Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Click for "last 6 years' i10 index". Also see: Universities Rankings 2024 (Sort by : Total i10 Index) and Universities Rankings 2024 (Sort by : Last 6 Years i10 Index)
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
3
0.333
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Nanofabrication
Multifunctional Devices
Flexible Printed Electronics
Molecular Electronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Optics and Photonics
Nanotechnology
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
computational optics
imaging and photography
laser
ultrafast and nonlinear optics
computational electromagnetics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Sensors
MEMS
semiconductors
lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
MEMS
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Computer Vision
Biomedical Image
Image Reconstruction
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
EUV
Photolithography
inkjet
condensed matter physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Mems
photonics
TEM
micro/nano fabrication
Photolithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Industrial Engineering
Supply Chain
Strategic Sourcing
Operations Management
Product Life Cycle Management
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Semiconductor Industry
Magnetic Materials
Materials Characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Alignment and Focus braches in semiconductor processing tools
Nanoelectronics
2D heterostructures
Spintronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Data Science
Machine Learning
Computer Vision
Deep Learning
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Active Vibration Control
Control Design and Implementation
Vibration measurement
Adaptive Control
Tensegrity Systems
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Nanotechnology
Semiconductor device
Semiconductor fabrication
2D materials
Graphene
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Physics
Optics
EUV
Photolithography
Data Analysis
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Fluid dynamics
Vacuum system
Semiconductor equipment
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Electronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Semiconductor Process
EUV
MEMS
Silicon Photonics
Optofluidic Sensing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
metallurgy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Rolf Jm Theunissen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
3
0.333
Jacek Kustra
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Vina Faramarzi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Nanofabrication
Multifunctional Devices
Flexible Printed Electronics
Molecular Electronics
Jen-Yi Wuu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
7
3
0.429
Anirban Mitra
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Nikhil Mehta
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
computational optics
imaging and photography
laser
ultrafast and nonlinear optics
computational electromagnetics
Georgios Zikos
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Joseph Zekry
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Tiannan Guan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
3
0.500
Haoyi Liang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Computer Vision
Biomedical Image
Image Reconstruction
Syarif Riyadi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
EUV
Photolithography
inkjet
condensed matter physics
Ahmet Koray Erdamar
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Mems
photonics
TEM
micro/nano fabrication
Photolithography
Javid Koochaki
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
3
0.600
Industrial Engineering
Supply Chain
Strategic Sourcing
Operations Management
Product Life Cycle Management
Semiconductor Industry
Magnetic Materials
Materials Characterization
Madhushankar Bn
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Alignment and Focus braches in semiconductor processing tools
Nanoelectronics
2D heterostructures
Spintronics
Alejandro Arrizabalaga
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Vladimir Osin
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Data Science
Machine Learning
Computer Vision
Deep Learning
Active Vibration Control
Control Design and Implementation
Vibration measurement
Adaptive Control
Tensegrity Systems
Sanghoon Park|Jaden Park
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Nanotechnology
Semiconductor device
Semiconductor fabrication
2D materials
Graphene
Faisal Nadeem
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Physics
Optics
EUV
Photolithography
Data Analysis
Dongchi Yu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Fluid dynamics
Vacuum system
Semiconductor equipment
Michiel Van Elzakker
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Aprizal Akbar Sengrian
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Shuling Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000
Semiconductor Process
EUV
MEMS
Silicon Photonics
Optofluidic Sensing
Mike Callahan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
3
1.000