i10 Productivity
Rankings

ASML Holding Scientists i10 Productivity Rankings 2025

Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Additionally, click to view the special rankings based on Productivity Rankings: last 6 years' i10 index", Universities Rankings 2024 (Sort by : Total i10 Index), Universities Rankings 2024 (Sort by : Last 6 Years i10 Index) "Art and Humanities Rankings" and "Social Sciences and Humanities Rankings"

* Total i10 IndexRankings
Ranking Based On Selection :1
Netherlands
Vadim Banine
EUV
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
154
50
0.325
* Total i10 IndexRankings
Ranking Based On Selection :2
Netherlands
Timothy A. Brunner
Microlithography for integrated circuit production
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
15
0.135
* Total i10 IndexRankings
Ranking Based On Selection :3
Netherlands
Liang Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
101
38
0.376
* Total i10 IndexRankings
Ranking Based On Selection :4
Netherlands
Qinghuang Lin
materials science
patterning
devices
systems
life sciences
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
88
35
0.398
* Total i10 IndexRankings
Ranking Based On Selection :5
Netherlands
Robert Socha
lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
84
14
0.167
* Total i10 IndexRankings
Ranking Based On Selection :6
Netherlands
Steven G. Hansen
photolithography
simulation
photoresist
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
70
18
0.257
* Total i10 IndexRankings
Ranking Based On Selection :7
Netherlands
Stefan Hunsche
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
67
29
0.433
* Total i10 IndexRankings
Ranking Based On Selection :8
Netherlands
Harmke De Groot
IoT
connectivity
sensors
sensor fusion
innovation management
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
62
36
0.581
* Total i10 IndexRankings
Ranking Based On Selection :9
Netherlands
Christopher Spence
Lithography
Metrology
Photomasks
Amorphous Materials
Polymer Chemistry/Dynamics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
61
9
0.148
* Total i10 IndexRankings
Ranking Based On Selection :10
Netherlands
Stephen D. Hsu
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
60
14
0.233
* Total i10 IndexRankings
Ranking Based On Selection :11
Netherlands
Viktor Chikan
physical chemistry
nanotechnology
laser spectroscopy
cancer research and drug delivery
EUV
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
52
35
0.673
* Total i10 IndexRankings
Ranking Based On Selection :12
Netherlands
Awm (Jos) Van Schijndel
comsol
matlab
simulink
modeling
simulation
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
48
26
0.542
* Total i10 IndexRankings
Ranking Based On Selection :13
Netherlands
Se-Heon Kim
photonics
nanotechnology
optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
15
0.326
* Total i10 IndexRankings
Ranking Based On Selection :15
Netherlands
Wolter Siemons
Correlated electron systems
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
44
31
0.705
* Total i10 IndexRankings
Ranking Based On Selection :16
Netherlands
Yuanqing Yang
Nanophotonics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
39
35
0.897
* Total i10 IndexRankings
Ranking Based On Selection :17
Netherlands
Carlo Luijten
Optische lithografie
warmte en stroming
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
22
0.579
* Total i10 IndexRankings
Ranking Based On Selection :18
Netherlands
Robert J. Rafac
atomic spectroscopy
optical frequency standards
lithography
plasma physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
13
0.342
* Total i10 IndexRankings
Ranking Based On Selection :19
Netherlands
Michael Lercel
Semiconductor lithography
metrology
and inspection
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
35
4
0.114
* Total i10 IndexRankings
Ranking Based On Selection :20
Netherlands
Amir Abdolvand
Quantum Coherent Control
Ultrafast Nonlinear Optics
Photonic Crystal Fibres
Coherent Raman Interaction
Spectroscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
26
0.788
* Total i10 IndexRankings
Ranking Based On Selection :21
Netherlands
Kiranmayee Kilaru
X-ray optics
optical design
optical metrology
differential deposition
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
25
0.758
* Total i10 IndexRankings
Ranking Based On Selection :22
Netherlands
Farzad Fareed|Farzad Behafarid
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
29
0.935
* Total i10 IndexRankings
Ranking Based On Selection :23
Netherlands
Ilias Katsouras
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
25
0.806
* Total i10 IndexRankings
Ranking Based On Selection :24
Netherlands
Alexander Ypma
Machine learning
Pattern recognition
Data mining
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
18
0.581
* Total i10 IndexRankings
Ranking Based On Selection :25
Netherlands
Alex Schafgans
EUV Lithography
laser produced plasma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 1
Vadim Banine
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
154
50
0.325
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 2
Timothy A. Brunner
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
15
0.135
Microlithography for integrated circuit production
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 3
Liang Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
101
38
0.376
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 4
Qinghuang Lin
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
88
35
0.398
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 5
Robert Socha
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
84
14
0.167
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 6
Steven G. Hansen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
70
18
0.257
photolithography
simulation
photoresist
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 7
Stefan Hunsche
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
67
29
0.433
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 8
Harmke De Groot
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
62
36
0.581
IoT
connectivity
sensors
sensor fusion
innovation management
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 9
Christopher Spence
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
61
9
0.148
Lithography
Metrology
Photomasks
Amorphous Materials
Polymer Chemistry/Dynamics
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 10
Stephen D. Hsu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
60
14
0.233
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 11
Viktor Chikan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
52
35
0.673
physical chemistry
nanotechnology
laser spectroscopy
cancer research and drug delivery
EUV
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 12
Awm (Jos) Van Schijndel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
48
26
0.542
comsol
matlab
simulink
modeling
simulation
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 13
Se-Heon Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
15
0.326
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 14
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 15
Wolter Siemons
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
44
31
0.705
Correlated electron systems
Lithography
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 16
Yuanqing Yang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
39
35
0.897
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 17
Carlo Luijten
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
22
0.579
Optische lithografie
warmte en stroming
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 18
Robert J. Rafac
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
38
13
0.342
atomic spectroscopy
optical frequency standards
lithography
plasma physics
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 19
Michael Lercel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
35
4
0.114
Semiconductor lithography
metrology
and inspection
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 20
Amir Abdolvand
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
26
0.788
Quantum Coherent Control
Ultrafast Nonlinear Optics
Photonic Crystal Fibres
Coherent Raman Interaction
Spectroscopy
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 21
Kiranmayee Kilaru
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
33
25
0.758
X-ray optics
optical design
optical metrology
differential deposition
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 22
Farzad Fareed|Farzad Behafarid
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
29
0.935
Thin films
optical modeling
interference coatings
Nano science and technology
Nano catalysis
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 23
Ilias Katsouras
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
25
0.806
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 24
Alexander Ypma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
18
0.581
Machine learning
Pattern recognition
Data mining
Lithography
* Total i10 Index Rankings
Rankings
Ranking Based On Selection: 25
Alex Schafgans
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
EUV Lithography
laser produced plasma