Etch
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
nanophotonics
metamaterials
photolithography
metrology
stochastics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
5
0.556
Controls
System Identification
Automation
Wind Turbines
Trajectory Optimization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
5
0.556
Data Science
Machine Learning
Signal Processing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
5
0.625
Material science and engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
5
0.625
Electron Microscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
Machine learning
Data mining
Complex networks
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
Liesbeth Vanherpe
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
6
0.750
Computational Science
Numerical Simulation
Software Engineering
Gaurav Nanda
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Nanotechnology
Helium ion Microscopy
Graphene
AFM
Optical CD & Overlay Metrology
Venkata Siva Chillara
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
smart materials
morphing structures
laminated composites
mechanical design
Ruud Beerens
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Motion Control
Nonlinear/Hybrid Systems and Control
Rasool Tavakoli
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Embedded Systems
Wireless Sensor Networks
Zhidong Du
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Light-Matter Interaction
Advanced Manufacturing
Electron Optics
Surface Plasmonic Polariton
Quantum physics
Carlos Diego Nascimento Damasceno|Carlos Diego N. Damasceno, Carlos Diego Damasceno, C.D.N. Damasceno
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
6
0.857
Software engineering
Software testing
Model-based testing
Kumar Sourav Das
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Condensed matter physics
Spintronics
Nanoscience
Graphene
Solid-state physics
Xiangyun Amy Chen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Ian S. Dunn
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Computational Physics and Chemistry
Hatem Brahmi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
6
1.000
Energy conversion
nanotechnology
nanomaterials
Lukasz Macht
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
21
5
0.238
Haiyan Li
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
13
5
0.385
EUV patterning control & metrology
CMP
nanotechnology
Amirhossein Ghamarian
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
12
5
0.417
Formal methods
Graph transformation
Data flow models
Amol A. Khalate
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
Guido Salmaso
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
5
0.455
Shreyas Raghunathan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
Ping Kuang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
5
0.500
Thin films
Optical coatings
Plasma Etch
Ruben Maas
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
5
0.556
nanophotonics
metamaterials
photolithography
metrology
stochastics
Ivo Houtzager
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
5
0.556
Controls
System Identification
Automation
Wind Turbines
Trajectory Optimization
Vahid Bastani
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
5
0.625
Data Science
Machine Learning
Signal Processing
Shao-Wei Fu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
5
0.625
Material science and engineering
Zahra Karevan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
5
0.714
Machine learning
Data mining
Complex networks