i10 Productivity
Rankings
ASML Holding/ ScientistsOthers i10 Productivity Rankings 2025
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Additionally, click to view the special rankings based on Productivity Rankings: Scientists Last 6 years' i10 Index", Universities Total i10 Index Rankings 2025, Universities Last 6 Years i10 Index Rankings 2025 "Art and Humanities i10 Productivity Rankings" and "Social Sciences and Humanities i10 Productivity Rankings".
* Total i10 IndexRankings
Ranking Based On Selection :126
Metrology
computational science
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
* Total i10 IndexRankings
Ranking Based On Selection :127
Computational Mechanics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
* Total i10 IndexRankings
Ranking Based On Selection :128
NMR MRI Physics Optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
* Total i10 IndexRankings
Ranking Based On Selection :129
Optical imaging
Image processing algorithm
Aberration correction
Interferometry
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
* Total i10 IndexRankings
Ranking Based On Selection :130
Precision Optics
Photonics
Metrology
Microscopy
Semiconductors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
* Total i10 IndexRankings
Ranking Based On Selection :131
Wide Bandgap Semiconductor
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :132
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :133
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :134
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :135
Optics
Lasers
Extreme Ultraviolet (EUV) generation and Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :136
Model based Controls
Robotics
Diagnostics
Fault Tolerance
Artificial Intelligence
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :137
Computer Graphics
Computer Vision
Machine Learning
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Total i10 IndexRankings
Ranking Based On Selection :138
Optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :139
Laser-induced Plasma Spectroscopy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :140
Materials
Microstructure
Damage
Quasi-static and Dynamic Mechanical Properties
Texture
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :141
Adaptive Optics
Wavefront Sensing
Imaging
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :142
Optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :143
fluid structure interaction
flow acoustics
multiphase flow
fluid network simulation
fluid transport network optimization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :144
Semiconductor
Metrology
Photonics
Sensors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
* Total i10 IndexRankings
Ranking Based On Selection :145
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
0
0
0
* Total i10 IndexRankings
Ranking Based On Selection :146
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
0
0
0
* Total i10 IndexRankings
Ranking Based On Selection :147
Thermal Control
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
0
0
0
Mehdi Nikbakht
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Hamidreza Javani
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Paul Knijn
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Yongwoo Kwon
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Optical imaging
Image processing algorithm
Aberration correction
Interferometry
Surya Prakash Gurunarayanan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
2
1.000
Qingwen Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Vivek Kumar Jain
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
Subhasish Sutradhar
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
Raj Kishor Patil
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Optics
Lasers
Extreme Ultraviolet (EUV) generation and Lithography
Priya Naik
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Model based Controls
Robotics
Diagnostics
Fault Tolerance
Artificial Intelligence
Umut Uyumaz
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Prashant Raman
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Behnam Shakerifard
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Materials
Microstructure
Damage
Quasi-static and Dynamic Mechanical Properties
Texture
Joseph Gallagher
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Chumeng Zheng
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
fluid structure interaction
flow acoustics
multiphase flow
fluid network simulation
fluid transport network optimization
Yassin Chowdhury
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
1
1
1.000
Mayk Van Den Hurk
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
0
0
0
Dinesh Kumar Parasuraman
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
0
0
0