i10 Productivity
Rankings
ASML Holding/ Scientists i10 Productivity Rankings 2024
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Click for "last 6 years' i10 index". Also see: Universities Rankings 2024 (Sort by : Total i10 Index) and Universities Rankings 2024 (Sort by : Last 6 Years i10 Index)
machine learning
structured data
data science
pattern recognition
AI
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
2
0.400
Ultracold Atoms
Extreme Ultraviolet Light (EUV)
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
2
0.400
quantum physics
condensed matter theory
microwave and THz microelectronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
EUV Lithography
Biomimetics
MEMS
Microsensors
Semiconductors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
computational lithography
distributed computing
blockchain
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Semiconductor Patterning / Nano Science and Technology
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Optics
Surface Physics
Plasmonics
Lithography
Metrology
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
0
0.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
EUV Lithography
Photonic Crystal Fibres
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Drop formation
multiphase flows
high speed microjet nozzle design
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Solid and fluid mechanics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
AI
Machine Learning
Kernel Methods
Manifold Learning
Deep Learning
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Lithography
Overlay
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Semiconductor Industry
Magnetic Materials
Materials Characterization
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Alignment and Focus braches in semiconductor processing tools
Nanoelectronics
2D heterostructures
Spintronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
photolithograhy
precision engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
liquid crystal
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
partially coherent light
aberration theory
Fourier optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
Dimitra Gkorou
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
2
0.400
machine learning
structured data
data science
pattern recognition
AI
Armin Ridinger
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
2
0.400
Ultracold Atoms
Extreme Ultraviolet Light (EUV)
Lorenzo Tripodi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
quantum physics
condensed matter theory
microwave and THz microelectronics
Ram Jaganatharaja
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Romain Cauchois
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
Shufeng Bai
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Mbjd Tavernier
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Taekwon Jee
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Todd R. Downey
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
0
0.000
Optics
Surface Physics
Plasmonics
Lithography
Metrology
Szu-Ying Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Nitin N. Edavalath
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
EUV Lithography
Photonic Crystal Fibres
Theo Driessen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Drop formation
multiphase flows
high speed microjet nozzle design
Maqsood Ameen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Arun Pandey
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
AI
Machine Learning
Kernel Methods
Manifold Learning
Deep Learning
Archana Sampath
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Milena Cervo Sulzbach
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
4
1.000
Alejandro Arrizabalaga
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Semiconductor Industry
Magnetic Materials
Materials Characterization
Madhushankar Bn
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
3
0.750
Alignment and Focus braches in semiconductor processing tools
Nanoelectronics
2D heterostructures
Spintronics
Mustafa Ümit Arabul
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
Guido Volleberg
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
Wan-Soo Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
2
0.500
Minyi Zhong
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250