i10 Productivity
Rankings
ASML Holding Scientists i10 Productivity Rankings (Sort by last 6 years i10 Index) 2025
Productivity Rankings is a unique service offered only by “AD Scientific Index”. This is a ranking system derived from the i10 index in order to show the productivity of the scientist in publishing scientific articles of value. Productivity Rankings is an instrument that lists productive scientists in a given area, discipline, university, and country and can guide the development of meaningful incentives and academic policies. The world rankings, regional rankings, and university rankings of scientists in this table are developed based on the total i10 index. Additionally, click to view the special rankings based on Productivity Rankings: Scientists Last 6 years' i10 Index", Universities Total i10 Index Rankings 2025, Universities Last 6 Years i10 Index Rankings 2025 "Art and Humanities i10 Productivity Rankings" and "Social Sciences and Humanities i10 Productivity Rankings".
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :251
Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
1
0.071
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :252
Optics
Laser Physics
Atomic Physics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :253
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :254
channel coding
signal processing
image processing
machine learning
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
1
0.100
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :255
Computational semiconductor lithography
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
1
0.111
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :256
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
1
0.125
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :257
plasma physics
electromagnetics
vacuum science
materials research
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
1
0.125
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :258
Control
signal processing
system identification
Kalman filtering
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
1
0.167
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :259
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :260
Semiconductor Patterning / Nano Science and Technology
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :261
quantum physics
condensed matter theory
microwave and THz microelectronics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :262
computational lithography
distributed computing
blockchain
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :263
EUV Lithography
Biomimetics
MEMS
Microsensors
Semiconductors
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :264
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :265
liquid crystal
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :266
partially coherent light
aberration theory
Fourier optics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :267
MEMS
Integrated Optics
Nanotechnology
sensors and actuators
microfluidics
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :268
Mechanics
Materials
Cleanliness
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :269
lithography
OPC
process
design
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :270
Super-resolution optical imaging
computational lithography
optoelectronics
Metamaterials
nanophotonic
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :271
Wide Bandgap Semiconductor
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :272
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :273
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :274
Machine learning
Parallel Computing
Embedded systems
real time systems
wireless sensor networks
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
* Last 6 Years i10 IndexRankings
Ranking Based On Selection :275
Model based Controls
Robotics
Diagnostics
Fault Tolerance
Artificial Intelligence
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Koen Nieuwesteeg
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
14
1
0.071
Andrey Tychkov
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
Arjan Van Der Sijs
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
11
1
0.091
Yiming Chen
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
10
1
0.100
channel coding
signal processing
image processing
machine learning
Ser Jung Hoon
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
9
1
0.111
Milos Popadic
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
1
0.125
Jeffry M. Bulson
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
8
1
0.125
plasma physics
electromagnetics
vacuum science
materials research
Sam Crisafulli
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
6
1
0.167
Control
signal processing
system identification
Kalman filtering
Romain Cauchois
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
nanomaterials
printed electronics
sintering
inkjet printing
sol-gel
Taekwon Jee
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Lorenzo Tripodi
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
quantum physics
condensed matter theory
microwave and THz microelectronics
Shufeng Bai
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Ram Jaganatharaja
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Mbjd Tavernier
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
5
1
0.200
Minyi Zhong
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
Pham, Sv, So Van Pham
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
4
1
0.250
MEMS
Integrated Optics
Nanotechnology
sensors and actuators
microfluidics
Marcel Kouters
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
Mechanics
Materials
Cleanliness
Aravind Narayana Samy
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
3
1
0.333
Super-resolution optical imaging
computational lithography
optoelectronics
Metamaterials
nanophotonic
Qingwen Wang
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Subhasish Sutradhar
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Laser Physics
Molecular Reaction Dynamics
Gas Phase Spectroscopy in molecular beam.
Vivek Kumar Jain
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Lithography
Computational Lithography
Semiconductor Capital Equipment
Semiconductor Process
Metrology & Defects
Ratnakar Madan
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Machine learning
Parallel Computing
Embedded systems
real time systems
wireless sensor networks
Priya Naik
i-10 Metrics
Total
Last 6 Years
Last 6 Years / Total
2
1
0.500
Model based Controls
Robotics
Diagnostics
Fault Tolerance
Artificial Intelligence