i10 Productivity
Rankings

ASML Holding Scientists i10 Productivity Rankings (Sort by last 6 years i10 Index) 2025

Productivity Rankings is an exclusive service provided by AD Scientific Index. This ranking system, derived from the i10 index, highlights the productivity of scientists in publishing impactful scientific articles. Productivity Rankings serves as a tool to identify highly productive scientists across specific areas, disciplines, universities, and countries, and supports the creation of effective incentives and academic policies. The global, regional, and institutional rankings of scientists in this table are calculated based on their total i10 index. Moreover, you can explore special rankings derived from Productivity Rankings, such as Scientists Last 6 Years' i10 Index, Universities Total i10 Index Rankings 2025, Universities Last 6 Years' i10 Index Rankings 2025, Art and Humanities i10 Productivity Rankings, and Social Sciences and Humanities i10 Productivity Rankings.

* Last 6 Years i10 IndexRankings
Ranking Based On Selection :26
Netherlands
Hesan Vahedi
Power electronics
Controls
Hardware-In-The-Loop (HIL)
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
18
0.750
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :27
Netherlands
Juliane Reinhardt
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :28
Netherlands
Victor Dolk
Control systems
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
18
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :29
Netherlands
Alex Schafgans
EUV Lithography
laser produced plasma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :30
Netherlands
Alexander Ypma
Machine learning
Pattern recognition
Data mining
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
30
17
0.567
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :31
Netherlands
Seong Chan Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :32
Netherlands
Ye Tian
Optical Engineering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :33
Netherlands
Se-Heon Kim
photonics
nanotechnology
optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
16
0.348
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :34
Netherlands
Biran Wang
Nanotechnology
Materials Science
Contamination Control
Additive Manufacturing
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
16
0.800
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :35
Netherlands
Dmitry Kurilovich
Plasma physics
Laser physics
Fluid dynamics
EUV generation
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
16
0.941
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :36
Netherlands
Xu Yang
condensed matter physics
ultrafast spectroscopy
laser physics
superconductivity
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
16
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :37
Netherlands
Thomas Huisman
Optics
Magneto-Optics
Ultrafast Magnetism
Ultrafast Spintronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
16
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :38
Netherlands
Timothy A. Brunner
Microlithography for integrated circuit production
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
15
0.135
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :39
Netherlands
Mohsen Zafarani
Sr. Mechatronic Design Engineer
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
15
0.882
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :40
Netherlands
Robert Socha
lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
84
14
0.167
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :41
Netherlands
Stephen D. Hsu
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
60
14
0.233
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :42
Netherlands
Ilaria Cardinaletti
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
14
0.824
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :43
Netherlands
Achim Woessner
lithography
patterning
voltage contrast
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
14
1.000
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :44
Netherlands
Robert J. Rafac
atomic spectroscopy
optical frequency standards
lithography
plasma physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
37
13
0.351
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :45
Netherlands
Martin Jurna
Applied Optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
23
13
0.565
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :46
Netherlands
Onur Kuzucu
Optics
nanophotonics
solid-state lasers
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
13
0.765
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :47
Netherlands
Bilal Mokrani
Structural control
vibration control
Mechatronics.
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :48
Netherlands
Timur Tudorovskiy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
12
0.632
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :49
Netherlands
Ulas Kürüm
Non-linear Optics
Photonics
Electro-optical Systems
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :50
Netherlands
Li-Hao Yeh
Computational imaging
Label-free microscopy
Optics
Lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 26
Hesan Vahedi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
18
0.750
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 27
Juliane Reinhardt
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
18
0.900
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 28
Victor Dolk
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
18
18
1.000
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 29
Alex Schafgans
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
31
17
0.548
EUV Lithography
laser produced plasma
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 30
Alexander Ypma
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
30
17
0.567
Machine learning
Pattern recognition
Data mining
Lithography
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 31
Seong Chan Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 32
Ye Tian
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
24
17
0.708
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 33
Se-Heon Kim
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
46
16
0.348
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 34
Biran Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
20
16
0.800
Nanotechnology
Materials Science
Contamination Control
Additive Manufacturing
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 35
Dmitry Kurilovich
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
16
0.941
Plasma physics
Laser physics
Fluid dynamics
EUV generation
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 36
Xu Yang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
16
1.000
condensed matter physics
ultrafast spectroscopy
laser physics
superconductivity
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 37
Thomas Huisman
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
16
16
1.000
Optics
Magneto-Optics
Ultrafast Magnetism
Ultrafast Spintronics
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 38
Timothy A. Brunner
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
111
15
0.135
Microlithography for integrated circuit production
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 39
Mohsen Zafarani
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
15
0.882
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 40
Robert Socha
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
84
14
0.167
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 41
Stephen D. Hsu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
60
14
0.233
DUV EUV lithography
computational lithography
source mask optimization
multiple patterning
resolution enhancement technique
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 42
Ilaria Cardinaletti
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
14
0.824
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 43
Achim Woessner
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
14
1.000
lithography
patterning
voltage contrast
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 44
Robert J. Rafac
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
37
13
0.351
atomic spectroscopy
optical frequency standards
lithography
plasma physics
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 45
Martin Jurna
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
23
13
0.565
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 46
Onur Kuzucu
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
17
13
0.765
Optics
nanophotonics
solid-state lasers
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 47
Bilal Mokrani
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
13
0.867
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 48
Timur Tudorovskiy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
19
12
0.632
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 49
Ulas Kürüm
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
15
12
0.800
* Last 6 Years i10 Index Rankings
Rankings
Ranking Based On Selection: 50
Li-Hao Yeh
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
12
0.857
Computational imaging
Label-free microscopy
Optics
Lithography